SAE J 2052-2011 Test Device Head Contact Duration Analysis《试验装置的总接触时间分析》.pdf
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1、_ SAE Technical Standards Board Rules provide that: “This report is published by SAE to advance the state of technical and engineering sciences. The use of this report is entirely voluntary, and its applicability and suitability for any particular use, including any patent infringement arising there
2、from, is the sole responsibility of the user.” SAE reviews each technical report at least every five years at which time it may be reaffirmed, revised, or cancelled. SAE invites your written comments and suggestions. Copyright 2011 SAE International All rights reserved. No part of this publication m
3、ay be reproduced, stored in a retrieval system or transmitted, in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise, without the prior written permission of SAE. TO PLACE A DOCUMENT ORDER: Tel: 877-606-7323 (inside USA and Canada) Tel: +1 724-776-4970 (outside U
4、SA) Fax: 724-776-0790 Email: CustomerServicesae.org SAE WEB ADDRESS: http:/www.sae.orgSAE values your input. To provide feedbackon this Technical Report, please visit http:/www.sae.org/technical/standards/J2052_201101SURFACEVEHICLEINFORMATIONREPORTJ2052 JAN2011 Issued 1990-03 Revised 2011-01Supersed
5、ing J2052 DEC2005 Test Device Head Contact Duration Analysis A technically equivalent version of SAE J2052 is included in ISO Technical Report 12351. RATIONALE The committee reviewed this information report and determined that no substantial changes were needed. The reference section was reformatted
6、 and updated. FOREWORD A technique has been established for determining head impact contact duration called the “Force Difference Method.“ This technique allows calculation of Head Injury Criterion (HIC) only during head contact. 1. SCOPE This methodology can be used for all calculations of HIC, wit
7、h all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers. 1.1 Purpose The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calcul
8、ation of the HIC without reliance on contact switches or photography. 2. REFERENCES 2.1 Applicable Documents The following publications form a part of this specification to the extent specified herein. Unless otherwise indicated, the latest issue of SAE publications shall apply. Copyright SAE Intern
9、ational Provided by IHS under license with SAENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SAE J2052 Revised JAN2011 Page 2 of 62.1.1 SAE Publication Available from SAE International, 400 Commonwealth Drive, Warrendale, PA 15096-0001, Tel: 877-606-7323 (inside U
10、SA and Canada) or 724-776-4970 (outside USA), www.sae.org.SAE J211-1 JUL 2007 Instrumentation for Impact Test 2.1.2 Federal Publication Available from the Superintendent of Documents, U.S. Government Printing Office, Mail Stop: SSOP, Washington, DC 20402-9320. 49 CFR Part 572, Subpart E Occupant Cra
11、sh Protection, revised as of April, 1997 2.1.3 ISO Publication Available from American National Standards Institute, 25 West 43rd Street, New York, NY 10036-8002, Tel: 212-642-4900, www.ansi.org.ISO Technical Report 12351 Determination of head contact and duration in impact testsISO/TC22/SC12/WG3N35
12、5 3. DEFINITIONS 3.1 HIC The HIC is one of the “injury criteria“ prescribed by S6 of the Federal Motor Vehicle Safety Standard (FMVSS) 208. It is the maximum value calculable from the head c.g. resultant acceleration-time profile in accordance with Equation 1: (Eq. 1) where: a is the resultant accel
13、eration expressed as multiples of G (the acceleration of gravity), and t1and t2are any two points in time during the crash. NOTE: Although a HIC window of 36 ms maximum was subsequently mandated by NHTSA, it is not utilized with this document. 3.2 Contact HIC HIC values calculated only during the pe
14、riods of each head contact. 3.3 te, tdThe head engagement and disengagement times, teand tdrespectively, are determined by the method given in Section 5. These are the starting and ending times, i.e., the windows for the iterative HIC calculations for each head contact. NOTE: The maximum contact HIC
15、 for each te, tdinterval will have associated with it times t1, t2which may be equal to, or less than the te, tdinterval. HIC1t2t1() a.dtt1t22.5t2t1()=Copyright SAE International Provided by IHS under license with SAENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
16、SAE J2052 Revised JAN2011 Page 3 of 63.4 Accelerometers (ax, ay, az)The triaxial accelerometer(s) in the head of the test device will be referred to as an accelerometer, omitting the triaxial classification as defined in SAE J211-1; +axis forward, +ayis to the right, and +azis downward. These orient
17、ations are shown in Figure 1. 3.5 Load Cell The triaxial force load cell (attached rigidly to the base of the skull portion of the test device to which the neck is attached)will be referred to as a load cell, omitting the triaxial and upper neck classification. Load cells with additional outputs can
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