ANSI IT9.22-1996 Imaging Materials - Processed Photographic Films - Methods for Determining Scratch Resistance (IS&T)《成像材料.加工过的感光胶片.测定抗划性修复和ANSI PH1.37-1977再设计的方法》.pdf
《ANSI IT9.22-1996 Imaging Materials - Processed Photographic Films - Methods for Determining Scratch Resistance (IS&T)《成像材料.加工过的感光胶片.测定抗划性修复和ANSI PH1.37-1977再设计的方法》.pdf》由会员分享,可在线阅读,更多相关《ANSI IT9.22-1996 Imaging Materials - Processed Photographic Films - Methods for Determining Scratch Resistance (IS&T)《成像材料.加工过的感光胶片.测定抗划性修复和ANSI PH1.37-1977再设计的方法》.pdf(18页珍藏版)》请在麦多课文档分享上搜索。
1、American National Standards Institute11 West 42nd StreetNew York, New York10036ANSI/NAPM IT9.22-1996ANSI/NAPM IT9.22-1996for Imaging Materials Processed Photographic Films Methods for DeterminingScratch ResistanceANSI/NAPM IT9.22-1996Revision and redesignation ofANSI PH1.37-1977(R1989)American Natio
2、nal Standardfor Imaging Materials Processed Photographic Films Methods for DeterminingScratch ResistanceSecretariatNational Association of Photographic Manufacturers, Inc.Approved February 16, 1996American National Standards Institute, Inc.AmericanNationalStandardApproval of an American National Sta
3、ndard requires verification by ANSIthat the requirements for due process, consensus, and other criteria forapproval have been met by the standards developer.Consensus is established when, in the judgment of the ANSI Board ofStandards Review, substantial agreement has been reached by directlyand mate
4、rially affected interests. Substantial agreement means much morethan a simple majority, but not necessarily unanimity. Consensus requiresthat all views and objections be considered, and that a concerted effort bemade toward their resolution.The use of American National Standards is completely volunt
5、ary; their existence does not in any respect preclude anyone, whether he has approvedthe standards or not, from manufacturing, marketing, purchasing, or usingproducts, processes, or procedures not conforming to the standards.The American National Standards Institute does not develop standards andwil
6、l in no circumstances give an interpretation of any American NationalStandard. Moreover, no person shall have the right or authority to issue aninterpretation of an American National Standard in the name of the AmericanNational Standards Institute. Requests for interpretations should be ad-dressed t
7、o the secretariat or sponsor whose name appears on the title pageof this standard.CAUTION NOTICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffirm, revise, or withd
8、raw this standard. Purchasers of American National Standards mayreceive current information on all standards by calling or writing the AmericanNational Standards Institute.Published byAmerican National Standards Institute11 West 42nd Street, New York, New York 10036Copyright 1996 by American Nationa
9、l Standards InstituteAll rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise,without prior written permission of the publisher.Printed in the United States of Americainsert code hereiForewordii0 Introduction11 Scope 22 Normative re
10、ferences .23 Method A .24 Method B .7Figures1 Spherical stylus scratch tester 42 Construction of spherical stylus scratch tester 4AnnexesA Validity of test methods 9B Bibliography .10ContentsPageiiForeword (This foreword is not part of American National Standard ANSI/NAPM IT9.22-1996.)Photographic f
11、ilm must have sufficient resistance to scratches and to abra-sion to permit satisfactory performance in equipment. In some applica-tions, photographic film can become unusable owing to scratches on eitherthe emulsion or support surface, even though the physical integrity andstrength of the photograp
12、hic film is excellent.The practical scratch resistance of photographic film is a difficult propertyto evaluate because of the many forms of abrasive materials and the dif-ferent mechanisms by which scratches can be induced. For example,scratches can be formed when dirt particles are cinched into a f
13、ilm roll. Inthis situation, there is a very high pressure on the particles, and the mag-nitude of the scratch is dependent upon the particle size, the relative hard-ness of the dirt and the film, and on whether the film surface is indentedsmoothly or with a rough fracture. In contrast, film can be a
14、braded by run-ning over a stationary surface. In such a case, the scratch severity is verydependent upon the film-surface pressure. This situation is more closelysimulated in the test methods described in this standard, in which thepressure on the stylus is varied and the resulting scratch is measur
15、ed.These test methods were first worked on in 1955 by Subcommittee 3 ofAmerican National Standards Committee PH1 and resulted in a compara-tive testing program by several participating laboratories. They becamestandard methods in 1963.In 1974, Subcommittee PH1-3 undertook additional investigative wo
16、rkinvolving four participating laboratories. This cooperative testing programstudied the effect of cleaning the sapphire stylus points and resulted in amodification to the cleaning procedure. Changes were also made in thetesting humidity and temperature, in order to make these methods consis-tent wi
17、th test methods described in other American National Standards.The current revision is essentially cosmetic and involved an updating ofreferences, minor editorial modifications, and reformatting into the presentANSI style guidelines. The only technical change is the inclusion of asmaller radius sapp
18、hire stylus.The standard contains two annexes that are informative and are not con-sidered part of this standard.Suggestions for improvement of this standard will be welcome. They shouldbe sent to the National Association of Photographic Manufacturers, Inc.,550 Mamaroneck Avenue, Suite 307, Harrison
19、, New York 10528-1612.This standard was processed and approved for submittal to ANSI byNAPM Technical Committee IT9 on the Physical Properties andPermanence of Imaging Materials. Committee approval of the standarddoes not necessarily imply that all committee members voted for itsapproval. At the tim
20、e it approved this standard, the IT9 Committee had thefollowing members:Peter Z. Adelstein, ChairmanA. Tulsi Ram, SecretaryiiiAssociation for Information and Image Management Judy KilpatrickAssociation of Reproduction Materials Manufacturers, Inc. .Philip NowersCanadian Conservation Institute Klaus
21、B. HendriksFirst Image Management CompanyWilliam E. NealeGenealogical Society of Utah.Eric EricksonNathan Nilsson (Alt.)Brent Reber (Alt.)Image Permanence Institute James M. ReillyDouglas Nishimura (Alt.)International Society of Photogrammetryand Remote Sensing .Francis J. ParrishLight Impressions C
22、orporation .Dennis InchMotion Picture Studio Preservation Rami MinaRick Utley (Alt.)National Association of PhotographicManufacturers, Inc. .Ronald CieciuchPeter Roth (Alt.)Haruhico IwanoJunichi KohnoDavid F. KopperlA. Tulsi Ram (Alt.)Charles A. Schallhorn (Alt.)Cheri L. Warner (Alt.)Peter KrauseGil
23、bert G. LeiterNeil Anderson (Alt.)William Murray (Alt.)Norman Newman (Alt.)Kenneth M. SmithRobert L. Seyfert (Alt.)National GeographicRobin E. SiegelNational Information Standards Organization (Liaison) .Margaret ByrnesNational Optical Astronomy Observatories .William E. SchoeningProfessional Photog
24、raphers of America, Inc.Robert M. OpferSmithsonian Institute .Mark McCormick-GoodhartJames Wallace (Alt.)Society of Imaging Science and Technology Peter Z. AdelsteinU.S. Defense Logistics Agency James N. McBeeU.S. General Services Administration Federal Supply and Services .Martin RobinsonU.S. Libra
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