ANSI IEEE 1415-2006 Induction Machinery Maintenance Testing and Failure Analysis.pdf
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1、IEEE Std 1415-2006IEEE Guide for Induction MachineryMaintenance Testing and FailureAnalysisI E E E3 Park Avenue New York, NY 10016-5997, USA30 April 2007IEEE Power Engineering SocietySponsored by theElectric Machinery CommitteeIEEE Std 1415-2006 IEEE Guide for Induction Machinery Maintenance Testing
2、 and Failure Analysis Sponsor Electric Machinery Committee of the IEEE Power Engineering Society Approved 6 December 2006 IEEE-SA Standards Board ii Copyright 2007 IEEE. All rights reserved. Abstract: This guide provides maintenance testing and failure analysis guidance for form-wound, squirrel cage
3、, induction machinery rated up to 15 kV. It addresses the following machine systems: Stator (Winding and Core) Rotor (Winding and Core) Vibration and Noise Bearings and Shafts Structure, Frame Ventilation Accessories. This guide is intended for use by personnel at the facility or corporate office re
4、sponsible for the operation and maintenance of large induction machines. It is a guide to aid the thought processes and procedures necessary to determine root causes for failures. Keywords: failure analysis, induction machinery, induction motor, maintenance tests, maintenance testing, root cause ana
5、lysis _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 April 2007. Printed in the United States of America. IEEE is a registered tr
6、ademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1415,
7、 IEEE Guide for Induction Machinery Maintenance Testing and Failure Analysis. This introduction provides some background on the rationale used to develop the guide. This information is meant to aid in the understanding and usage of this guide. This guide describes maintenance testing and analysis te
8、chniques for failure investigation. It is intended for use by personnel at the facility or corporate office responsible for the operation and maintenance of large induction machines. It is a guide to aid the thought processes and procedures necessary to determine root cause for failures. This guide
9、is intended to satisfy the following objectives: To provide guidance concerning the appropriateness of various maintenance tests and in interpreting the results of those tests with respect to failure analysis and to routine predictive maintenance activities. To provide a methodology by which the mos
10、t probable cause of any particular machine failure may be determined. To encourage the establishment of routine and uniform data collection so that valuable facts concerning the failure are not destroyed. To encourage cooperative efforts between users and manufacturers during failure analysis. The f
11、uture vision for this guide is to cover other rotating electric machinery types including the following: Synchronous machines DC machines Wound rotor machines Random wound induction machines At the time when other machinery types are added, the word “Induction” will be removed from the guide title.
12、But for now, it was considered misleading if “Induction” was omitted since the other types are not yet addressed. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are e
13、ncouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject m
14、atter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implem
15、ent an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. v Copyright 2007 IEEE. All rights reserved. Participants At the time this guide was completed, the Induction Machinery Maintenance Testing and Failure Analysis Workin
16、g Group had the following membership: Larry A. Wall, Chair William Bartley Edward J. Baznik Noah Bethel Thomas H. Bishop Austin Bonnett James H. Dymond Nirmal K. Ghai Bal K. Gupta Tim A. Haskew Thomas A. Higgins, Jr. Wayne E. Johnson Chaman Kaul David G. Kreiss William M. McDermid James R. Michalec
17、Glenn A. Mottershead Nils E. Nilsson Paul I. Nippes Howard W. Penrose James A. Oliver Ed L. Owen Jan Stein Vicki Warren Ernesto J. Wiedenbrug C. A. Wilson The following individual and entity members of the balloting group voted on this guide. Balloters may have voted for approval, disapproval, or ab
18、stention. Ali Al Awazi Paul Andeson Marcos Andrade Sabir Azizi-Ghannad William Bartley Edward J. Baznik Noah Bethel Thomas Bishop William Bloethe Steven Brockschink Andrew Brown Gustavo Brunello Weijen Chen Mary Capelli-Schellpfeffer Thomas Carpenter Keith Chow Douglas Conley Roger Daugherty Matthew
19、 Davis Donald Dunn James Dymond James Edmonds Ahmed El-Serafi Gary Engmann Robert Fenton Jorge Fernndez-Daher Trilok Garg Nirmal K. Ghai Randall Groves Bal K. Gupta Paul Hamer Adrienne Hendrickson Gary Heuston Thomas A. Higgins, Jr Dennis Horwitz Jeffrey Hudson David Jackson Chaman Kaul Yuri Kherson
20、sky Jason Lin Bill Lockley Omar Mazzoni Antonio J. Marques-Cardoso Jesus Martinez William M. McDermid Nigel McQuin James R. Michalec Gary Michel Glenn A. Mottershead Jerry Murphy Krste Najdenkoski Art Neubauer Michael Newman Nils E. Nilsson Howard W. Penrose Alvaro Portillo Madan Rana Johannes Rickm
21、ann James Ruggieri Chuck Simmons Dave Smith Greg Stone James Stoner David Tepen Shanmugan Thamilarasan James Timperley Donald Voltz Larry A. Wall Ernesto J. Wiedenbrug James Wilson John Wilson Hugh Zhu vi Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this applic
22、ation guide on 6 December 2006, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy William R. Goldbach Arnold M. Greenspan Robert M. Grow Joanna N. Guenin Julian Forster* Mark S. Halpin
23、Kenneth S. Hanus William B. Hopf Joseph L. Koepfinger* David J. Law Daleep C. Mohla T. W. Olsen Glenn Parsons Ronald C. Petersen Tom A. Prevost Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Walter Weigel Howard L. Wolfman *Member Emeritus
24、Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Matthew Ceglia IEEE Standards Program Manager, Technical Program Development vii Copyright 2007 IEEE. All right
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