JEDEC JESD22-B104C-2004 Mechanical Shock《机械冲击》.pdf

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1、JEDEC STANDARD Mechanical Shock JESD22-B104C (Revision of JESD22-B104-B, September 1990) NOVEMBER 2004, Reaffirmed: June 2009 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Di

2、rectors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and ass

3、isting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may

4、 involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a

5、 sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in con

6、formance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Document

7、s for alternative contact information. Published by JEDEC Solid State Technology Association 2009 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 This document may be downloaded free of charge; however JEDEC retains the copyright on this material. By downloading this file the individ

8、ual agrees not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited n

9、umber of copies through entering into a license agreement. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards and Documents for alternative contact information. JESD22-B104C Page

10、 1 Test Method B104C (Revision of Test Method B104-B) TEST METHOD B104C MECHANICAL SHOCK (From JEDEC Board Ballot JCB-04-70, formulated under the cognizance of the JC-14.1 Subcommittee on Reliability Test methods for Packaged Devices.) 1 Scope The Mechanical Shock Test Method is intended to evaluate

11、 component(s) for use in electrical equipment. It is intended to determine the compatibility of the component(s) to withstand moderately severe shocks as a result of suddenly applied forces or abrupt change in motion produced by handling, transportation or field operation. Mechanical Shock of this t

12、ype may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test intended component qualification. It is normally applicable to cavity-type packages. 2 Apparatus The shock-testing apparatus shall be capable of providing shock pulses up to a peak

13、acceleration of 2900 multiples of gravity (G) with a pulse duration between 0.3 and 2.0 milliseconds (ms) to the body of the device and a velocity change of 48 to 214 inches per second (in/s), metric equivalent 122 to 543 cm/sec. The acceleration pulse shall be a half-sine waveform with an allowable

14、 deviation from specified acceleration level not greater than +/- 20% of the specified peak acceleration. This is determined by a transducer having a natural frequency35X the frequency of the shock pulse being established and measured through a low pass filter having a band width preferably at least

15、 5X the frequency of the shock pulse being established. It is very important that the transducer resonance does not approach the measured value. Filtering should not be used in lieu of good measurement setup and procedure practices. The pulse duration shall be measured between the points at 10% of t

16、he peak acceleration during rise time and 10% of the peak acceleration during decay time. Absolute tolerances of the pulse duration shall be +/- 30% of the specified duration. It is recommended that the test velocity change shall be +/- 10% of the levels specified in Table 1. 3 Terms and definitions

17、 3.1 Equivalent drop height The free-fall drop height (in vacuum, under standard gravity, from rest) needed to attain a velocity equal to the velocity change specified in the tests. It is the theoretical height, which will impart the specified velocity change if impact with zero rebound occurs. This

18、 height is provided for reference only in the various service conditions. 3.2 Peak acceleration The maximum of the acceleration interval of the dynamic motion of the test apparatus. JESD22-B104C Page 2 Test Method B104C (Revision of Test Method B104-B) 3 Terms and definitions (contd) 3.3 Pulse durat

19、ion The length of time between the beginning and the end of the acceleration interval. The beginning is defined as when the acceleration first reaches 10% of the specified peak level. The end is defined as when the acceleration first returns to 10% of the specified peak level after having reached th

20、e specified peak acceleration. level. The basic frequency of the pulse is 1/ (2X duration). 3.4 Service condition The designation of the severity of test. 3.5 Velocity change The integral of the acceleration interval of the dynamic motion of the test apparatus, over the duration of the entire impact

21、 event, including at least the pulse duration interval. 3.6 Vertical direction The direction that is parallel with gravity and pointing away from earth. 3.7 Component A packaged semiconductor device. 3.8 Cavity package A component that has the device located within a cavity of the package body. 3.9

22、Deviation from specified acceleration level Maximum difference of the measured acceleration from the target acceleration. 4 Procedure The shock-testing apparatus shall be mounted on a sturdy laboratory table or equivalent base and leveled before use. Means shall be provided to prevent the shock from

23、 being repeated due to “bounce” in the apparatus. Unless otherwise specified, the device shall be subjected to five shock pulses of the peak (g) level specified in the selected test condition and for the pulse duration specified in each of the orientations X1, X2, Y1, Y2, Z1 and Z2, for a total of 3

24、0 shocks. One required orientation (Y1) should be defined as that one in which the internal element(s) is most likely to be removed from its mount. Components subjected to the test will be randomly selected and typical of production. The component shall be rigidly mounted or restrained by its case w

25、ith suitable protection for the leads. If component rework, burn in or other stressful process is possible, such a process or processes should be applied to the some component(s) prior to shock test. Use of such processes in the test hardware preparation will be documented in the test results. JESD2

26、2-B104C Page 3 Test Method B104C (Revision of Test Method B104-B) 4 Procedure (contd) 4.1 Component level test Component level test consists subjecting the component(s) to at least one of the following service conditions. Service condition will be documented. Shock will be applied to the component o

27、uter surface casing in a manner to simulate expected impacts during processing, packaging, and packaged shipment. The components will be mounted in such a manner so that they experience the full-specified shock level at the component. At least five shocks in each of two directions of three orthogona

28、l axes will be applied (minimum total of 30 shocks) at the severity of the designated service condition. See Table 1. Table 1 Component test levels Service condition Equivalent drop height (inches) / (cm) Velocity change (in/s)/ (cm/s) Acceleration peak (G) Pulse duration (ms) H 59 / 150 214 / 543 2

29、900 0.3 G 51 / 130 199 / 505 2000 0.4 B 44 / 112 184 / 467 1500 0.5 F 30 / 76.2 152 / 386 900 0.7 A 20 / 50.8 124 / 316 500 1.0 E 13 / 33.0 100 / 254 340 1.2 D 7 / 17.8 73.6 / 187 200 1.5 C 3 / 7.62 48.1 / 122 100 2.0 4.2 Measurements Hermeticity tests, if applicable, visual examination and electric

30、al measurements (consisting of parametric and functional tests) shall be performed. 5 Failure criteria A component shall be defined as a failure if hermeticity requirements cannot be demonstrated, if parametric limits are exceeded or if functionality cannot be demonstrated under the conditions speci

31、fied in the applicable procurement document. Mechanical damage, such as cracking, chipping or breaking of the package will also be considered a failure provided such damage was not caused by fixturing or handling and the damage is critical to component performance in the specific application. JESD22

32、-B104C Page 4 Test Method B104C (Revision of Test Method B104-B) 6 Summary The following details shall be specified in the applicable procurement document: a) Test service condition, for each test performed. b) Electrical measurements. c) Sample size and accept number. d) Disposition of failures. e)

33、 Hermetic leak rate (if applicable). f) Description of mounted state test vehicle and fixture (if applicable). g) Description of component pre-test stress history (if applicable). JESD22-B104C Page 5 Test Method B104C (Revision of Test Method B104-B) Annex A (informative) Differences between JESD22-

34、B104C and JESD22-B104-B The following list briefly describes most of the changes made to entries that appear in this publication, JESD22-B104C, compared to its predecessor, JESD22-B104-B (March 2001). If the change to a concept involves any words added or deleted, it is included. Punctuation changes

35、 may not be included. Page Description of change 1 Modified Clause 2, Apparatus. 2 Modified 3.3, definition for pulse duration. 2 Added definition 3.9. JESD22-B104C Page 6 Test Method B104C (Revision of Test Method B104-B) Rev. 9/02 Standard Improvement Form JEDEC -(6%& The purpose of this form is t

36、o provide the Technical Committees of JEDEC with input from the industry regarding usage of the subject standard. Individuals or companies are invited to submit comments to JEDEC. All comments will be collected and dispersed to the appropriate committee(s). If you can provide input, please complete

37、this form and return to: JEDEC Attn: Publications Department 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 Fax: 703.907.7583 1. I recommend changes to the following: Requirement, clause number Test method number Clause number The referenced clause number has proven to be: Unclear Too Rigid In Error Other 2. Recommendations for correction: 3. Other suggestions for document improvement: Submitted by Name: Phone: Company: E-mail: Address: City/State/Zip: Date: