DLA SMD-5962-87573 REV A-1988 MICROCIRCUIT DIGITAL PROGRAM CONTROL UNIT BIPOLAR MONOLITHIC SILICON《硅单块 双极程序控制单元 数字微型电路》.pdf

《DLA SMD-5962-87573 REV A-1988 MICROCIRCUIT DIGITAL PROGRAM CONTROL UNIT BIPOLAR MONOLITHIC SILICON《硅单块 双极程序控制单元 数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-87573 REV A-1988 MICROCIRCUIT DIGITAL PROGRAM CONTROL UNIT BIPOLAR MONOLITHIC SILICON《硅单块 双极程序控制单元 数字微型电路》.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、1988 NOV 17 CURRENT CAGE CODE 67268 PMIC NA /v- m. STANDARDIZED CHECJBY -, U M I LITA RY IK+V - - DRAWING THIS DRAWING IS AVAILABLE OR USE BY ALL DEPARTMENT AND AGENCIES OF THE DEPARTMENT OF DEFENSE REVICIBN LEVEL ESC FORM 193-1 SEP 87 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUI

2、T, DIGITAL, PROGRAM CONTROL UNIT, BIPOLAR, MONOLITH IC SILICON SHEET 1 OF ii US. GOVERNMENT PRINT“ OFFICE: 1987- 748-119/60911 5962-El007 DISTRIBUTION STATEMENT A. Approved for publlc release; dlslribulion Is unlimited. Licensed by Information Handling Services_ - - - DESC-DWG-7573 REV A 57 7777975

3、0009247 7 SIZE A STANDARDIZED I 5962-87573 - _ - 1. SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.mf MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“, 1.2 Part number, The complete part num

4、ber shall be as shown in the following example: 5962-87573 o1 X X I -I- 7- 7- I I I I I I 1 I Drawing number Device type lase outline Lead finish per (1*2.1) (1.2.2) MIL-M-38510 1.2.1 Device type. The device type shall identify the circuit function as follows: Device type Generic number Circuit func

5、tion o1 29 30 4-bi t program control unit 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows: 1.3 1.4 Out1 ine 1 etter X Y F-11 (28-lead, ,740“ x ,380“ x .090“), flat package 3 Case outline D-10 (28-lead, 1.490“ x .610“ x .232“), dual-in-line p

6、ackage C-4 (28-terminal, ,460“ x ,460“ x .lOO“), square chip carrier package Absolute maximum ratings. Supply voltage range - - - - - - - - - - - - - - - - -0.5 V dc to +7.0 V dc Input voltage range - - - - - - - - - - - - - - - - - -0.3 Y dc to +5.5 V dc Storage temperature range - - - - - - - - -

7、- - - - - -65 C to +150C Maximum power dissipation (PD) A/ - - - - - - - - - 1.320W Lead temperature (soldering, 10 seconds) - - +300 c Thermal resistance, junction-to-case (0jc): Cases X, y, and 3 - - - - - - - - - - - - - - - - - See MIL-M-38510, appendix C Junction temperature (TJ) - - - - - - -

8、- - - - - - - +2OO0C Recommended operating conditions. Supply voltage (V c) - - - - - - - - - - - - - - - Minimum high leve! input voltage (VI 1 - - - - - - - Maximum low level input voltage (V L! - - - - - - - - Case operating temperature range (+CI - - - - - - - - - - - - +4.5 V dc to *5.5 V dc +2

9、.0 V dc tO.8 V dc -55C to +125OC lm - withstand the added PD due to short circuit test, e.g., 10s. Licensed by Information Handling Servicesi- - 1- I 2. APPLICABLE DOCUMENTS 2.1 Government specification and standard. Unless otherwise specified, the following specification and standard, of the issue

10、listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MILITARY MIL-t-38510 - Microcircuits, General Specification for. STANDARD r.11 LITARY MI L-STD-883 - Test M

11、ethods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity. 1 references cited herein, the text of this d

12、rawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL -STD- and as sF:ifi!d herein. “ rovisions for the use of MIL-STD

13、-883 in conjunction with compliant non-JAN devices 3.2 Design, construction, and physical dimensions. dimensi) and erein. The design, construction, and physical 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Block diagram. 3.2.3 Case outlines. The case

14、outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance characteristics. Unless otherwise specified, the electrical The block diagram shall be as specified on figure 2. performance characteristics are as specified in table I and apply over the full case operating temperature ra

15、nge. 3.4 Markin o Warking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marke -h-9 with the part number listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in 6.4 herein. in order to be listed as an approved source of supply in

16、6.4. The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirements herein. 3.5 Certificate of Compliance. A certificate of compliance shall be

17、 required from a manufacturer t U. S.OVERNMENTPAINTIN OFFICE: 1088-550-547 IESC FORM 193A SEP 87 Licensed by Information Handling Services. TABLE 1. Electrical performance characteristics. - lni t I I Test :S - Max I Symbol I Conditions Group A I -55C 5 Tc 5 +125C I I 4.5 v vcc 5.5 v i/ I I I un1,es

18、s therwTse specified I Lin - Min 2.4 V Output high voltage i i I I I I 2.4 - V IF, FULL, Im I IIOH = -1.2 mP i i I I - Output low voltage 0.5 V Yo, Yi, Y2, YIoL = 16 di i 1,2,3 I I I I I, C, + 4 IIOL = 16 nvi I 1,2,3 I I I I I I I I Ici + 4 I 0.5 V 0.5 - - O .8 1.5 .360 - - .702 ,657 2.31 - - - -3.2

19、5 - - 2. O /IH I I 1,2,3 I Input high level :/ vol tage input low level z/ vol tage IL - Input clamp voltage Input low current I ICf I I I I See footnotes at end of table. I SIZE A 5962-87573 STANDARDIZED MILITARY DRAWING EFENCE ELEcTRoplfcs SUPPLY CEMER ReVISfON LEVEL SHEET I r DAMON, OHIO 45444 A

20、4 ESC FORM 193A *u s.oxwai“ToFFIcE;l7 SEP 07 Licensed by Information Handling Services.= I Test DESC-DWG-87573 REV A 57 7777775 0007250 7 W I TABLE I. El ectrical performance characteristics - Continued. Input high current Input high current lutput short circuit current 3J lutput off current lower s

21、upply current - 41 I I jyniboi i Conditions /Group A I subgroup! -55C TC +125“C 4.5 Y T vcc- 5.5 Y i/ unless therwTse speciTied I I I I 110-4, E, TEN, CP, UF: I I I I ICC i I i I I I I Ci I I I I I l- I I I I I OZH I= 2.4 Y I IVOUT = 2.4 Y cc I I I I IVcc = max /Tc = -55C to +125“C I 1,2,3 I i I ! I

22、 I I fTc = +125“C I iee footnotes at end of table. Limits Min I Max I I 20 I I- 140 I I- I- 190 i I- I 250 I I -30 I -85 I I lnO i 1-50 i I- 150 I I- I 239 I 170 - Unit mA mA STANDARDIZED MILITARY DRAWING I SIZE I I IA1 I 5962-87573 DEFENSE FAECTRONICS SUPPLY CENTER REWCION LEVEL SHEET I A 5 DAYTON,

23、 OHIO 45444 t U. S QOVEWMN PRIMINQ OFFiCL 198-S3.547 3C FORM 193A SEP a7 Licensed by Information Handling ServicesI SIZE A . STANDARDIZED _ n_- - DESC-DWG-7573 REV A 57 M 7477745 0007251 7 M . 5962-87573 TABLE I, Electrical performance characteristics - Continued. I I I Test ISYmbOl I Condi tions -5

24、5C 5 Tc 5 +125OC 4.5 v vcc 5.5 v i/ I I I I I I unless therwTse speciTied Setup time 1 its1 See figure 3 hold time 1 Ithl I I I INOTE: All setup and hold Itimes are relating to clock Input: 14-0 i I -Ilow-to-high transi tion. Setup time 2 Its2 I hold time 2 Ith2 I I I I Input: C I I Setup time 3 hol

25、d time 3 Input: TEN Setup time 4 hold time 4 i I Input: Cn i I I Setup time 5 hold time 5 Input: Ci 1:; I i l I I I Setup tine 6 Its6 hold time 6 ith6 I I I I Input: D I I i I RF: = L, I4 i 0-8 or 1035; I I jetup time 7 its7 i hold time 7 /th7 I I Input: D, all I I other conditions I Setup time 8 It

26、s8 I hold time 8 /th8 I i 1 Input: RF I I I I I I I Iliroup A i Limits Unit I subgroups- I I Min I Max I I I I I I I 9,10,11 i 124 i I ns IO1 I ns I I I I I I l I I ;ee footnotes at end of table. Licensed by Information Handling ServicesDESC-DWG-87573 REV A 57 W 7777775 0007252 O W STANDARDIZED MILI

27、TAM DRAWING DEFENSE ELECTRONICS CUPPLY CENTE DAYTON, OH0 45444 TABLE I. Electrical performance characteristics - Continued. SIZE A 5962-87573 RMsK)NLEvEL SHEET A 7 Test Combinational delays 1-6 Input: 14-0 outputs: Y G. P m Combinational delays 7-11 Input: m Combinational delays 12-14 Input: Cn outp

28、uts: Y Cn + 4 ci + 4, 14 = H I I I I Symbol i Condi ti ons Group A i Limits Unit -55C TC +125C I subgroups- 4.5 v T VCC- 5.5 v 1/ I I Min 1 Max I I I I unless therwTse specified I I I I I ti I I See figure 3. i I I INOTE: All outputs fully loaded I I I I ifor combinational delays CL = 50 pF I I I I

29、I I I I I l I I 88 I ns I I 74 I ns I 82 I ns I I I I 87 I ns I I 78 I ns I I I I I 9,10s11 I tpdl I tpd2 I tpd3 I $d4 I tpd5 I I 97 I 1 I I I I tpd6 I I I I I I I I I tpd7 I tpd8 I tpd9 I $dl0 I tpdll. I I i i i I I I I I I I I I I I I 9,10,11 I I 68 I ns I I I 52 I ns I I60 Ins I I I I I I I I I I

30、 I I 78 I 47 ns I I I I i i i I I I I 37 I ns I 130 Ins tpdl2 I tpdl3 I 5dl4 I I I see footnotes at end of table. F Licensed by Information Handling ServicesI See footnotes at end of table. TABLE I. Electrical performance characteristics - Continued. STANDARDIZED MILKARY DRAWING DEFENSE ELECTRONICS

31、SUPPLY CENTER AYIN, ti 45444 I I I I 4.5 v vcc 5.5 v l/ Test Condf tions IGroup A I subgroup I -55C 5 TC 5 +125“C I I unless therwTse specified I I I ISee figure 3 I I I delays 15-16 I Input: Ci I Icombinational delays C, = 50 pF I I I I I Outputs: I I I I I I I :ombi national I INOTE: All outputs f

32、ully loaded for I ci + 4, 14 L Itpdl5 I Ci + 4, I4 = H Itpdl6 I iI I ombinational I I I delays 17-23 I I I I I I Input: CP I I I I I I outputs: I I I I I I Itpdl9 I I Y“ Itpdl7 I c, lf ltpdl8 I 1 i, 14 = L (%de0 I I Ci + 4, I4 = H I5d2l I I II l I I I I I I m ltpd23 I I I mbi nati onal I I I delays

33、24-27 I I I I I I Input: D I I I I I I outputs : I I I I I I Y ltpd24 I I E, F ltpd25 I I Cn + 4 ltpd26 I I I imbi nati onal I I I delay 28 I I I I I I Input: EN I I I I m Itp622 I I Ci + 4, 14 = H /d27 1 I output: m Itpd28 I I I I SIZE A 5962-87573 RNIW LEVEL SHEET A 8 Limits I Min I Max + I I I I

34、I I I I 23 I 23 I I I I I I I I 74 I 58 I 66 I 48 4- I 84 f 6o + I I60 I I I I I I I I 55 I 38 I 45 I I 45 l I I I - Un1 t - nc ns ns ns ns ns ns ns ns - ns ns ns- ns - 1s - I Licensed by Information Handling ServicesI SIZE A STANDARDIZED DESC-DWG-87573 REV A 57 m 7777775 0007254 4 m 5962-87573 I TA

35、BLE I. Electrical performance characteristics - Continued. I I Test Symbol i Conditions I I -55C Tr +125OC 4.5 v v;c- 5.5 v i/ unless therwTse speciVied i i I I Cnable time 1 itEN1 See figure 3 I I IDISL I I From: OE I I lisab1 e time 1 i i To: Y I I I I I hable time 2 itEN2 i lisable time 2 ltDIS2

36、I I I From: E I I “Suspend“ instruction) I I I I To: Y I I I hable tinie 3 ltEb13 I I I lisable time 3 ItDIS3 I II From: 14-0 I I :“Suspend“ instruction) I I I I To: Y 1 1 I linimum clock low time ItpWL 1 I I I linimum clock high ftp“ i time I I I ;roup A i Limits init ;ubgroups I Min I Max I -+I-+

37、I 32 I ns I 31 I I I 9,10,11 I I I I I I I I I I I l I- I - 9,10,11 I I I I 42 I ns I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I I 9,10,11 I I 85 I ns I II I I - 9,10,11 I 35 I I ns I I 9,10,11 I 35 I I ns I I I I I I i/ For conditions shown as min or max, use the appropriat

38、e value specified under operating ranges for the applicable device type. O V and VIH = 3.0 V. For three-state disable tests, change on output voltage level. L/ These input levels provide no guaranteed noise imunity and should only be tested in a static, noise-free environment. (Not during functional

39、 testing. 1 i/ Not more than one output should be shorted at a time. Duration of the short circuit test should not exceed 1 second. L/ Minimum Icc is at maximum temperature. For ac testing, measurements are made at 1.5 V with VI = 5.0 pF and measurement is to 0.5 b = DESC FORM 193A SEP 87 ic U. 5. G

40、OVERNMENT PRINliNQ OFFICE: 1888-550-5(7 Licensed by Information Handling Services - - - - - - DESC-DWG-87573 REV A 57 1-77477f5 0007i55 b 1 STANDARDIZED MILITARY DRAWING DEFENsEELEctRoFIIccsuppLY CENTER DAlN, OHIO 45444 I 1 Case outlines X and Y Top view SltE A 5962-87573 REWONLEVEL SHEET . 10 - EMP

41、TY IS OE 14 E Cn I EN YO RE CI 13 - - c I+4 - Y1 DO y2 D1 y3 D2 D3 I G c n+4 P GND CP NOTES : 1. 2. Pin 1 is marked for orientation. Flat package pin configuration identical to ceramic dual-in-line package. FIGURE 1. Terminal connections. Licensed by Information Handling ServicesDESC-DWG-87573 REV A

42、 57 m 7777775 0007256 8 m STANDARDIZED SIZE A MILITARY DRAWING Case outline 3 Top view 5962-87573 4 3 2 I2827 6 7 8 9 y2 “y IO FIGURE 1. Terminal connections - Continued. Licensed by Information Handling ServicesDESC-DWG-7573 REV A 59 9 77777q5 0007257 T 9 ., 4 INTERNAL FIGURE 2. Block diagram. INST

43、RUCTION DECODER WE .A 5962-87573 STANDARDIZED MILTTAW DRAWING DEFENSE ELECTROEHCC WPPLY CWTER SHEET I I DAY“, OHIO 45444 12 iESC FORM 153A SEP a7 Licensed by Information Handling ServicesDESC-DWG-7573 REV A 59 m 7799775 0007258 I m “- -6 I S1 S1 vcc Y R1 f .- s3 VOL IOL “OLl kn 5.0 - VBE - R= t R2 =

44、 2.4 V IOH VOL 5.0 - VBE - R1 = IOL VOLR2 t NOTES: 1. CL = 50 pF includes scope probe, wiring and stray capacitances without device in test fixture. 2. SI, S2,and S3 are closed during function tests and all ac tests except output enable tests. 3. S1 and S3 are closed while S2 is open for tEN high te

45、st. Si and S2 are closed while s3 is open for tEN low test. 4. CL =5.0 pF for output disable tests. Test outpu I Pin numberl I Test I I I I IPin label IcircuitlR1 I R2 I I I I II l I l II I I 2 I I B 13001 2 kn I I I:! II I II I 3 I Ei;lpfy I 6 13001 2 kn I I I I II I I I I II I I 6 I Cit4 I 6 12401

46、1.5 knl I I I II I I I I I Yo-3 I A 12401 1 knl I II I . . t loads 7 I 1 II I )Pin numberl I Test I I I I I II I 112 IG I I I II I I 13 i Cnt4 I B 124011.5 kQK I I II I I I II I I II I I IPin label IcircuitlRl I R2 I I B 124011.5 knl !I 1 1 11 1 116 17 I 6 13001 2 kn I FIGURE 3. Switching test circu

47、it. STANDARDIZED SIZE 5962-87573 A MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL SHEET DAYKIN, OHIO 45444 A 13 -A U.3.QWEPNMENlPRIMIffiOFFffiE M-549-W4 ,ESC FORM 193A SEP 87 Licensed by Information Handling ServicesI SIZE STANDARDIZED 3.6 Certificate of conformance. A certificate

48、 of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. MILTTARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DArrc)N, OHK) 45444 3.7 Notification of change Notification of change to DESC-ECS shall be required in accordance

49、 with MIL-STD-883 (see 3.1 herein). A 5962-87573 f- RMCION LEVU A 3.8 Verification and review, DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation, Offshore documentation shall be made available onshore at the option of the reviewer. 4, QUALITY ASSURANCE PROVISIONS 4.1 Wipection. Sampling and inspection procedures shall be in accordance with section o - O to the extent