DLA SMD-5962-89989-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《硅单片 装有三态输出的八位总线收发器 高速氧化物半导体数字微型电路》.pdf

《DLA SMD-5962-89989-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《硅单片 装有三态输出的八位总线收发器 高速氧化物半导体数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89989-1990 MICROCIRCUITS DIGITAL HIGH SPEED CMOS OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS MONOLITHIC SILICON《硅单片 装有三态输出的八位总线收发器 高速氧化物半导体数字微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、- SMD-5762-7789 57 W 7777776 OOOOq3L 2 W LTR DESCRIPTION DATE (mm-DA) APPROVED AMSC NIA I I SHEET 1 OF 14 II US. OOYtWfHI WHTIM OfIKf: 197 - 741.11916091 1 DESC FORM 193 SEP 87 5962-E1683 DISTRIBUTION STATEMENT A. Approved for public release; dlslrlbutlon is unlimited. Provided by IHSNot for ResaleN

2、o reproduction or networking permitted without license from IHS-,-,-SMD-5762-87789 57 W 7777776 0009432 Li - 1. SCOPE 1,1 SCO e. This drawing describes device requirements for class E microciNuits in accordance with l, ymaximum I I I I 0.1 I v I IIoi 5 20 NA I I III I Ogl I I I Obl I VIN = VIH minim

3、um Ivcc = 4.5 v I I lIo 5 7.8 mA I I I I I I I I Il,2,31 1.51 1 V I I IVcc *O I I I I IiI I 3.151 I I IVOL IV“ = I loyI;fL-maximum I I I I .ow level output vol tage JVcc = 6.0 V I ligh level input IVIH I I I I 71 IVCC = 4.5 v I I I I I -1 IiI IVcc = 6.0 V I I 4.2 I I I I I I I I I I I I voltage 21 I

4、 ,ee footnotes at end of table. 5962-89989 MILITARY DRAWING DEFENSE ELECTRONICC SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-9989 59 M 399999b 0000435 T M SIZE A STANDARDIZED TABLE I

5、. Electrical performance characteristics - Continued. I I I I I lsubgroupslw unless oherwTse specified I I Min I Max I I I I I I I I I -55C TC +125“C 5962-89989 3w level input voltage g/ iiescent supply current (standby) nput leaka e current, !AB or GBA -state output current, A or B unctional tests

6、ropagation delay time, A or B to B or A ropagati on del ay time, output enable time 21 VIL Icc IIN Ioz PHL , PLH I I I I I I 1 I I I 7 I 1 I I I 1 I 1 i I I I 1 I 1 I 1,2*31 I I I IVCC = 2.0 v I 1-1 IVCC = 4.5 v I I I 0.9 I II I I I I 1-1 1 Il IVcc = 6.0 V I I I 1.2 I I I I I I I i 1, 2, 3 i i 160 i

7、 pA I I I I I I .I I I I I I I VCC = 6.0 V I 1, 2, 3 i I I I I i *l.O i pA VIN = VCC or GND I I I I I I I , VCC = 6.0 V VIN = Vcc or GND i 1, 2, 3 I *10.0 i I I I I I I I I I I I See 4.3.ld i 7,8 i I I I I TC = +25“C ivcc = 2.0 v 19 I I 105 I ns CL = 50 pF I .I I I I See figure 4 I I 1-1 I 21 I I I

8、I I IVCC = 4.5 v I I I i i -i- i 18 I I I I I I ITC = -55“c, +moc VCC = 2.0 v I 10, 11 I I 160 .I ICL = 50 PF I I I I I -1 I I 32 I ISee figure 4 I I I IVCC = 4.5 v I I I I 1-1 I I I i i iVCC = I I I I I I i“ I TC -55“C, +125“C ivcc i i i -i -1 1-1 i 27.i I I I I I I iVcc = 6.0 V I i I I ,I I I t PZ

9、H 3 tPZL ITc = +25C ICL = 50 pF ISee figure 4 I IVCC = 2.0 v I I I 9 .I I I I I 210 I ns I I I I I .I I I 42 I I I I 1-1 i36 i ,I i I I iVcc = 6.0 V i I I i I ee footnotes at end of table. ESC FORM 193A SEP a7 t U. 9. QOVERNMENT PRIMING OFFICE: 1989-7448653 I Provided by IHSNot for ResaleNo reproduc

10、tion or networking permitted without license from IHS-,-,- Test SIZE A STANDARDIZED vpagation delay time, output enable time 31 5962-89989 sopagation del ay time, output disable time ;/ _ . . i tout t ransi t on tlme, A or B - 5/ s/ TABLE I E Symbol ._ . WH 9 t PtL t PHf tPLZ THL TLH El ectrica- per

11、fomance- character1 stics - Continued. I I 1 I SMD-5962-87989 59 M 9999796 0000936 L I 9 8 Condi ti om 1/ IGroup A I Limits I Unit -55*C 5 TC +125“C - Icubgroups 1- I I I I I uoless- qt.herwTse specified I, . ,I Min I Max 1 . . 1 10, 11 i i315 i ns I I I l-l-l I 63 I I 54 I TC t -5SC, *125“C vcc = 2

12、.0 v .I I I I I I 19 I 150 I ns I I I I 30 I I te t- +S5OC I I I See figure 4 I IVCC = 4.5 v I I I I I 26 I I I I I I 1 IVCC = 6.0 v I I I . I ,. I , . ., I I I CL = 50 PF I ., _ . . See figure 4 I I I I 1-4-7 I IVCC = 4.5 I“c= . ,I , , I. I. l I+l lVCC = 2*o , . CL I 50 pF i225 i I I I -1 I 45 I I

13、I I i lo i TC CL = 50 pF See figure 4 -55C, +125“C ivcc = 2.0 v I I I IVCC = 45 v I I _ I i i- 138 i I I vcc = . o v I I I- I ,I., . IVCC t 2.0 v 19 I I 60 I ns 1- “ l CL = 50 pF I &I I I I TC = +25“C 1-1 I 12 I I I I I IiI I I I I see figure 4 IVCC = 4b5 I il0 i , I I i l I I 90 I I I I l-l-I I 18

14、I I I I I 1-1 i . . - . - . . . TC L -55c, +125*C IvcC = 2.0 See figure 4 . -1 I I I CL = 50 pF I I IVCC = 4.5 v I I IVcc = 6.0 V I i i 15 i I I I I I ?e footnotes at end of table. ESC FORM 193A * U. 9. QOVERNMENT PRINTING OFFICE: IOSQ-749 O33 SEP 87 Provided by IHSNot for ResaleNo reproduction or n

15、etworking permitted without license from IHS-,-,-SMD-5762-87787 54 4444776 0000437 3 SIZE A 5962-89989 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYTON, OHIO 45444 7 TABLE 1. Electrical performance characteristics - Continued. I 1 I I I I Condi ti ons i/ Gr

16、oup A i Limits i Unit -55C TC +125OC - I subgroups 1- I I Min I Max I I I unless otherwise specified I I I I I I bee 4.3.1 Vcc = GND lSymbol I i Test I 10 I pF 14 I I I Control capacitance Cc I Input/Output (CI/0 See 4.3.1 Vcc = 6.0 V g/ 14 I I 20 I pF - i/ For a power supply of 5.0 Y *10 percent, t

17、he worst case output voltage (Yo and VOL) occur for HC at 4.5 V. Thus, the 4.5 V values should be used when designing wit this supply. Worst case V N and VIL occur at VCC = 5.5 V and 4.5 Y respectively. the higher voltage so the 6.0 V values should be usei. Power dissipation Ca acitance (cp), Vcc, a

18、nd the no load dynamic current consumption, Is = CPD Vcc f+IC . - 2/ VIH and VIL tests are not required if applied as forcing functions For the VOH and VOL tests. - 3/ AC testing at VC = 2.0 V and Vcc = 6.0 V shall be guaranteed, if not tested, to the specified limit in table I. - 4/ Transition time

19、s (tTHL, tTLH), if not tested, shall be guaranteed to the specified limits in table I. - 5/ Set the input enable control pin(s) to Vcc or GND, as applicable, to disable the outputs. capacitance I I I I I I (The VIH value at 5.5 V is 3.8 5 V). The worst case leakage current (I N, ICC, and IQZ) occur

20、for CMOS at typically 80 pF, determines the no load dynamic power consumption, Pg = cp e cc2 f+ICC 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.6 herein). certificate of co

21、mpliance submitted to DESC-ECS prior to listing as an approved source of su ply shall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 Rerein) and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see

22、 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of chan e. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 ( see 3.1 h&ei ni. 3.9 Verification and review. DES, DESCs agent, and the acquiring activity retain

23、 the option to review the manufacturers facility and applicable required documentation. shall be made available onshore at the option of the reviewer. The Offshore documentation Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-89989 59 M 9799

24、996 0000438 5 M SIZE A STANDARDIZED I Device type hase outlines1 R I , Terminal I Terminal number I symbol I l m I 5962-89989 1 I GAB 2 I Al 3 I A2 4 I A3 5 I A4 6 I A5 7 I A6 8 I A7 9 I A8 10 11 12 I B7 13 I B6 14 I 85 15 I 84 16 I 83 17 I 82 18 I B1 1 19 I %BA 20 I vcc I GAB Al A2 A3 A4 A5 A6 A7 A

25、8 GND 88 B7 66 85 B4 133 82 BI. FBA vc c NC = No connection FIGURE 1. Teminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-87789 57 W 7777976 0000437 7 STAN DARDI ZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER I P SIZ

26、E 5962-89989 A I REVISION LmEl I SHEET 1 Enable inputs i i I Operation I r-T-T I 1 mA I GAB I I I I I i I I i L i L i B data to A bus i I H I H I A data to B bus I I H I L I Isolation I I L I H I B data to A bus, I I I I A data to B bus I I I I I H = High level L = Low level 1 DAYTON, OHIO 45444 I l

27、 I 9 *U.S.OVMENl DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-FIGURE 3. Logic diagram. StID-5962-99!9 57 9999996 O000440 3 - SIZE 5962 -89989 A STANDARDIZED MILITARY DRAWING RMSION LEVEL SHEET DEFENSE ELECTRONICS SUPPLY CENTE

28、R AVION, OHIO 45444 10 it U.S. GOVERNMEM PRINTING OFFML 1-548-W4 )ESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-89787 53 W 3777976 O000441 5 I P 3. An 2 OUTPUT Bn +PLH - SI (NOTE I) vcc DEVICE INPUT UNDER 5 0 /o IO O10

29、 GND “O H 50 /o “o L vcc GND I o O/O OUTPUT 50 ?o uuirui (NOTE 31 N GND NOTES : 1. S1 = Y for tpZL and tpLZ measurements. SI = GK for tpZH and tpHZ measurements. 2. CL includes load and test jig capacitance. 3. This waveform is applicable to both three-state and open drain switching time measurement

30、s. FIGURE 4. Test circuit and switching waveforms. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICC SUPPLY CENTER , DAYTON, OHIO 45444 ESC FORM 193A SEP 87 SIZE I I AI I 5962 -89989 I REVISION LEVEL I SHEET QU. S.GOVERHUENT PRIMINQ OFFICE: iU-54EW4 Provided by IHSNot for ResaleNo reproduction or ne

31、tworking permitted without license from IHS-,-,- SMD-5762-87987 57 W 7777776 OOOOLi42 7 SIZE A STANDARDIZED 4. QUALITY ASSURANCE PROVISIONS 41 Sampling and inspection, Sampling and inspection procedures shalT be in accordance with 4.2 Screening. Screening shall be in accordance with method 5004 of M

32、IL-STD-883, and shall be section 4 of MIL-M-38510 t o the extent specified in MIL-STD-883 (see 3.1 herein). conducted on all- devices prior to quality conformance inspection, The following additional criteria shall apply: a. &urn-in test, method 1015 of NIL-STO-883. (1) Test condition A, B, C, or D

33、using the circuit submitted with the certificate of compliance (see 3.6 herein). (2) TA = +125OC, minimum. except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in acc

34、ordance with . b. Interim and final electrical test parameters shall be as specified in table II herein, method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein.

35、 b. Subgroups 5 and 6 iir table I, method 5005 of MIL-STD-883 shall be omitted, c Subgroup 4 (k and Cx/o measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. Capacitance shall be measured between the designated termha1 and GND at

36、 a frequency of 1 MHz. Test all applicable pins on 5 devices with zero failures. d. Subgroups 7 and 8 tests shall verify the truth table as specified on figure 2. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test

37、condition, method 1005 of MIL-STD-883. (1) Test Condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein. (2) TA = +125“C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5962-89989 MILITARY DRAWING DEFENCE ELE

38、CTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET 12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I .? P SIZE A STANDARDIZED TABLE II. Electrical test requirements. 1 I Subgroups I I MIL-STD-883 test requirements I (per method I I I 5

39、005, table I) I l I I I I I Interim electrical parameters I 1 I I (method 5004) I I I 5962-89989 Final electrical test parameters i 1*, 2, 3, 7, i I I I (method 5004) I 8, 9 I i Group A test requirements i 1, 2, 3, 4, 7, i I (method 5005) 18, 9, lo*, 11*I I I (Groups C and D end-point I 1, 2, 3 I I

40、electrical parameters I I I (method 5005) I I * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 5. PACKAGING 5.1 Packaging requirements, The requirements for packaging shall be in accordance with 6. NOTES MIL -M-3BblU, 6.1 Inte

41、nded use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application. When a military specification exists and the product covered by this drawing

42、 has been qualified for listing on QPL-38510, the device specified herein will be inactivated and will not be used for new design. for al 1 appl ications. covered by a contractor-prepared specification or drawing. urith the users of record for the indrvidual documents. This coordination will be acco

43、mplished in accordance with MIL-STD-481 using OD Form 1693, Engineering Change Proposal (Short Form). 6.4 Record of users. Militaiy and industrial users shall inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SMD. DESC will maintain

44、a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DESG-ECS, telephone (513) 296-6022. The QPL-38510 product shall be the preferred item 6.2 Replaceability. Microcirc

45、uits covered by this drawing will replace the same generic device 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated 6.5 Comments. Comnents on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or tel ephom- 296-8525. Provided by IHSNot for Res

46、aleNo reproduction or networking permitted without license from IHS-,-,-SMD-57b2-879B7 57 777977b 00004LILI O SIZE A STANDARRIZED 6.6 A roved sources of su ly. Approved sources of supply are listed in MIL-BUL-103! Addition:! swrces will be adied to MIL-BUL-103 as they become available, The vendors l

47、isted in MIL-BUL-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein has been submitted to and accepted by DESC-FCS. The approved sout%es listed below are for infOnnatiOn purposes only and are current only to the date of the last action of this document. 5962 -89989 I I I

48、 I i Military drawing I Vendor 1 Vendor I part number I CAGE I similar part I I ,I number I number L/ I I I I 5962-8998901RX I 01295 I SNJ54HC623J I I I I I I I 1 I I I I I I 5962-89989012X I 01295 I SW54HC623FK I I I I I I I I- I I - l/ Caution. DO not use this number for item acquisition. not satisfy the performance requirements of this drawing. Item acquired to this number may Vendor CAGE number O1 295 Vendor name and address Texas Instruments, Incarp rated 13500 N. Central Expressway P.O. Box 655303 Dallas, TX 75265 Potnt OP contact: 1-