SANS 61290-3-2009 Optical amplifiers - Test methods Part 3 Noise figure parameters《光学放大器 试验方法 第3部分 噪声数字参数》.pdf

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1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-22550-6 SANS 61290-3:2009Edition 2IEC 61290-3:2008Edition 2SOUTH AFRICAN NATIONAL STANDARD Optical amplifiers Test methods Part 3: Noise f

4、igure parameters This national standard is the identical implementation of IEC 61290-3:2008 and is adopted with the permission of the International Electrotechnical Commission. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +

5、27 12 344 1568 www.sabs.co.za SABS SANS 61290-3:2009 Edition 2 IEC 61290-3:2008 Edition 2 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS SC 74A, Communication technology Fibre optics, in accordance with procedures of the S

6、ABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in March 2009. This SANS document supersedes SANS 61290-3:2002 (edition 1). IEC 61290-3Edition 2.0 2008-08INTERNATIONAL STANDARD NORME INTERNATIONALEOptical amplifiers Test methods Part 3: N

7、oise figure parameters Amplificateurs optiques Mthodes dessais Partie 3: Paramtres du facteur de bruit INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE LICS 33.180.30 PRICE CODECODE PRIXISBN 2-8318-9952-4 Registered trademark of the International Electrotechnical

8、Commission Marque dpose de la Commission Electrotechnique Internationale SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 2 61290-3 IEC:2008 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope and object6 2 Normative references .6 3 A

9、cronyms and abbreviations.6 4 Noise figure generalities.7 5 Noise figure contributions.8 6 Noise figure test methods.9 Bibliography11 Table 1 Parameters measurable with each of the two methods of Clause 510 SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and fre

10、emailing clients of the SABS .61290-3 IEC:2008 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL AMPLIFIERS TEST METHODS Part 3: Noise figure parameters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electro

11、technical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specificat

12、ions, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International

13、, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal deci

14、sions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for inter

15、national use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In or

16、der to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be cl

17、early indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability sh

18、all attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including le

19、gal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this pu

20、blication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61290-3 has been prepared by subcommittee 86C: Fibre

21、optic systems and active devices, of IEC technical committee 86: Fibre optics. This second edition cancels and replaces the first edition, published in 2000, and constitutes a technical revision. It includes updates to specifically address additional types of optical amplifiers and to highlight that

22、 the IEC 61290-3 series pertains to single-channel amplifiers. References have been added to the documents pertaining to multichannel amplifiers. The text of this standard is based on the following documents: FDIS Report on voting 86C/842/FDIS 86C/854/RVD Full information on the voting for the appro

23、val of this standard can be found in the report on voting indicated in the above table. SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 4 61290-3 IEC:2008 This publication has been drafted in accordance with the ISO/IEC Dire

24、ctives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, with

25、drawn, replaced by a revised edition, or amended. SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61290-3 IEC:2008 5 INTRODUCTION This International Standard is devoted to the subject of optical amplifiers. The technology of

26、optical amplifiers is still evolving, hence amendments to and new editions of this standard can be expected. Each abbreviation introduced in this standard is explained in the text at least the first time it appears. However, for an easier understanding of the whole text, a list of all abbreviations

27、used in this standard is given in Clause 3. SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 6 61290-3 IEC:2008 OPTICAL AMPLIFIERS TEST METHODS Part 3: Noise figure parameters 1 Scope and object This International Standard ap

28、plies to all commercially available optical amplifiers (OAs), including OAs using optically pumped fibres (OFAs based on either rare-earth doped fibres or on the Raman effect), semiconductor optical amplifiers (SOAs) and planar waveguide optical amplifiers (PWOAs). The object of this standard is to

29、provide the general background for OA noise figure parameters measurements and to indicate those IEC standard test methods for accurate and reliable measurements of the following OA parameters, as defined in IEC 61291-1: a) noise figure (NF); b) noise factor (F); c) multiple path interference (MPI)

30、figure of merit; d) signal-spontaneous noise figure; e) (equivalent) spontaneous-spontaneous optical bandwidth (Bsp-sp); f) forward amplified spontaneous emission (ASE) power level; g) reverse ASE power level; h) ASE bandwidth. This standard addresses measurement of OAs that are to be used for ampli

31、fying single channels, that is signals from a single transmitter. Testing of OAs for multichannel use involves additional considerations, such as: the number, wavelengths and relative power of the signals, the ability to measure signals simultaneously and to measure the ASE between channels. NOTE Me

32、thods for measurement of OAs for multichannel use are included in the IEC 61290-10 series. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest editio

33、n of the referenced document (including any amendments) applies. IEC 61290-3-1, Optical amplifiers Test methods Part 3-1: Noise figure parameters Optical spectrum analyzer method IEC 61290-3-2, Optical amplifiers Part 3-2: Test methods for noise figure parameters Electrical spectrum analyzer method

34、IEC 61291-1, Optical amplifiers Part 1: Generic specification 3 Acronyms and abbreviations ASE amplified spontaneous emission Bsp-sp(equivalent) spontaneous-spontaneous optical bandwidth SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of

35、the SABS .61290-3 IEC:2008 7 ESA electrical spectrum analyzer F noise factor FWHM full width half maximum MPI multiple path interference NF noise figure OA optical amplifiers OFA optical fibre amplifier OSA optical spectrum analyzer PWOA planar waveguide optical amplifiers SOA semiconductor optical

36、amplifiers SNR signal-to-noise ratio 4 Noise figure generalities The noise figure is one of the most important parameters of an OA. Following the definition in IEC 61291-1, the noise factor, i.e. the linear form of the noise figure, can be expressed by: in2noiseout2noise2out2signalout2noisein2noisei

37、n2signaloutputinput1=iiGFiiiiSNRSNRF(1) where SNR denotes signal-to-noise ratios; i denotes photocurrents in an ideal photodetector with a quantum efficiency of 1; G denotes the optical signal gain. The input noise current is, by definition, the shot noise current caused by the optical input signal.

38、 This excludes other noise sources on the input side. The output noise current is the sum of five contributions. Each of these contributions can be expressed by a partial noise factor: a) signal shot noise factor, Fshot,sig, from shot noise from amplified input signal; b) ASE shot noise factor, Fsho

39、t,ase, from shot noise from amplified spontaneous emission; c) signal-spontaneous noise factor, Fsig-sp, from signal beating with ASE; d) spontaneous-spontaneous noise factor, Fsp-sp, from ASE beating with itself; e) noise factor from multiple path interference (MPI), Fmpi. The total noise factor (i

40、n linear, not logarithmic units) is: mpispspspsigaseshot,sigshot,totalFFFFFF +=(2) SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 8 61290-3 IEC:2008 The noise figure can be calculated using: ()totallog10 FNF = (3) Equation

41、(2) can be used for optical noise figure measurements, as well as for estimating the influence of various parameters in electrical noise figure measurements. It represents a complete noise figure model of an OA. 5 Noise figure contributions The signal shot noise factor is: GF1sigshot,= , (4) where G

42、 is the gain at the signal wavelength. The ASE shot noise factor is: in2aseaseshot,PGPF = (5) where Paseis the wavelength-integrated ASE power; Pinis the optical input signal power. The signal-spontaneous noise factor is: sigpase,spsigh2GF =(6) where ase,pis the optical power density of spontaneous

43、emission, in the same polarization state as the output signal, at the signal wavelength, in W/Hz; h is Plancks constant; sig= c/sigis the optical signal frequency, in Hz. The spontaneous-spontaneous noise factor is: in2sigspsp2asespsph2 PGBF= (7) where aseis the optical power density of total (unpol

44、arized) spontaneous emission, at the signal wavelength, in W/Hz; Bsp-sp is the equivalent spontaneous-spontaneous optical bandwidth defined in IEC 61291-1; it depends on power and wavelength of input signal. NOTE When Bsp-spis known, there is no need for separate measurement of Fsp-spbecause it can

45、be calculated from the signal spontaneous noise factor and the input power. Since ASE in any polarization state contributes to SANS 61290-3:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61290-3 IEC:2008 9 Fsp-sp, this calculation also n

46、eeds additional information if the ASE is not unpolarized, as is typical for example for SOAs. Multiple path interference (MPI) noise is generated by beating between the output signal and one or more doubly reflected replica of the output signal. Two or more reflection points inside the OA are neces

47、sary to generate MPI noise. When all reflection points are separated by more than the coherence length of the optical source, then the MPI noise factor is as follows: ()+=iGpfPFicav,i22inmpih2(8) where Gcav,iis the cavity gain (gain in the ithparasitic cavity in the OA) = gain in forward direction r

48、eflectivity in forward direction gain in backward direction reflectivity in backward direction; piis the polarization alignment factor, and expresses the matching of polarization states between the direct and doubly reflected signal in the ithcavity (between 0 and 1, p = 1 for perfect alignment); pi

49、Gcav,iis the effective cavity gain of the ithcavity; is meant to collect all possible cavity gains in the OA; is the FWHM of the source linewidth (Lorentzian model); f is the baseband frequency. When two or more light beams are coherent with each other, i.e. generated by closely spaced reflection points, MPI cannot be considered as noise, but rather as slow power fluctuations. In these cases, MPI does not contribute to the NF. The MPI contribution to th