ECA EIA-60384-15-2014 Fixed Capacitors for Use in Electronic Equipment - Part 15 Sectional Specification - Fixed Tantalum Capacitors with Non-Solid or Solid Electrolyte.pdf

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1、 EIA STANDARD Fixed Capacitors for Use in Electronic Equipment Part 15: Sectional Specification Fixed Tantalum Capacitors with Non-Solid or Solid Electrolyte EIA-60384-15 October 2014 EIA-60384-15 ANSI/EIA-60384-15-2014 Approved: October 10, 2014 NOTICE EIA Engineering Standards and Publications are

2、 designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existe

3、nce of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other th

4、an ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor do

5、es it assume any obligation whatever to parties adopting the Standard or Publication. This EIA Standard is identical (IDT) with the International Standard IEC Publication 60384-15:1982: Fixed Capacitors for Use in Electronic Equipment Part 15: Sectional Specification Fixed Tantalum Capacitors with N

6、on-Solid or Solid Electrolyte. This document is the EIA Standard EIA-60384-15 2014 Edition 1: Fixed Capacitors for Use in Electronic Equipment Part 15: Sectional Specification Fixed Tantalum Capacitors with Non-Solid or Solid Electrolyte. The text, figures and tables of IEC 60384-15:1982 are used in

7、 this Standard with the consent of the IEC and the American National Standards Institute (ANSI). These materials are subject to copyright claims of IEC and ECIA. No part of this publication may be reproduced in any form, including an electronic retrieval system, without the prior written permission

8、of ECIA. All requests pertaining to EIA-60384-15 2014 Edition 1: Fixed Capacitors for Use in Electronic Equipment Part 15: Sectional Specification Fixed Tantalum Capacitors with Non-Solid or Solid Electrolyte should be submitted to ECIA at the address below. The IEC copyrighted material has been rep

9、roduced with permission from ANSI. The IEC Foreword and Introduction are not part of the requirements of this standard but are included for information purposes only. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It i

10、s the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5278, formulated under the cognizance of the P-2.5 Committee on EIA Solid Electrolytic Capa

11、citors Standards and given final approval by the Steering Committee for Passive Electronic Components Standards (S-1). Published by Electronic Components Industry Association 2014 Standards the relative importance of each item is indicated by its position in the list: a) rated capacitance; b) rated

12、voltage (d.c. voltage may be indicated by the symbol = or - ) ; c) category voltage and category temperatures (for long-life grade capacitors only) (if applicable); d) polarity of the terminations: polar capacitors shall be marked with a positive sign near the positive terminations. Bipolar capacito

13、rs shall be marked positive at both ends and, if space permits, in addition with the letters “BP“; e) tolerance on rated capacitance; f) reference to the grade. (For long-life grade capacitors only). The abbreviation “LL“ may be used for marking purposes; g) year and month (or week) of manufacture;

14、h) manufacturers name or trade mark; i) indication of the sub-family (e.g. 1, 2 or 3); j) climatic category; k) manufacturers type designation; 1) reference to the detail specification. 1.6.2 The capacitor shall be clearly marked with a), b) and d) above and with as many as possible of the remaining

15、 items as is considered necessary. Any duplication of information in the marking on the capacitor should be avoided. 1.6.3 The package containing the capacitor(s) shall be clearly marked with all the information listed in Sub-clause 1.6.1. EEEIA-60384-15 Page 6 1.6.4 Any additional marking shall be

16、so applied that no confusion can arise. SECTION TWO - PREFERRED RATINGS AND CHARACTERISTICS 2. Preferred ratings and characteristics 2.1 Preferred characteristics The values given in detail specifications shall preferably be selected from the following: 2.1.1 Preferred climatic categories The capaci

17、tors covered by this specification are classified into climatic categories according to the general rules given in I E C Publication 68-1. The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following: Lower category temperature: -55

18、 C. Upper category temperature: + 85 C, + 100 C and + 125 C. Duration of the damp heat, steady state test: 4, 10, 21 and 56 days. The severities for the cold and dry heat tests are the lower and upper category temperatures respectively. 2.2 Preferred values of ratings 2.2.1 Rated capacitance (CR) Pr

19、eferred values of rated capacitance are chosen from the E3 series of I E C Publication 63 and their decimal multiples. If other values are needed, they shall preferably be chosen from the E6 series. 2.2.2 Tolerance on rated capacitance Preferred values of tolerances on rated capacitance are: Solid e

20、lectrolyte capacitors Non-solid electrolyte capacitors 5% 10% 20% 10% 20% -10/+30% -10/+50% EIA-60384-15 Page 7 2.2.3 Rated voltage (UR) Preferred values of rated direct voltages taken from the R5 series of ISO Standard 3 are: 1.0 - 1.6 -2.5 - 4.0 - 6.3 and their decimal multiples. If other values a

21、re required they shall preferably be chosen from the R10 series. 2.2.4 Category voltage (Uc) The category voltage is equal to the rated voltage, unless otherwise stated in the detail specification. 2.2.5 Reverse voltage The permissible reverse voltage shall be given in the detail specification. 2.2.

22、6 Surge voltage The surge voltage shall be 1.15 times the rated or category voltage rounded off to the nearest volt. 2.2.7 Ripple (if applicable) Ripple current and/or ripple voltage shall be specified in the detail specification. 2.2.8 Rated temperature The value of the rated temperature is 85 C un

23、less otherwise stated in the detail specification. SECTION THREE - QUALITY ASSESSMENT PROCEDURES 3. Quality assessment procedures 3.1 Primary Stage of Manufacture The primary stage of manufacture is the forming of the oxide. 3.2 Structurally Similar Components Capacitors considered as being structur

24、ally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and values. 3.3 Certified Records of Released Lots The information required in Sub-clause 3.5.1 of I E C Publication 384-1 shall be made available when prescribed in the detail speci

25、fication and when requested by a purchaser. After the endurance test, the parameters for which variables information is required are the capacitance change, tan and the leakage current. EEEIA-60384-15 Page 8 3.4 Qualification Approval The procedures for Qualification Approval testing are given in Su

26、b-clause 3.4 of the Generic Specification, I E C Publication 384-1. The schedule to be used for Qualification Approval testing on the basis of lot-by-lot and periodic tests is given in Sub-clause 3.5 of this specification. The procedure using a fixed sample size schedule is given in Sub-clauses 3.4.

27、1 and 3.4.2 below. 3.4.1 Qualification Approval on the basis of the fixed sample size procedures Sampling The fixed sample size procedure is described in I E C Publication 384-1, Sub-clause 3.4.2 b). The sample shall be representative of the range of capacitors for which approval is sought. This may

28、 or may not be the complete range covered by the detail specification. The sample shall consist of specimens having the lowest and highest voltages, and for these voltages the smallest and largest case size. When there are more than four case sizes an intermediate case size shall also be tested. In

29、each of these case size/voltage combinations (values) the highest capacitance shall be chosen. Thus for the approval of a range, testing is required of either four or six values. When the range consists of less than four values, the number of specimens to be tested shall be that required for four va

30、lues. Spare specimens are permitted as follows: a) One per value which may be used to replace the permitted defective in Group “0“. b) One per value which may be used as replacements for specimens which are defective because of incidents not attributable to the manufacturer. The numbers given in Gro

31、up “0“ assume that all groups are applicable. If this is not so the numbers may be reduced accordingly. When additional groups are introduced into the Qualification Approval test schedule, the number of specimens required for Group “0“ shall be increased by the same number as that required for the a

32、dditional groups. Table I gives the number of samples to be tested in each group or sub-group together with the permissible number of defectives for qualification approval tests. 3.4.2 Tests The complete series of tests specified in Tables I and II are required for the approval of capacitors covered

33、 by one detail specification. The tests of each group shall be carried out in the order given. The whole sample shall be subjected to the tests of Group “0“ and then divided for the other groups. Specimens found defective during the tests of Group “0“ shall not be used for the other groups. “One def

34、ective“ is counted when a capacitor has not satisfied the whole or a part of the tests of a group. EIA-60384-15 Page 9 The approval is granted when the number of defectives does not exceed the specified number of permissible defectives for each group or sub-group and the total number of permissible

35、defectives. Note.- Tables I and II together form the fixed sample size test schedule, for which Table I includes the details for the sampling and permissible defectives for the different tests or groups of tests, whereas Table II together with the details of test contained in Section Four gives a co

36、mplete summary of test conditions and performance requirements and indicates where e.g. for the test method or conditions of test a choice has to be made in the detail specification. The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to tho

37、se prescribed in the detail specification for quality conformance inspection. TABLE I Sampling plan together with numbers of permissible defectives for qualification approval tests 1) If prescribed in the detail specification. 2) Not more than one defective is permitted from any one value. 3) As pre

38、scribed in the detail specification. 4) Case size/voltage combinations, see Sub-clause 3.4.1. EEEIA-60384-15 Page 10 TABLE II Test schedule for Qualification Approval Notes 1.- Sub-clause numbers in this schedule refer to Section Four: Test and measurement procedures. 2.- In this table: D = destruct

39、ive, ND = non-destructive. (Table continued on page 11) EIA-60384-15 Page 11 (Table continued on page 12) EEEIA-60384-15 Page 12 (Table continued on page 13) EIA-60384-15 Page 13 (Table continued on page 14)EEEIA-60384-15 Page 14 (Table continued on page 15)EIA-60384-15 Page 15 * If applicable. (Tab

40、le continued on page 16) EEEIA-60384-15 Page 16 3.5 Quality Conformance Inspection 3.5.1 Formation of inspection lots a) Groups A and B inspection These tests shall be carried out on a lot-by-lot basis. A manufacturer may aggregate the current production into inspection lots subject to the following

41、 safeguards: (1) The inspection lot shall consist of structurally similar capacitors (see Sub-clause 3.2). (2a) The sample tested shall be representative of the values and dimensions contained in the inspection lot: - in relation to their number; - with a minimum of five of any one value. (2b ) If t

42、here are less than five of any one value in the sample the basis for the drawing of samples shall be agreed between the manufacturer and the National Supervising Inspectorate. b) Group C inspection These tests shall be carried out on a periodic basis. Samples shall be representative of the current p

43、roduction of the specified periods and shall be divided into high, medium and low voltage ratings or case sizes. In order to cover the range of approvals in any period, one high, one medium and one low voltage or case size shall be tested. In subsequent periods other voltages or case sizes in produc

44、tion shall be tested with the aim of covering the whole range. EIA-60384-15 Page 17 3.5.2 Test schedule The schedule for the lot-by-lot and periodic tests for Quality Conformance Inspection is given in Section Two, Table IV of the Blank Detail Specification, I E C Publications 384-15-1, 384-15-2 or

45、384-15-3, as applicable. 3.5.3 Delayed delivery When according to the procedures of IEC Publication 384-1, Sub-clause 3.5.2, re- inspection has to be made, solderability and capacitance shall be checked as specified in Group A and B inspection. 3.5.4 Assessment levels The assessment level(s) given i

46、n the blank detail specification shall preferably be selected from Tables III A and III B: TABLE III A IL = inspection level AQL = acceptable quality level TABLE III B p = periodicity in months n = sample size c = permitted number of defectives Notes concerning Tables III A and III B: * The assessme

47、nt levels D, F and G are under consideration. * The content of the Inspection sub-groups is described in Section Two of the relevant blank detail specification. EEEIA-60384-15 Page 18 SECTION FOUR -TEST AND MEASUREMENT PROCEDURES This section supplements the information given in I E C Publication 38

48、4-1, Section Four. 4. Test and measurement procedures 4.1 Visual inspection and check of dimensions I E C Publication 384-1, Sub-clause 4.4. 4.2 Electrical tests 4.2.1 Leakage current See Sub-clause 4.9 of I E C Publication 384-1, with the following details: 4.2.1.1 Measuring conditions The rated vo

49、ltage shall be applied across the capacitor and its protective resistor. The protective resistor shall be between 1 000 Q and 10 000 Q. In the case of bipolar capacitors, the duration of the electrification periods before the measurement made in each direction is 5 min. 4.2.1.2 Requirement The leakage current at 20 C, 85 C and 125 C shall not exceed the limits specified in the detail specification; the value of these limits shall be equal to or greater than 1 11A, 10 11A and 12.5 11A respectively. 4.2.2 Capacitance Sub-clause 4.7 of l E C Publication