EN 60749-6-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 6 Storage at High Temperature《半导体器件 机械和气候试验方法 第6部分 高温下储存 部分替代EN 60749-1999+A1-2000+A2-2001 IEC 60.pdf

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1、BRITISH STANDARD BS EN 60749-6:2002 Semiconductor devices Mechanical and climatic test methods Part 6: Storage at high temperature The European Standard EN 60749-6:2002 has the status of a British Standard ICS 31.080.01 BS EN 60749-6:2002 This British Standard, having been prepared under the directi

2、on of the Electrotechnical Sector Policy and Strategy Committee, was published under the authority of the Standards Policy and Strategy Committee on 10 September 2002 BSI 10 September 2002 ISBN 0 580 40334 3 National foreword This British Standard is the official English language version of EN 60749

3、-6:2002. It is identical with IEC 60749-6:2002. It partially supersedes BS EN 60749:1999. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on req

4、uest to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI

5、Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers

6、 to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document

7、 comprises a front cover, an inside front cover, the EN title page, pages 2 to 5 and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. Date CommentsEUROPEAN STANDARD EN 60749-6 NORME EUROPENNE EUR

8、OPISCHE NORM August 2002 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2002 CENELEC - All rights of exploitation in any form a

9、nd by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-6:2002 E ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001 English version Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature (IEC 60749-6:2002) Dispositifs semicon

10、ducteurs - Mthodes dessais mcaniques et climatiques Partie 6: Stockage haute temprature (CEI 60749-6:2002) Halbleiterbauelemente - Mechanische und klimatische Prfverfahren Teil 6: Lagerung bei hoher Temperatur (IEC 60749-6:2002) This European Standard was approved by CENELEC on 2002-07-02. CENELEC m

11、embers are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on applic

12、ation to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretaria

13、t has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Sw

14、itzerland and United Kingdom.EN 64709-:60022 - 2 Foreword The text of document 47/1603/FDIS, future edition 1 of IEC 60749-6, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-6 on 2002-07-02. This mechanical and clim

15、atic test method, as it relates to storage at high temperature, is a complete rewrite of the test contained in clause 2, chapter 3 of EN 60749:1999. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or

16、 by endorsement (dop) 2003-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2005-07-01 Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA is normative. Annex ZA has been added by CENELEC. _ Endorsement n

17、otice The text of the International Standard IEC 60749-6:2002 was approved by CENELEC as a European Standard without any modification. _ Page2 EN607496:2002067-946 EI:C0022 3 SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 6: Storage at high temperature 1 Scope The purpose of this pa

18、rt of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the

19、 effects of this highly accelerated stress test will need to be evaluated. In general, this test of storage at high temperature is in conformity with IEC 60068-2-48 but, due to specific requirements of semiconductors, the clauses of this standard apply. 2 Normative references The following reference

20、d documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-48:1982, Environmental testing Part 2: Tests. Guidance on th

21、e application of the tests of IEC 68 to simulate the effects of storage 3 Test apparatus The apparatus required for this test shall consist of a controlled temperature chamber capable of maintaining the specific temperature within 2 C. 4 Procedure The device under test shall be subjected to continuo

22、us storage at 0 4 150 C for 0 72 000 1 h, except they shall be returned to room ambient conditions for interim electrical measurements. 4.1 Measurements Unless otherwise specified, interim and final electrical measurements shall be completed within 96 h after removal of the devices from the specifie

23、d test conditions. Intermediate measurements are optional unless otherwise specified. The electrical measurements shall consist of parametric and functional tests specified in the applicable procurement document. Page3 EN607496:2002067-946 EI:C0022 4 4.2 Failure criteria A device will be considered

24、a high temperature storage failure if parametric limits are exceeded, or if functionality cannot be demonstrated under nominal and worst-case conditions, specified in the relevant procurement document. Mechanical damage, such as cracking of the package, will be considered a failure. Cosmetic package

25、 defects and degradation of lead finish, or solderability are not considered failure criteria. 5 Summary The following details shall be specified in the relevant specification: a) Electrical measurements (see 4.1). b) Sample size. c) Time and temperature, if other than specified (see clause 4). d) I

26、ntermediate measurements, if required (see 4.1). _ Page4 EN607496:2002- 3 E N64709-:60022 Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other pu

27、blications. These normative references are cited at the appropriate places in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revi

28、sion. For undated references the latest edition of the publication referred to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60068-2-48 1982 Envir

29、onmental testing Part 2: Tests - Guidance on the application of the tests of IEC 60068 to simulate the effects of storage EN 60068-2-48 1999 Page5 EN607496:2002BS EN 60749-6:2002 BSI 389 Chiswick High Road London W4 4AL BSI British Standards Institution BSI is the independent national body responsib

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