ASTM E2729-2009 Standard Practice for Rectification of Spectrophotometric Bandpass Differences《光谱光度测量的带通差异调整的标准实施规程》.pdf
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1、Designation: E2729 09Standard Practice forRectification of Spectrophotometric Bandpass Differences1This standard is issued under the fixed designation E2729; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision
2、. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This standard outlines the methods that can be used todeconvolve, at least partially, the spectral bandpass differencesof raw spect
3、ral data acquired by abridged spectrophotometry.Such differences are introduced because the spectral passbandmust be of significant bandwidth to allow sufficient energy toreach the detector. On the other hand, the spectral data thatshould be being reported is that of a virtual 1-nm bandwidthspectrum
4、 in order to be useful in the CIE method of tristimulusintegration which involves 1-nm summation.1.2 The standard establishes practices for whether, when,and how a bandpass rectification should be made to anyreflectance or transmittance spectrum acquired by abridgedspectrophotometry.1.3 It is applic
5、able where the shape of the passband istriangular and the bandwidth is equal to the measurementinterval between passbands. Information is provided in Section7 for users when that condition is not satisfactorily met.1.4 This standard does not purport to address all of thesafety concerns, if any, asso
6、ciated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E284 Terminology of AppearanceE308 Practice for Computing
7、 the Colors of Objects byUsing the CIE System3. Terminology3.1 DefinitionsFor definition of terms used in this prac-tice, refer to Terminology E284.3.2 Definitions of Terms Specific to This Standard:3.2.1 virtual 1-nm bandwidth spectrum, nspectral datathat have been corrected by numerical methods so
8、 as to matchas closely as possible a spectrum from the same source but witha putative bandwidth of 1 nm.4. Summary of Practice4.1 The practice assumes that the shape of the passband istriangular and that the bandwidth is equal to the measurementinterval between passbands. This condition is thought t
9、o be metby a majority of commercial instruments in use in spectropho-tometry and spectrocolorimetry. Under those conditions, themethods of Section 6 are to be utilized to rectify the rawreflectance or transmittance data for its bandpass differencesimmediately upon the return of the data to the host
10、computerprogram from the acquiring instrument, or before presentationof the data to the user.5. Significance and Use5.1 Failure to make such a rectification introduces differ-ences from the true value of the spectrum of about 0.02 to 0.4DE*abunits. All users are required to make a rectification ofsu
11、ch bandpass differences. It is especially incumbent uponwriters of computer programs whose function it is to acquiresuch spectra from instruments to see that a competent rectifi-cation is implemented in the program before any additionalprocessing of the spectrum, or calculations involving thespectru
12、m are accomplished, or before the spectrum is madeavailable to a user.5.2 Legacy measuring systems are explicitly exempted fromany requirements for retrofitting of hardware or software andmay continue to utilize previously accepted methods of makingthe bandwidth rectification.6. Methodology6.1 The F
13、irst and Last PassbandsIn the first and lastpassband being rectified, no correction is called for. Thecorrected spectral value Rs,lshould be set equal to themeasured spectral value Rm,l.Rs,15 Rm,1(1)Rs,n5 Rm,nwhere the subscripts 1 and n refer to the wavelength index ofthe first and last passbands b
14、eing corrected.6.2 The Second and Next-to-last PassbandsThe secondand next-to-last passbands being rectified are subject to thefollowing correction:1This practice is under the jurisdiction of ASTM Committee E12 on Color andAppearance and is the direct responsibility of Subcommittee E12.04 on Color a
15、ndAppearance Analysis.Current edition approved Dec. 1, 2009. Published January 2010. DOI: 10.1520/E2729-09.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the stand
16、ards Document Summary page onthe ASTM website.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.Rs,2520.10Rm,11 1.21Rm,22 0.12Rm,31 0.01Rm,4(2)Rs,n21520.10Rm,n1 1.21Rm,n212 0.12Rm,n221 0.01Rm,n23where the second subscript refers to the
17、 wavelength index ofthe bandpass considered.6.3 The Remaining Interior PassbandsThe remaining in-terior passbands are subject to the following five-point rectifi-cation:Rs,i5 0.01Rm,i2 0.12Rm,i11 1.22Rm,i 0.12Rm,i111 0.01Rm,i12(3)where the subscript i is the wavelength index of the passbandbeing cor
18、rected and varies over the range of 3 to n2.7. Applicable Bandpass Shapes7.1 The coefficients of the foregoing rectification equationshave been calculated under the assumption that the passbandsare spaced at equal intervals. The interval is assumed to beequal to the full-width half-height of the pas
19、sbands. Further,assumption is made that the passbands are triangular in shapeand that the reflectance, or transmittance, functions may becharacterized by a quadratic function in the range of anypassband. These assumptions are believed to be true for mostinstruments, materials, and measurements known
20、 to the Sub-committee with jurisdiction for this practice. Accordingly, theabove correction is among the best practices for making arectification of bandpass differences.7.2 While the underlying theory leading to the rectificationequations is based on triangular passbands, some relatedbandpass shape
21、s may be adequately rectified by the methods ofthis practice. This is true of Gaussian and Lorentzian functionband shapes, and may be true of instruments with concavediffraction gratings imaged on diode arrays with more pixelsthan wavelengths being reported. Those passbands are trap-ezoidal in shape
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