REG NASA-LLIS-2046-2009 Lessons Learned Limitations of Internal Protective Devices in High-Voltage High- Capacity Batteries Using Lithium-Io.pdf
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1、Lessons Learned Entry: 2046Lesson Info:a71 Lesson Number: 2046a71 Lesson Date: 2009-5-11a71 Submitted by: Michael Bella71 POC Name: Judith Jeevarajana71 POC Email: judith.a.jeevarajannasa.gova71 POC Phone: 281-483-4528Subject: Limitations of Internal Protective Devices in High-Voltage/High- Capacity
2、 Batteries Using Lithium-Io Abstract: Most commercial cylindrical 18650 Lithium-Ion (Li-Ion) cells have two internal protective devices: the Positive Temperature Coefficient (PTC) and the Current Interrupt Device (CID). The PTC protects the cells under external short conditions and the CID protects
3、the cells under overcharge conditions. While proven to be effective at the single cell and small-size battery levels, these devices do not always offer protection when used in high voltage and high-capacity battery designs.Description of Driving Event: The internal protective devices (PTC and CID) u
4、sed in the most common commercial-off-the-shelf (COTS) Li-Ion cells (cylindrical 18650s) have been extremely reliable at a single-cell level and have resulted in total prevention of the cell reaching a hazardous condition. However, test programs have indicated that batteries built with cylindrical C
5、OTS cells in multi-cell configurations (series and/or parallel) have experienced thermal runaway under various test conditions.Lesson(s) Learned: Test data analysis indicated that the two major causes for the thermal runaway are over voltage (overcharge) and external short conditions. In these cases
6、, the internal protective devices were either not protecting as expected or were a cause for the hazards encountered. PTC ignition above its withstanding (threshold) voltage has been shown Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-to cause ther
7、mal runaway under external short conditions in high-voltage battery modules. Thermal runaway has also been observed during overcharge conditions in high-voltage and high-capacity modules, indicating that the CIDs did not protect the cells from catastrophic events, as seen in single cells. The NESC s
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