ASTM F2964-2012 Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device《测定电致发光灯或者其他漫射照明装置亮度均匀性的标准试验方法》.pdf
《ASTM F2964-2012 Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device《测定电致发光灯或者其他漫射照明装置亮度均匀性的标准试验方法》.pdf》由会员分享,可在线阅读,更多相关《ASTM F2964-2012 Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device《测定电致发光灯或者其他漫射照明装置亮度均匀性的标准试验方法》.pdf(4页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: F2964 12Standard Test Method forDetermining the Uniformity of the Luminance of anElectroluminescent Lamp or Other Diffuse Lighting Device1This standard is issued under the fixed designation F2964; the number immediately following the designation indicates the year oforiginal adoption or
2、, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope1.1 This test method covers procedures for determining theuniformity of the luminan
3、ce of an electroluminescent (EL)lamp. While written specifically for the purpose of evaluatingEL devices, which are intrinsically very uniform, it can beapplied (judiciously) to the measurement of any diffuse,essentially planar, light source. For specific purposes, it can beapplied to partially asse
4、mbled devices into which the illumi-nation is installed (such as a membrane switch) as a diagnosticfor the performance of the entire device. In such a case it mustbe understood that the results pertain only to the partialassembly and will be modified as the further assembly pro-ceeds.1.2 The method
5、is to take a 2-dimensional set ofmeasurements, sampling the surface of the unit under test withappropriate density. The method is restricted to measuringluminance only, since variations in color will also show asluminance non-uniformity especially in any photoptically cali-brated measuring device.1.
6、3 The values stated in SI units are to be regarded asstandard. No other units of measurement are included in thisstandard.1.4 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-
7、priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2F2360 Test Method for Determining Luminance of a Mem-brane Switch Backlit with Diffuse Light SourceF2771 Test Method for Determining the Luminance Cur
8、veof an Electroluminescent Lamp at Ambient Conditions3. Terminology3.1 Definitions:3.1.1 luminance, nmeasure of the brightness or luminousintensity of light, usually expressed in units of candelas persquare metre (cd/m2) or foot lamberts. 1 fL = 3.426 cd/m2.3.1.2 luminance curve, na graphical repres
9、entation of thevariation of luminance with time (implicitly under unvaryingoperating conditions).3.1.3 electroluminescent lamp (EL lamp), nessentially acapacitor structure with phosphor and a dielectric sandwichedbetween electrodes, one of which is transparent to allow lightto escape. Application of
10、 an ac voltage across the electrodesgenerates a charging field within the phosphor, which causes itto emit light.3.1.4 time to half luminance (THL), nthe elapsed operat-ing time over which the luminance of a lamp maintained underconstant power will be reduced to half of its initial value.3.1.5 UUT,
11、nunit under test.4. Significance and Use4.1 Application of an EL lamp (or other diffuse lightingsource) to illuminate a device has a functional purpose andmust meet specifications to satisfy the functional requirementsof the device.4.2 Illumination of the device or application can be affectedby vari
12、ations in the quality, efficiency, and design of the lampand any attendant mounting or shading fixtures.4.3 This test method addresses only the optical and visualappearance of the lamp and not its electrical function.4.4 This test method is non-destructive.4.5 This test method is described for appli
13、cation to theillumination layer in which case the results apply to that layeronly. However, it may be desirable and practical to apply thetest to a further assembly or to a fully assembled device withbuilt in illumination. In such a case, the results refer specifi-cally to the subassembly or the ent
14、ire device respectively.1This test method is under the jurisdiction of ASTM Committee F01 onElectronics and is the direct responsibility of Subcommittee F01.18 on MembraneSwitches.Current edition approved July 1, 2012. Published August 2012. DOI: 10.1520/F2964122For referenced ASTM standards, visit
15、the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959.
16、 United States15. Interferences5.1 State of AssemblyTests on incomplete assemblies giveresults appropriate to that state of assembly. Specifically, laterapplication of mounting hardware, baffling, or fixtures mayalter the results.5.2 Filling of ApertureFailure to fill the sampling apertureof the pho
17、tometer will bias the results in a way which is notnecessarily predictable.5.3 Age of DeviceSince every system of illuminationchanges characteristics as it ages, it must be recognized that theresults apply to a particular interval in the lifetime of thesystem. Characterization of the aging propertie
18、s may beaddressed in a separate test method. (See for example TestMethod F2771.)5.4 PerpendicularitySince the angular distribution ofemitted light can be altered by any material through which itpasses, it is important that the photometer be held perpendicu-lar to the area to be sampled.5.5 Temperatu
19、reSince the performance of many lightsources can vary with temperature, it is important to allow theUUT to stabilize thermally, if necessary, and then record theambient temperature at which the measurements are made.5.6 PowerSince the performance of many power sourcescan vary with temperature, it is
20、 important to allow the powersupply for the UUT to stabilize thermally, if necessary, andthen record the warm-up time at which the measurements aremade.5.7 Ambient LightStray light sources will be detected bythe photometer and will affect the UUT luminance measure-ment. It is important to measure th
21、e ambient light beforeilluminating the UUT. This ambient light reading should bezero or as close to zero as possible.5.8 Sampling ApertureThe sampling aperture (area of theUUT sample and over which luminance values are averaged bythe measuring instrument) should be large enough to averageover any in
22、trinsic granularity of the UUT. This area should alsobe small enough compared with the overall size of the UUT toallow multiple measurements to be made without the samplingapertures of adjacent measurements overlapping (at least ninemeasurements are recommended). If areas overlap, the indi-vidual sa
23、mples may no longer be considered as independentsamples. The decision to allow individual samples to overlapor to remain physically distinct is one the experimenter mustmake and be conscious of. Use of a preplanned sequence ofmeasurements is recommended. See Fig. 1 for example of asample sequence an
24、d distribution.6. Apparatus6.1 A working or mounting surface to hold and support theUUT and any supporting fixtures, providing electrical access tothe termination region from which the EL lamp illumination isto be powered and visible access to all regions of interest on thelamp at which the luminanc
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