EN 61000-4-4-2004 en Electromagnetic compatibility (EMC) Part 4-4 Testing and measurement techniques - Electrical fast transient burst immunity test (Incorporates Amendment A1 2010.pdf

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1、BRITISH STANDARDBS EN 61000-4-4:2004+A1:2010 Incorporating corrigenda August 2006 and June 2007Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity testICS 33.100.20 g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3

2、g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58National forewordThis British Standard is the UK implementation of EN 61000-4-4:2004+A1:2010. It is identical to IEC 61000-4-4:2004, incorporating amendment 1:2010,

3、and corrigenda August 2006 and June 2007. It supersedes BS EN 61000-4-4:2004 which will be withdrawn on March 2013.The UK participation in its preparation was entrusted by Technical Committee GEL/210, EMC Policy committee, to Subcommittee GEL/210/12, EMC basic, generic and low frequency phenomena st

4、andardization.A list of organizations represented on this subcommittee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot conf

5、er immunity from legal obligations.BS EN 61000-4-4:2004+A1:2010This British Standard waspublished under the authorityof the Standards Policy andStrategy Committee on2 February 2005 BSI 2010Amendments/corrigenda issued since publicationAmd. No. Date Comments 16840 Corrigendum No.131 January 2007 Impl

6、ementation of IEC corrigendum August 2006, replacement of Figure 430 April 2008 Implementation of IEC corrigendum June 2007, revision of subclause 6.2.231 May 2010 Implementation of IEC amendment 1:2010 with CENELEC endorsement A1:2010; Subclause 6.2.2 replacedISBN 978 0 580 67578 2EUROPEAN STANDARD

7、 EN 61000-4-4:2004+A1 NORME EUROPENNE EUROPISCHE NORM March 2010CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2004 CENELEC - A

8、ll rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 61000-4-4:2004 E ICS 33.100.20 Supersedes EN 61000-4-4:1995 + A1:2001 + A2:2001English version Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques - Electrical fast

9、 transient/burst immunity test (IEC 61000-4-4:2004)Compatibilit lectromagntique (CEM) Partie 4-4: Techniques dessai et de mesure - Essais dimmunit aux transitoires lectriques rapides en salves (CEI 61000-4-4:2004) Elektromagnetische Vertrglichkeit (EMV)Teil 4-4: Prf- und Messverfahren - Prfung der S

10、trfestigkeit gegen schnelle transiente elektrische Strgren/Burst (IEC 61000-4-4:2004) This European Standard was approved by CENELEC on 2004-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the statu

11、s of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German).

12、A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech

13、 Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Foreword The text of document 77B/419/FDIS, future edition

14、2 of IEC 61000-4-4, prepared by SC 77B, High frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-4 on 2004-10-01. This European Standard supersedes EN 61000-4-4:1995 + A1:2001 + A2:2001. This new e

15、dition improves and clarifies simulator specifications, test criteria and test set-ups. Only common mode injection is required. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop)

16、 2005-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2007-10-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 61000-4-4:2004 was approved by CENELEC as a European Standard without any modifica

17、tion. In the official version, for Bibliography, the following note has to be added for the standard indicated: IEC 61000-4-4 NOTE Harmonized as EN 61000-4-4:1995 (not modified). _ Page 2Foreword to amendment A1The text of document 77B/621/FDIS, future amendment 1 to IEC 61000-4-4:2004, prepared by

18、SC 77B, High frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 61000-4-4:2004 on 2010-03-01. Attention is drawn to the possibility that some of the elements of this document may be the su

19、bject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 201

20、0-12-01 latest date by which the national standards conflicting with the amendment have to be withdrawn (dow) 2013-03-01 _ Endorsement notice The text of amendment 1:2010 to the International Standard IEC 61000-4-4:2004 was approved by CENELEC as an amendment to the European Standard without any mod

21、ification. _ BS EN 61000-4-4:2004+A1:2010 EN 61000-4-4:2004+A1:2010CONTENTS INTRODUCTION. 51 Scope. 62 Normative references 6 3 Terms and definitions . 7 4 General 9 5 Test levels 9 6 Test equipment9 6.1 Burst generator .10 6.2 Coupling/decoupling network for a.c./d.c. mains supply port11 6.3 Capaci

22、tive coupling clamp.12 7 Test set-up.13 7.1 Test equipment .13 7.2 Test set-up for type tests performed in laboratories.13 7.3 Test set-up for post-installation tests.15 8 Test procedure .17 8.1 Laboratory reference conditions 17 8.2 Execution of the test17 9 Evaluation of test results 18 10 Test re

23、port18 Annex A (informative) Information on the electrical fast transients.Annex B (informative) Selection of the test levelsBibilogrpahy23 Figure 1 Simplified circuit digarma fo a fast transient/burst egenrarot 02 Figure 2 Geenral graph fo a fast trnasient/burst .02 Figur3 e Wavehsaep of a signle p

24、ulse inot 05 a laod12 Fiugre 4 oC uplin/gdecopuling entwrok for c.a/.d.cop .ewr mains supply oprtst/erminals12 Figure 5 Constructino fo the caapcitivpuoc elgni lcamp22Figure 6 Block diagram for electricla fast transient/burst immnuity etst .22iFguer 7 Gneeral test set-up for lbaoratory type tests.32

25、 Figure 8 Example fo a test set-pu for rack mounted equipment 32 Figru9 e Example of et ates ts-uof pr idreilpuoc tco gnf tet ehts vtloega to a a.c.d/.c. power supply ports/terminal for laobraotry purposse .42 Figru 01 e Examlpo ef ettes ts-uof pr ppailcanoit of eht etst lovtgae by htapac evitice co

26、puling clamp for lbaoraotry test uprposes 42 Page 361000-4-4 IEC:2040 3 TNOCENTS OFREWODR.7 NITRODCUTION 51 Scope 62 roNmtaive referencse .6 3 T rms dna definitions 7 4 G enral . 5 Test level . 9 6 Test euqipment9 .61 Burst egenrarot .01 6.2 Cuopilng/edcuopilng network for a.c./d.c. mains supply por

27、t11 6.3 Cpaacitive copuling clamp.21 7 Test set-up.31 .71 Test euqipment .31 7.2 Test set-up for type etsst performed ni lbaoratories.31 7.3 Test set-up for post-installation tests.31 8 Test proceudre .71 8.1 Lbaortaory referencdnoc eiitnos 71 8.2 Executiofo n the test71 9 Evaluation fo test resulst

28、 81 01 Test rep t. 81 Anenx A (informative) Informtaion no the electrical fast trnasietns.72Anenx B (informative) Seelctiofo n the test levels. 29 Bibliography e 1 Simplified circuit diagram of a fast transient/burst generator . 20gu 2 General graph of a fast transient/burst .20 Figure 3 Waveshape o

29、f a single pulse into a 50 load21 Figure 4 Coupling/decoupling network for a.c./d.c. power mains supply ports/terminals. 21 Fi re 5 Construction of the capacitive coupling clamp. 226 Block diagram for electrical fast transient/burst immunity test 22Fi ure 7 General test set-up for laboratory type te

30、sts.23 Figure 8 Example of a test set-up for rack mounted equipment 23 Figure 9 Example of a test set-up for direct coupling of the test voltage to a a.c./d.c. power supply ports/terminal for laboratory purposes .24 Figure 10 Example of test set-up for application of the test voltage by the capaciti

31、ve coupling clamp for laboratory test purposes 24 3 egaP4002:4400016 NEAnnex ZA (normative) Normative references to international publications with theircorresponding European publications . 28303233BS EN 61000-4-4:2004+A1:2010 EN 61000-4-4:2004+A1:2010Figure 11 Example for post-installation test on

32、 a.c./d.c. power supply ports and protective earth terminals for stationary, floor-mounted EUT.25 Figure 12 Example for post-installation test on a.c. mains supply port and protective earth terminals for non-stationary mounted EUT .26 Figure 13 Example of post-installation test on communications and

33、 I/O ports without the capacitive coupling clamp .26 Table 1 Test levels. 9 Table 2 Output voltage peak values and repetition rates 11 Page 4Figure 14 Verification of the waveform at the common mode output of the coupling/decouplingnetwork.27BS EN 61000-4-4:2004+A1:2010 EN 61000-4-4:2004+A1:2010160-

34、00-44 EI:C0024 11 INTRODUCTION IEC 61000 is published in separate parts, according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment C

35、ompatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guide

36、lines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards or as technical specifications or technical reports, some of which have already been published as sections. Others will

37、 be published with the part number followed by a dash and a second number identifying the subdivision (example: 61000-6-1). This part is an international standard which gives immunity requirements and test procedures related to electrical fast transients/bursts. Page 5BS EN 61000-4-4:2004+A1:2010 EN

38、 61000-4-4:2004+A1:2010160-00-44 EI:C0024 31 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test 1 Scope This part of IEC 61000-4 relates to the immunity of electrical and electronic equipment to repetitive electrical fast tr

39、ansients. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference for evaluating the immunity of ele

40、ctrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. NOTE As

41、described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determi

42、ning the appropriate test levels and performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. The standard defines: test voltage waveform; range of test levels; test equipment

43、; verification procedures of test equipment; test set-up; test procedure. The standard gives specifications for laboratory and post-installation tests. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edi

44、tion cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-161:1990, International Electrotechnical Vocabulary (IEV) Chapter 161: Electro-magnetic compatibility Page 6BS EN 61000-4-4:2004+A1:2010 EN 61000-4-4:2004+A1:201016

45、0-00-44 EI:C0024 51 3 Terms and definitions For the purposes of this document, the following terms and definitions, together with those in IEC 60050-161 apply. NOTE Several of the most relevant terms and definitions from IEC 60050-161 are presented among the definitions below. 3.1 burst sequence of

46、a limited number of distinct pulses or an oscillation of limited duration IEV 161-02-07 3.2 calibration set of operations which establishes, by reference to standards, the relationship which exists, under specified conditions, between an indication and a result of a measurement NOTE 1 This term is b

47、ased on the “uncertainty“ approach. NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle, by a calibration diagram. IEV 311-01-09 3.3 coupling interaction between circuits, transferring energy from one circuit to another 3.4 common mode (coupl

48、ing) simultaneous coupling to all lines versus the ground reference plane 3.5 coupling clamp device of defined dimensions and characteristics for common mode coupling of the disturbance signal to the circuit under test without any galvanic connection to it 3.6 coupling network electrical circuit for

49、 the purpose of transferring energy from one circuit to another 3.7 decoupling network electrical circuit for the purpose of preventing EFT voltage applied to the EUT from affecting other devices, equipment or systems which are not under test 3.8 degradation (of performance) undesired departure in the operational performance of any device, equipment or system from its intended performance NOTE The term “degradation“ can appl