ITU-R TF 538-3-1994 Measures for Random Instabilities in Frequency and Time (Phase)《频率和时间随机不稳定措施(第1期)》.pdf
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1、Rec. ITU-R TF.538-3 81 Characterization of sources and time scales formation RECOMMENDATION ITU-R TF.538-3 MEASURES FOR RANDOM INSTABILITIES IN FREQUENCY AND TIME(PHASE) (Question I7J-R 104/7) (1978-1990-1992-1994) The IT Radiocommunication Assembly, considering a) that there is a need for an adequa
2、te language with which to communicate the instability characteristics of standard frequency and time sources and measurement systems; b) that the classical variance does not converge for some of the kinds of random time and frequency instabilities; c) that major laboratories, observatories, industri
3、es and genera1 users have already adopted some of the Recommendations of the Sub-committee on Frequency Stability of the Technical Committee on Frequency and Time of the IEEE Society on Instrumentation and Measurement and the existence of the IEEE Standard No. 1139-1988 on “IEEE Standard Definitions
4、 of Physical Quantities for Fundamental Frequency and Time Metrology”; d) that frequency and time instability measures should be based on sound theoretical principles, conveniently usable, and directly interpretable; e) that it is desirable to have frequency and time instability measures obtainable
5、with simple instrumentation; f) that there is no accepted and appropriate measure for time-domain time instability in clocks and in measurement, comparison, and dissemination systems; g) that a time instability measure for random variations has been found which satisfies the inadequacy both for the
6、telecommunications industry as well as for time and frequency measurement, comparison and dissemination systems and for clocks, recommends 1. that the random instabilities of standard frequency and time signals should be characterized by the statistical measures Sy(f), S,(n or S,(f) in the frequency
7、-domain, and oy(z), Mod. oy(z) and o,(z) in the time-domain as defined below: 1.1 the measureof the normalized frequency instabilities y(r) in the frequency domain is Sy(f); i.e. the one-sided spectral density (O = 1/2 denotes an infinite time average. The measure written in equation (7) is often ca
8、lled the Allan variance. The xk and Xk + 1 are time residual measurements made at fk and fk + 1 = fk + z, k = 1,2, ., and l/z is the fixed sampling rate which gives zero dead time between frequency measurements. By “residual” it is understood that the known systematic effects have been removed. ITU-
9、R ITU-R TF-538-3 94 4855212 0522b44 546 84 Rec. ITU-R TF.538-3 Slope characteristics of log-log plot If the initial sampling rate is specified as lho, then in general one may obtain a more efficient estimate of CTy(z) using what is called an “overlapping estimate”. This estimate is obtained by compu
10、ting equation (8). 2 2 oy(.c Mod.o,(T) P P 1 1 O O -1 -1 -2 -2 -2 -3 where N is the number of original time departure measurements spaced by TO (N = M + 1, where M is the number of original frequency measurements of sample time, TO) and z = n 70. 2 oJr) rl 3 2 1 O -1 I If dead time exists between th
11、e frequency departure measurements and this is ignored in computing equation (7). it has been shown that the resulting stability values (which are no longer the Allan variances), will be biased (except for the white frequency noise) as the frequency measurements are regrouped to estimate the stabili
12、ty for n TO (n 1). This bias has been studied and some tables for its correction published. a -2 -1 O 1 2 If there is no dead time, then the original 2s can be combined to create a set of 7,s: =a-2 -4 -3 -2 -1 O i=k TABLE 1 The functional characteristics of five independent noise processes for frequ
13、ency instability of oscillators Description of noise process Random walk frequency Flicker frequency White frequency Flicker phase White phase I S,(f) = it depends on the particular frequency standard and is not fully understood in its physical basis. Examples of probable causes for the flicker “flo
14、or” are power supply voltage fluctuations, magnetic field fluctuations, changes in components of the standard, and microwave power changes. Finally the curve shows a deterioration of the stability with increasing averaging time. This occurs typically at times ranging from hours to days, depending on
15、 the particular kind of standard. 2 A “modified Allan variance”, Mod. oY(z), has been developed which has the property of yielding different dependences on T for white phase noise and flicker phase noise. The dependences for Mod. cry) are ,r3” and r1 respectively. Mod. oY(z) is estimated using the f
16、ollowing equation: where: N: original number of time variation measurements spaced by TO z = n TO the sample time of choice. Properties and confidence of the estimate are discussed in the technical literature. Maximum likelihood methods of estimating oJ2) for the specific models of white frequency n
17、oise and random walk frequency noise have been developed. These two models have been shown to be useful for sample times longer than a few seconds for caesium beam standards. The time instability in the time-domain for the above five power-law spectra may be measured using the 2 second-difference of
18、 adjacent time averages. This measure is also related to Mod. oy(z). where (dddr) = y and T = n TO. Therefore, x is the time deviation; the brackets ” denote an infinite time average. The bar “-” over the x denotes an average over an interval T. Hence, x is an optimum estimate of the time deviation
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