DLA SMD-5962-94532-1994 MICROCIRCUIT CMOS 64-BIT MICROPROCESSOR《64位微处理器 氧化物半导体微型电路》.pdf
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1、SMD-5762-94532 W 999999b 0059932 203 UtSC FORM 1Y5 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 5962-E159-94 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-74532 9999996 0059913 L4B W 1. SCOPE 1.1
2、 Scope. This drawing forms a part of a one part - one part nunber docunentation system (see 6.6 herein). Tuo product assurance classes consisting of military high reliability (device classes Q and U) and space application (device class V), and a choice of case outlines and lead finishes are availabl
3、e and are reflected in the Part or Identifying Nunber (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction uith compliant non-JAN devicesla. When available, a choice of Radiation Har
4、dness Assurance (RHA) levels are reflected in the PIN. 1.2 m. lhe PIN shall be as shorn in the following exanple: 5r2 , 94532 01 1 i i Federal RHA Device Device Case Lead stock class designator type c 1 ass outline finish designator (see 1.2.1) (see 1.2.2) des i gnator (see 1.2.4) (see 1.2.5) / (see
5、 1.2.3) / Drawing nunber 1.2.1 RHA designator. Device class M RHA marked devices shall nieet the MIL-1-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. MIL-1-38535 specified RHA levels and shall be marked with the appropriate RHA designator. non-RHA devi
6、ce. Device classes O and V RHA marked devices shall meet the A dash (-1 indicates a 1.2.2 Device type(s1. The device type(s) shall identify the circuit function as follous: Device type o1 02 03 Generic nunber 80860-25 80860-33 80860-40 Circuit function 25 MHz - these tests shall have been fault grad
7、ed in accordance with MIL-STD-883, test method 5012 (see 1.5 herein). d. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table I1 herein. STANDARD1 ZED 5962-94532 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Provided
8、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-57b2-94532 b 0059925 9bT Interim electrical parameters (see 4.2) 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition C or D. The t
9、est circuit shall be maintained by the manufacturer under docunent revision level control and shall be made available to the preparing or acquiring activity upon request. shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
10、method 1005. The test circuit b. TA +125C, minim. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. TABLE II. Electrical test reauirements. (in accordance with (in accordance with MIL-STD-883, MIL-1-38535, table II 1) Devi ce Device Device class M class P class V Test
11、 requirements 1,7,9 1.7,9 1,7,9 Final electrical 1/ 1, 2, 3, 7, 8, 1/ 1, 2, 3, 7, 8, 9, 10, 11 parameters (see 4.2) 1 - 9, IO, 11 I I I 1 I 2/ 1, 2, 3, 7 8, 9, 10, 11 Group A test requirements (see 4.4) I I I I I I I I, 2, 3, 4, 7, a, 1, 2, 3, 4, 7, 1, 2, 3, 4, 7, 9, 10, 11 8, 9, 10, 11 8, 9, 10, 11
12、 2. 8a, 10 I 2, Ba, 10 Group C end-point electrical parameters (see 4.4) Group D end-point electrical parameters (see 4.4) 2, 8a, 10 2, 8a, 10 2, 8a, 10 2, 8a, 10 I I 1 I Group E end-point electrical parameters (see 4.4) I I I I l I I PDA applies to subgroup 1. I PDA applies to subgroups 1 and 7. 4.
13、4.2.2 Additional criteria for device classes P and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-1-38535. manufacturers TRB, in accordance with MIL-1-38535, and sh
14、all be made available to the acquiring or preparing activity upon request. accordance with the intent specified in test method 1005. The test circuit shall be maintained der docunent revision level control by the device The test circuit shall specify the inputs, outputs, biases, and power dissipatio
15、n, as applicable, in 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein. STANDARD1 ZED 5962-94532 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 Provided by IHSNot for ResaleNo reproduction or networking pe
16、rmitted without license from IHS-,-,-I SMD-5962-94532 = 9999996 0059926 BTb Fuictim 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). M shall be M and D. RHA levels for device classes P and V shall be M, D, R
17、, and H and for device class Active Iwt/ State (kitput a. b. End-point electrical parameters shall be as specified in table II herein. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-1-38535, appendix A, for the RHA level being tested. vehic
18、le shall be subjected to radiation hardness assured tests as specified in MIL-1-38535 for the RHA level being tested. defined in table I at TA = +25“C *5“C, after exposure, to the subgroups specified in table II herein. When specified in the purchase order or contract, a copy of the RHA delta limits
19、 shall be supplied. For device classes Q and V, the devices or test All device classes must meet the postirradiation end-point electrical parameter limits as c. 5. PACKAGING 5.1 Packaginq requirements. The requirements for packaging shall be in accordance with MIL-STD-883 (see 3.1 herein) for device
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