ANSI IEEE 1283-2013 Guide for Determining the Effects of High-Temperature Operation on Conductors Connectors and Accessories.pdf
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1、 IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std 1283-2013(Revision of IEEE Std 1283-2004) IE
2、EE Std 1283-2013 (Revision of IEEE Std 1283-2004) IEEE Guide for Determining the Effects of High-Temperature Operation on Conductors, Connectors, and Accessories Sponsor Transmission and Distribution Committee of the IEEE Power and Energy Society Approved 23 August 2013 IEEE-SA Standards Board Abstr
3、act: Possible adverse impacts to an operating overhead transmission line which might occur when operating the line at high temperatures are discussed. Specifically, the transmission lines conductor, connectors, and attached accessories in terms of degradation in mechanical properties due to annealin
4、g elastic and in-elastic elongation, and accelerated aging are explored along with limited mitigation recommendations. Additionally, predictor equations for accelerated creep and conductor loss of strength are detailed in annexes with limited example calculations. Keywords: accelerated aging, accele
5、rated creep, annealing, conductor core, conductors, connectors, IEEE 1283 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 4 October 201
6、3. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2013 IEEE. All rights reserv
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9、EEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adop
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12、and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards developmen
13、t process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attentio
14、n is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder
15、 or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licens
16、es under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Copyright 2013 IEEE. All rights reserved. v Essential Patent Claims may exist for which
17、a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in conn
18、ection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own respo
19、nsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2013 IEEE. All rights reserved. vi Participants At the time this IEEE guide was completed, the Conductors Working Group had the following membership: Jerry Reding, Chair Craig Pon, Vice Chair Neal Chapman L
20、en Custer Bruce Freimark Waymon Goch Tip Goodwin Joe Graziano Douglas Harms Mark Lancaster Joe Renowden Carl Tamm Bob Whapham The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Saleman A
21、libhay Gordon Baker Chris Brooks William Bush William Byrd James Chapman Robert Christman Larry Conrad Glenn Davidson Gary Donner Gary Engmann Dan Evans George Gela Waymon Goch Tip Goodwin Randall Groves Ajit Gwal Douglas Harms Jeffrey Helzer Lee Herron Werner Hoelzl Magdi Ishac Gael Kennedy Yuri Kh
22、ersonsky Robert Kluge Jim Kulchisky Saumen Kundu Chung-Yiu Lam Michael Lauxman Greg Luri Otto Lynch William McBride Jerry Murphy Neal Murray Arthur Neubauer Michael S. Newman Joe Nims Carl Orde Lorraine Padden Bansi Patel Robert Peters Douglas Proctor Iulian Profir Jerry Reding Keith Reese Michael R
23、oberts Stephen Rodick Charles Rogers Thomas Rozek Bartien Sayogo Dennis Schlender Gil Shultz Douglas Smith James Smith Jerry Smith Nagu Srinivas Ryan Stargel Gary Stoedter John Vergis Mark Walton Yingli Wen Kenneth White Larry Young Jian Yu Luis ZambranoWhen the IEEE-SA Standards Board approved this
24、 guide on 23 August 2013, it had the following membership: John Kulick, Chair David J. Law, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Peter Balma Farooq Bari Ted Burse Wael William Diab Stephen Dukes Jean-Philippe Faure Alexander Gelman Mark Halpi
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