DLA SMD-5962-92154 REV B-2009 MICROCIRCUIT MEMORY DIGITAL CMOS 64K X 1 STATIC RANDOM ACCESS MEMORY (SRAM) MONOLITHIC SILICON.pdf
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1、REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Boilerplate update, editorial changes throughout. ksr 01 - 07 - 05 Raymond Monnin B Update drawing to current requirements. Editorial changes throughout. tcr 09 06-08 Joseph Rodenbeck REV SHET REV B B B B B B B B B B B SHEET 15 16 17 18 19 20 21 2
2、2 23 24 25 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY James Jamison STANDARD MICROCIRCUIT DRAWING CHECKED BY Jeff Bowling DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FO
3、R USE BY ALL APPROVED BY Michael A. Frye DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93 - 09 - 15 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY, (SRAM), MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-92154 SHEET 1 O
4、F 25 DSCC FORM 2233 APR 97 5962-E323-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 5962-92154 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1
5、.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a c
6、hoice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 H 92154 01 Q X C Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.
7、4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and
8、are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types shall identify the circuit function as follows: Device type Generic number Circuit function Access time 01 6401C 64K X 1 CMOS SRAM (CMOS- I/O) 55 ns 02 6401T 64K X 1 CMOS SRAM
9、(TTL- I/O) 55 ns 1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non JAN class level B mic
10、rocircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 36 Flat pack
11、Y See figure 1 32 Rectangular leadless Chip-Carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38535 for classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A
12、5962-92154 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) - - -0.5 V dc to +7.0 V dc DC input voltage range (VIN) - - -0.5 V dc to VCC+ 0.5 V dc DC outpu
13、t voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc Output voltage applied to high Z state - -0.5 V dc to VCC+ 0.5 V dc Storage temperature range - - -65C to +150C Lead temperature (soldering, 5 sec) - +250C Thermal resistance, junction-to-case (JC): Cases X - - 3.31C/Watts Cases Y - - 3.50C/Watts Max
14、imum power dissipation (PD) - 1.0 Watts Maximum junction temperature (TJ)- +175C 4/ 1.4 Recommended operating conditions. Supply voltage range (VCC) - - 4.5 V dc to 5.5 V dc Supply voltage (VSS) - - 0.0 V dc High level (CMOS) input voltage range (VIH) - 3.5 V dc to VCC+ 0.3 V dc High level (TTL) inp
15、ut voltage range (VIH) - 2.2 V dc to VCC+ 0.5 V dc Low level (CMOS) input voltage range (VIL) - -0.5 V dc to 1.5 V dc Low level (TTL) input voltage range (VIL) - -0.5 V dc to 0.8 V dc Case operating temperature range (TC) - -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rat
16、e = 50-300 rads/s) - 1 Mrad 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in t
17、he solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPA
18、RTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMDs). MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Buil
19、ding 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
20、se from IHS-,-,-SIZE A 5962-92154 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwi
21、se specified, the issues of the documents are the issues of the documents cited in the solicitation. AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) ASTM Standard F1192 - Standard Guide for the Measurement of Single Event Phenomena Induced by Heavy Ion Irradiation of Semiconductor Devices. (Applic
22、ations for copies of ASTM publications should be addressed to: ASTM International, PO Box C700, 100 Barr Harbor Drive, West Conshohocken, PA 19428-2959; http:/www.astm.org.) ELECTRONICS INDUSTRIES ASSOCIATION (EIA) JEDEC Standard EIA/JESD 78 - IC Latch-Up Test. (Applications for copies should be add
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