EN 60444-1-1997 en Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1 Basic Method for the Measurement of Resonance Frequency and Resona.pdf

《EN 60444-1-1997 en Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1 Basic Method for the Measurement of Resonance Frequency and Resona.pdf》由会员分享，可在线阅读，更多相关《EN 60444-1-1997 en Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1 Basic Method for the Measurement of Resonance Frequency and Resona.pdf（31页珍藏版）》请在麦多课文档分享上搜索。

1、- STD-BSI BS EN 60444-1-ENGL 1997 - 1624667 0874755 535 BS EN 60444-1:1997 IEC 60444-1: incorporating Amendment No. 1 to (renumbers the BS as andAmendment No. 1 to BS EN 1986 BS 7681-1:1993 BS EN 60444-1:1997) 60444-1:199 7 BRITISH STANDARD Measurement of quartz crystal unit parameters by zero phase

2、 technique in a pi-network - + Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network The European Standard EN 60444-1:1997, with the incorporation of amendment A1:1999 has the status of a British Stand

3、ard ICs 31.140 NO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAW STD.BSI BS EN 6044Q-L-ENGL 1997 = Lb24669 087495b 471 BS EN 60444-1:1997 10908 Committees responsible for this British Standard August 2000 Addition of new annex B The preparation of this British Standard was entru

4、sted by the Electronic Components Standards Policy Committee (ECU-) to Technical Committee ECU1 1, upon which the following bodies were represented: EEA (the Association of Electronics, Telecommunications and Business Electronic Components Industry Federation Institute of Physics Institution of Elec

5、trical Engineers Ministry of Defence National Supervising Inspectorate Equipment Industries) This British Standard, having been prepared under the direction of the Electronic Components Standards Policy Committee, was published under the authority of the Standards Board and comes into effect on 15 S

6、eptember 1993 Q BSI 08-2000 Amendments issued since publication The following BSI references relate to the work on this standard: Committee referen ECU11 Special announcement in BSI News May 1993 ISBN O 580 22496 1 Amd. No. I Date 1 Comments 9657 October BS 7681-1:1993 renumbered as 11997 I BS EN 60

7、444-11997 I I Contents Committees responsible National foreword Page Inside front cover 11 Foreword 1 Scope 2 Definition of resonance frequency 3 Reference plane and shielding box 4 Principle of measurement 3 5 Measuring circuit 5.1 The n-network 5.2 Accessories of the n-network 5.3 Associated equip

8、ment 6 Method of measurement 6.1 Initial calibration of the n-network 9 6.2 Frequency and resistance measurement 10 Appendix A Additional information on accuracy 11 Annex B (normative) Updating of some formulae of appendix A 21 Figure 1 4 Figure 2 4 Figure 3 - Plot showing the phase change from the

9、value at 25 n versus reference resistor values from O to 100 Cl at 10 MHz, 50 MHz, 100 MHz and 200 MHz. Measuring circuit according to , Figure 1 page 4 5 Figure 4 - Reference resistors and shorting blank Figure 5a Figure 5a Figure A. 1 Figure A.2 Figure A.3 Figure A.4 Figure A.5 Figure A.6 Figure A

10、.7 Figure A.8 - A typical phase/frequency variation of an adjusted n-network with a 25 in reference resistor Figure A.9 - Typical n-network Figure A.10 - Detail of network assembly 7 8 8 11 11 12 12 13 14 15 16 17 18 Figure A.ll- Dimensions of contacting plates and earthed Figure A.12 - Position of

11、the reference resistor with respect shield; x indicates position of rod and disk centres of n-network to the network contacting plates Figure A.13 - Other design of a n-network 19 19 20 8 BSI 08-2000 1 STDmBSI BS EN b0444-L-ENGL 3997 9 Lb24bb9 0874958 244 9 BS EN 60444-1:1997 National foreword This

12、part of BS EN 60444 has been prepared by Technical Committee EPU49 (formerly ECLIll), and is the English language version of EN 60444-1:1997 including amendment A1:1999, published by the European Committee for Electrotechnical Standardization (CENELEC). It is identical with IEC 60444-1: 1986, Measur

13、ement of quartz crystal unit parameters by zero phase technique in api-network -Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network, including amendment 1:1999 published by the International Electrot

14、echnical Commission (IEC). Cross references The British Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find facility

15、of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations

16、. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 26, an inside back cover and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. 11 O BSI 08-2000 EUROPEAN STANDAR

17、D NORME EUROPENNE EN 60444-1 April 1997 + Al EUROPISCHE NORM October 1999 ICs 31.140 Descriptors: Quartz crystal units, measurement of parameters, zero phase technique in a pi-network, basic method, principle and circuit, resonance frequency and resistance English version Measurement of quartz cryst

18、al unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network (includes amendment Al: 1999) (IEC 60444-11986 + A1:1999) Mesure des paramtres des qua

19、rtz pizolectriques par la technique de phase nulle dans le circuit en pi - Partie 1: Mthode fondamentale pour la mesure de la frquence de rsonance et de la rsistance de rsonance des quartz pizolectriques par la technique de phase nulle dans le circuit en pi (inclut lamendement Al: 1999) (CE1 60444-1

20、1986 + A1:1999) Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk - Teil 1: Verfahren zur Messung der Resonanzfrequenz und des Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem Pi-Netzwerk (enthlt nderung Al: 1999) (IEC 60444-1:1986 +

21、 A1:1999) This European Standard was approved by CENELEC on 1997-03-11; amendment Al was approved by CENELEC on 1999-10-01. CENELEC members are bound to comply with the CENICENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard

22、 without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other l

23、anguage made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national standards bodies of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Icela

24、nd, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. - CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de

25、 Stassart 35, B-1050 Brussels O 1997 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members Ref. No. EN 60444-1:1997 + A1:1999 E STD-BSI BS EN b0444-1-ENGL 1997 W Lb24bb9 08749b0 9T2 = EN 60444-1:1997 Foreword The text of the International Standard I

26、EC 444-1:1986, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the formal vote and was approved by CENELEC as EN 60444-1 on 1997-03-11 without any modification. The following dates were fixed: - latest date by which the EN has to be i

27、mplemented at national level by publication of an identical national standard or by - latest date by which the national standards conflicting with the EN endorsement (dop) 1997-12-01 have to be withdrawn (dow) 1997-12-01 Foreword to amendment Al The text of document 49/442/FDIS, future amendment 1 t

28、o IEC 60444-1, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment Al to EN 60444-1:1997 on 1999-10-01. The following dates were fured: - latest date by which the amen

29、dment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2000-07-01 - latest date by which the national standards conflicting with the amendment have to be withdrawn (dw) 2002-10-01 STD-BSI BS EN b0444-L-ENGL 1997 = Lb24bb9 08749b3 839 =

30、EN 60444-11997 1 Scope This standard specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network. The measuring method and the network are suitable for use over the frequency range 1 MHz to 200 MHz with a

31、 fractional frequency accuracy of the order of 10-6 with a reproducibility of lW to 1W depending on the type of crystal unit being measured, and an accuracy of the measurement of resonance resistance of f2 % to *5 % depending on the accuracy of the voltage measurement. However, above approximately 1

32、00 MHz the use of this measuring method is limited by the effects of the shunt capacitance Co of the crystal unit under test. To enable the measuring method to be used under these conditions, the use of some method of Co compensation is advisable. A method of Co compensation will be issued in IEC Pu

33、blication 444-3 as an IEC report. NOTE The modifications to the measuring system and network contained in this standard have been introduced to ensure that the claims contained within it are achievable. They do not, however, invalidate the network produced according to the first edition These networ

34、ks are still acceptable as an international standard method of measurement of resonance frequency f, and resonance resistance R,. If the reference resistors described in the standard are slightly modifkd to allow insertion into networks manufactured accorbng to the first edition of publication 444 t

35、hen the problem of obtaining satisfactory reference resistors is solved. 2 Definition of resonance frequency The crystal unit is a 3-terminal network with a complex transfer admittance Y12 = G12 + jBI2, as defined in sub-clause A.l.1 of Appendix A. The enclosure is considered as the common terminal.

36、 For glass enclosures, the third terminal is defined in clause 3. The resonance frequency is defined as the lower of the two frequencies of the crystal unit alone under specified conditions at which B12 is zero. At this frequency, the resonance resistance is 1/GIz = R,. 3 Reference plane and shieldi

37、ng box Because of lead inductance of the crystal unit it is necessary to spec* a reference plane at which the measurements are to be made. This plane is located at a distance of 2 mm from the place where the pins or leads emerge from the crystal unit, unless otherwise specified. The third terminal f

38、or glass enclosures is a metal shielding box with internal dimensions 27 mm in height and the base plane of 40 mm X 40 mm (base plane = reference plane) and closed at the top. The crystal unit is to be located at the centre of the base plane of the shielding box. 4 Principle of measurement The measu

39、rement is reduced to a 2-terminal impedance measurement by inserting the crystal unit in a n-network (see Figure 1). The phase of the crystal transfer admittance is indicated on a phasemeter connected across then-network. The frequency giving zero phase reading is measured. Zero phase is calibrated

40、by inserting a reference resistor in the n-network. The value of the resonance resistance can be calculated from the voltage readings on channels A and B. 5 Measuring circuit The measuring circuit consists basically of a n-network connected with coaxial cables to the associated equipment (see Figure

41、 1). 3 Q BSI 08-2000 STDaBSI BS EN b0444-1-ENGL 1997 E Ib24bb9 08749b2 775 EN 60444-1:1997 - Frequency U couriter A - Attenuator 30 dB 50R u r- - 50 R Line stretcher/ line equalizer - n-network 6 38445 NOTE 1 The 30 dB attenuator in channel A may be desirable with certain phasemeters and voltmeters.

42、 NOTE 2 The line stretcher of constant impedance in channel B may be desirable for ease of equalizing the electrical length of the connecting cables. (A “line stretcher“ with variable length is a phase equalizing device of constant impedance.) NOTE 3 When using some generators it may be advisable to

43、 use a filter to reduce the harmonic distortion to the level specified in sub-clause 6.3.1.1. Figure 1 The fact is emphasized that the construction of the n-network determines the accuracy of the Set-up, whereas the associated equipment can be extended, if necessary, to produce a very sophisticated

44、Set-up. For this reason, only the essential elements of the associated equipment are specified (see sub-clause 5.3). R2 = R6 = 159 Cl (disk type) R3 =RE = 14.2 Cl (disk type) R4 = R, = 66.2 Cl (rod type) Tolerance fl % Ct, = Ct, = 0.5 pF to 5 pF (air trimmer) NOTE The function of the input and outpu

45、t pads is twofold: a) to match the crystal impedance to the associated equipment; b) to attenuate reflections from the associated equipment. Figure 2 8 BSI 08-2000 STD-BSI BS EN 60444-1-ENGL 1997 m Lb24669 06749b3 601 EN 60444-11997 (pl) +O4 +o2 0- -02 -04 -06 -08 -10 -12 -14 -1 6.1.1.2 The frequenc

46、y range shall be 1 MHz to 200 MHz. 5.1.1.3 The logarithmic ratio of the respective voltages at the B-channel with and without the shorting blank inserted in the n-network is termed the “cross-talk attenuation“ of the n-network test Set-up. The cross-talk attenuation u, (in decibels) is given by the

47、expression: T7 I- - - - - - - - - 6, “ Bs a, = 20 log- VBO where V, is the voltage at the B-channel with the shorting blank inserted into the n-network and Vb is the voltage at the 3-channel with the shorting blank removed from then-network. Measured at a frequency of 100 MHz in the measuring circui

48、t according to Figure 1, page 4, the cross-talk attenuation shall be a60 dB. 6.1.1.4 At all frequencies between 1 MHz and 200 MHz the phase measured at 75 Cl shall not deviate by more than f0.2 from the phase measured at 25 42 in the measuring circuit according to Figure 1 (see Sub-clause 6.1). At a

49、 frequency of 200 MHz, the phase over the resistance range 15 Cl to 100 42 shall not deviate by more than *0.5“ Gom the phase measured at 25 42 in the measuring circuit according to Figure 1 (see Figure 3, page 5, and sub-clause 6.1). 10 MHz 50 MHz 1 O0 MHz 200 MHz 1 1 I I 1- O 25 50 75 100 RR) 386435 Figure 3 - Plot showing the phase change from the value at 25 Cl versus reference resistor values from O to 100 42 at 10 MHz, 50 MHz, 100 MHz and 200 MHz - Measuring circuit according to Figure 1, page 4 0 BSI 08-2000 5 _- . STD-BSI BS EN b0444-L-ENGL