DLA SMD-5962-87618 REV B-2006 MICROCIRCUIT LINEAR 4 CHANNEL VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单块 四道视频多路复用器 直线型微型电路》.pdf

《DLA SMD-5962-87618 REV B-2006 MICROCIRCUIT LINEAR 4 CHANNEL VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单块 四道视频多路复用器 直线型微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87618 REV B-2006 MICROCIRCUIT LINEAR 4 CHANNEL VIDEO MULTIPLEXER MONOLITHIC SILICON《硅单块 四道视频多路复用器 直线型微型电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R059-93. 93-01-06 Michael A. Frye B Incorporate revision A NOR. Update drawing to current requirements. Editorial changes throughout. - drw 06-10-10 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS B

2、EEN REPLACED. REV SHET REV SHET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Marcia B. Kelleher DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAIL

3、ABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert P. Evans MICROCIRCUIT, LINEAR, 4 CHANNEL VIDEO AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-09-25 MULTIPLEXER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-87618 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5

4、962-E016-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing descr

5、ibes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87618 01 V A Drawing number Device type (see 1.2.1) Case outline(see

6、 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 HI524 4 channel wideband and video multiplexer 1.2.2 Case outline. The case outline is as designated in MIL-STD-1835 as follows: Outline letter

7、Descriptive designator Terminals Package style V GDIP1-T18 or CDIP2-T18 18 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Digital input voltage . -6 V dc VAH +6 V dc Analog input (VS) or output (VO) maximum voltage +VSUPPLY

8、+ 2 V dc Analog input (VS) or output (VO) minimum voltage. -VSUPPLY- 2 V dc Voltage between supply (V+ - V-) +33 V dc Supply voltage to pwr gnd (V+ to pwr gnd; pwr gnd to V-) . +16.5 V dc Power dissipation (PD) . 1.23 W 1/ Storage temperature range (TS). -65C to +150C Thermal resistance, junction-to

9、-ambient (JA) 81C/W Thermal resistance, junction-to-case (JC). See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C _ 1/ Derate 12.3 mW/C above TA= 75C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

10、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a

11、 part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE ST

12、ANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are availab

13、le online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cit

14、ed herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, append

15、ix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML pro

16、duct in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or fun

17、ction of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physica

18、l dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified

19、on figure 2. 3.2.4 Functional diagram. The functional diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating tempe

20、rature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD M

21、ICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C V- = -15 V, V+ = +15 V, VEN= +2.4 V Group A subgroups Device type Lim

22、its Unit unless otherwise specified Min Max Input leakage current 1/ IIHMeasure inputs sequentially, connect all unused inputs to GND 1, 2, 3 01 1.0 A IILMeasure inputs sequentially, connect all unused inputs to 5 V 20.0 Leakage current into source terminal of an +IS(OFF)VS= +10 V, VD= -10 V, VEN= 0

23、.8 V, all unused inputs = -10 V 1, 2, 3 01 -50 50 nA “OFF” switch -IS(OFF)VS= -10 V, VD= +10 V, VEN= 0.8 V, all unused inputs = +10 V -50 50 Leakage current into drain terminal of an +ID(OFF)VD= +10 V, VS= -10 V, VEN= 0.8 V, all unused inputs = -10 V 1, 2, 3 01 -50 50 nA “OFF” switch -ID(OFF)VD= -10

24、 V, VS= +10 V, VEN= 0.8 V, all unused inputs = +10 V -50 50 Leakage current from an “ON” in driver into +ID(ON)VD= VS= +10 V, all unused inputs = -10 V 1, 2, 3 01 -50 50 nA the switch (drain) -ID(ON)VD= VS= -10 V, all unused inputs = +10 V -50 50 (+) Supply current I(+) VEN= 2.4 V, VS= 0 V, (VDopen)

25、 Sequence all address combinations, record highest I(+) 1, 2, 3 01 25 mA (-) Supply current I(-) VEN= 2.4 V, VS= 0 V, (VDopen) Sequence all address combinations, record highest I(-) 1, 2, 3 01 -25 mA Standby positive supply current +ISBYVEN= 0.8 V, VA= 0 V 1, 2, 3 01 25 mA Standby negative supply cu

26、rrent -ISBYVEN= 0.8 V, VA= 0 V 1, 2, 3 01 -25 mA Input low threshold voltage VAL1, 2, 3 01 0.8 V Input high threshold voltage VAH1, 2, 3 01 2.4 V Switch “ON” resistance RDSVS= 0 V, ID= 100 A 1, 2, 3 01 1.5 k Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for Resal

27、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditi

28、ons 1/ -55C TA +125C V- = -15 V, V+ = +15 V, VEN= +2.4 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Break-before-make time delay 2/ tDRL= 500, CL= 12.5 pF TA= +25C 9 01 10 ns A= +125C 10 2 TA= -55C 11 2 Propagation delay times: address inputs tON(A), tOFF(A)RL= 10 M

29、, CL= 12.5 pF TA= +25C 9 01 300 ns To I/O time TA= -55C, +125C 10, 11 500 Enable to I/O time tON(EN)RL= 500, CL= 12.5 pF TA= +25C 9 01 300 ns A= -55C, +125C 10, 11 500 tOFF(EN)TA= +25C 9 250 A= -55C, +125C 10, 11 500 Address capacitance 3/ CAV+ = V- = 0 V f = 1 MHz TA= +25C 4 01 7 pF Output switch c

30、apacitance 3/ COS4 10 Input switch capacitance 3/ CIS4 6 Crosstalk 3/ CTVS= 3 Vp-p, f = 7 MHz TA= +25C 4 01 56 dB Bandwidth (-3 dB) 3/ BW VS= 3 Vp-p TA= +25C 4 01 6.8 MHz 1/ Input current of one input mode. 2/ Subgroup 11 parameter shall be guaranteed if not tested. 3/ Guaranteed if not tested. Prov

31、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outline V Terminal number Terminal

32、 symbol 1 +V 2 OUT3 SIG GND 4 SIG GND 5 IN 4 6 SIG GND 7 IN 3 8 PWR GND 9 A 1 10 A 0 11 EN 12 IN 1 13 SIG GND 14 IN 2 15 SIG GND 16 FB (OUT) 17 -V 18 FB (IN) FIGURE 1. Terminal connections. A 1 A 0 EN On channel X X L None L L H 1 L H H 2 H L H 3 H H H 4 Channel 1 is shown Selected in the diagram FI

33、GURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. Functional diagram.

34、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with

35、MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ o

36、n the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify wh

37、en the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved

38、source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits deliver

39、ed to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required docu

40、mentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of

41、MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision l

42、evel control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim an

43、d final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO

44、CIRCUIT DRAWING SIZE A 5962-87618 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical paramete

45、rs (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 7, 9 Group A test requirements (method 5005) 1, 2, 3, 4, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance ins

46、pection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be

47、 omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test ci

48、rcuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduct