EN 60749-6-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature.pdf
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1、Semiconductor devices - Mechanical and climatic test methodsPart 6: Storage at high temperature (IEC 60749-6:2017)BS EN 60749-6:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60749-6 June 2017 ICS 31.080.01 Su
2、persedes EN 60749-6:2002 English Version Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques - Partie 6: Stockage haute temprature (IEC 60749-6:2017) Halbleiterbau
3、elemente - Mechanische und klimatische Prfverfahren - Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2017) This European Standard was approved by CENELEC on 2017-04-07. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this Eu
4、ropean Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official v
5、ersions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical
6、committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia
7、, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2
8、017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 60749-6:2017 E National forewordThis British Standard is the UK implementation of EN 60749-6:2017. It is identical to IEC 60749-6:2017. It supersedes BS EN 60749-6:2002, which is w
9、ithdrawn.The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. User
10、s are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 94892 3ICS 31.080.01Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of
11、the Standards Policy and Strategy Committee on 30 November 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 607496:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 60749-6 June 2017 ICS 31.080.01 Supersedes EN 60749-6:2002 English Version Semiconduct
12、or devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques - Partie 6: Stockage haute temprature (IEC 60749-6:2017) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren
13、- Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2017) This European Standard was approved by CENELEC on 2017-04-07. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard wi
14、thout any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any
15、other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, C
16、yprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Tu
17、rkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form a
18、nd by any means reserved worldwide for CENELEC Members. Ref. No. EN 60749-6:2017 E BS EN 607496:2017EN 60749-6:2017 2 European foreword The text of document 47/2347/FDIS, future edition 2 of IEC 60749-6, prepared by IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and
19、 approved by CENELEC as EN 60749-6:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-01-07 latest date by which the national standards conflicting with the docum
20、ent have to be withdrawn (dow) 2020-04-07 This document supersedes EN 60749-6:2002. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement n
21、otice The text of the International Standard IEC 60749-6:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60749-20 NOTE Harmonized as EN 60749-20. IEC 60749-4
22、3 NOTE Harmonized as EN 60749-43 1). 1) At draft stage. 2 IEC 60749-6:2017 IEC 2017 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms and definitions 5 4 Test apparatus 5 5 Procedure 5 5.1 Test conditions . 5 5.2 Measurements 6 5.3 Failure crieria 6 6 Summary . 7 Bibliography 8 Table
23、1 High temperature storage conditions . 6 BS EN 607496:2017EN 60749-6:2017 2 European foreword The text of document 47/2347/FDIS, future edition 2 of IEC 60749-6, prepared by IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 60749-6:2017.
24、The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-01-07 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-04-07
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