SANS 61290-5-1-2007 Optical amplifiers - Test methods Part 5-1 Reflectance parameters - Optical spectrum analyzer method《光学放大器 试验方法 第5-1部分 反射参数 光谱分析仪法》.pdf
《SANS 61290-5-1-2007 Optical amplifiers - Test methods Part 5-1 Reflectance parameters - Optical spectrum analyzer method《光学放大器 试验方法 第5-1部分 反射参数 光谱分析仪法》.pdf》由会员分享,可在线阅读,更多相关《SANS 61290-5-1-2007 Optical amplifiers - Test methods Part 5-1 Reflectance parameters - Optical spectrum analyzer method《光学放大器 试验方法 第5-1部分 反射参数 光谱分析仪法》.pdf(15页珍藏版)》请在麦多课文档分享上搜索。
1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA
2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any
3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-19564-9 SANS 61290-5-1:2007Edition 2IEC 61290-5-1:2006Edition 2SOUTH AFRICAN NATIONAL STANDARD Optical amplifiers Test methods Part 5-1: R
4、eflectance parameters Optical spectrum analyzer method This national standard is the identical implementation of IEC 61290-5-1:2006 and is adopted with the permission of the International Electrotechnical Commission. Published by Standards South Africa 1 dr lategan road groenkloof private bag x191 p
5、retoria 0001 tel: 012 428 7911 fax: 012 344 1568 international code + 27 12 www.stansa.co.za Standards South Africa SANS 61290-5-1:2007 Edition 2 IEC 61290-5-1:2006 Edition 2 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee StanS
6、A SC 74A, Communication technology Fibre optics, in accordance with procedures of Standards South Africa, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in August 2007. This SANS document supersedes SANS 61290-5-1:2002 (edition 1). NORME INTERNATIONALECEIIECINT
7、ERNATIONAL STANDARD 61290-5-1Deuxime ditionSecond edition2006-05Amplificateurs optiques Mthodes dessais Partie 5-1: Paramtres de rflectance Mthode danalyseur de spectre optique Optical amplifiers Test methods Part 5-1: Reflectance parameters Optical spectrum analyzer method Pour prix, voir catalogue
8、 en vigueur For price, see current catalogue IEC 2006 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfil
9、ms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO B
10、ox 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CODE PRIX PRICE CODE L Commission Electrotechnique InternationaleInternational Electrotechnical Commission SANS 61290-5-1:2007This s tandard may only be used and printed b
11、y approved subscription and freemailing clients of the SABS .61290-5-1 IEC:2006 3 CONTENTS FOREWORD.5 INTRODUCTION.11 1 Scope and object13 2 Normative references13 3 Acronyms and abbreviations .13 4 Apparatus.13 5 Test sample17 6 Procedure.17 6.1 Maximum and minimum input reflectance.17 6.2 Output r
12、eflectance .21 7 Calculation .21 7.1 Maximum and minimum input reflectance.21 7.2 Output reflectance .21 8 Test results 21 8.1 Maximum and minimum input reflectance.21 8.2 Output reflectance .23 Figure 1 Typical arrangement of the optical spectrum analyzer test apparatus for input reflectance15 Figu
13、re 2 Set-up for insertion loss measurement of optical coupler and isolator17 Figure 3 Set-up for OA input power measurements.19 SANS 61290-5-1:2007This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61290-5-1 IEC:2006 5 INTERNATIONAL ELECTROTECHN
14、ICAL COMMISSION _ OPTICAL AMPLIFIERS TEST METHODS Part 5-1: Reflectance parameters Optical spectrum analyzer method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Commit
15、tees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Availab
16、le Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organ
17、izations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical m
18、atters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC Nati
19、onal Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity,
20、IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC pro
21、vides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, emplo
22、yees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the
23、 publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the p
24、ossibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61290-5-1 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IE
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- SANS61290512007OPTICALAMPLIFIERSTESTMETHODSPART51REFLECTANCEPARAMETERSOPTICALSPECTRUMANALYZERMETHOD 光学

链接地址:http://www.mydoc123.com/p-1031575.html