DLA SMD-5962-89725 REV A-1995 MIRCOCIRCUIT DIGITAL CMOS ASYNCHRONOUS SERIAL CONTROLLER MONOLITHIC SILICON《硅单片 同步串联控制器 氧化物半导体数字微型电路》.pdf
《DLA SMD-5962-89725 REV A-1995 MIRCOCIRCUIT DIGITAL CMOS ASYNCHRONOUS SERIAL CONTROLLER MONOLITHIC SILICON《硅单片 同步串联控制器 氧化物半导体数字微型电路》.pdf》由会员分享,可在线阅读,更多相关《DLA SMD-5962-89725 REV A-1995 MIRCOCIRCUIT DIGITAL CMOS ASYNCHRONOUS SERIAL CONTROLLER MONOLITHIC SILICON《硅单片 同步串联控制器 氧化物半导体数字微型电路》.pdf(17页珍藏版)》请在麦多课文档分享上搜索。
1、(YR-MO- DA 1 LTR DEscRIFTiau A pdd device type 02. Add package outline 3. 95-03-29 Editorial changes throughout. APFKwHl T. Hess STANIARD DRPUIYLPIJG MICRCIR(XT1T THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS I A SHEET 1 OF 16 CHECKED BY Robert M. Heber MICROCIRCUIT, DIGITAL, CMOS, ASYNCHRONO
2、US, SERIAL CONTROLLER, MONOLITHIC SILICON APPROVED BY William K. Heckrnan IESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. 19 September 1990 SIZE A CPGEOCDE 67268 REVISION LEVEL AMSC NIA 5962-E155-95 5962-89725 Provided by IHSNot for ResaleNo rep
3、roduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 Scope. This drawing describes device requirements for class 6 microcircuits in accordance with 1.2.1 of MIL-STD-883, Ilprovisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. 1.2 Part or Identif
4、ying Nunber (PINl. The complete PIN shall be as shown in the following example: 5962 - jW25 f J, J, Drawing nhr Device type Case out 1 ine Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device tm(s1. The device type(s) shall identify the circuit function as follows: Device tm Generic nunber C
5、ircuit function 1.2.2 Case outline(s1. The case outlinecs) shall be as designated in MIL-STD-1835 and as folious: Outline letter DescriDtive desianator Termina Is Package style o1 02 STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 825 1 O 825 1 O SIZE 5962-89725 A
6、RNISICNLML SET A 2 CHMOS single component asynchronous serial controller 1/ CHMOS sing1 e component asynchronous serial controller a X 3 GDIP1-T28 or CD I P2- T28 CPCC1-Y28 28 dual-in-line package 28 square leadless chip carrier 1.2.3 Lead finish. The lead finish shall be as specified in MIL-STD-883
7、 (see 3.1 herein). Finish letter I1Xl1 shall not be marked on the microcircuit or its packaging. finishes A, E, and C are considered acceptable and interchangeable uithout preference. The I1Xl8 designation is for use in specifications when lead 1.3 Absolute maximun ratinas. Voltage on any pin uith r
8、espect to GND- - - - - - - - -0.5 V dc to Vcc + 0.5 Storage temperature range - - - - - - - - - - - - - - -65C to +150C Maximum power dissipation (P,) 3/ - - - - - - - - - - 250 nt Thermal resistance, junction-to-case (OJc)- - - - - - See MIL-STD-1835 Junction Twperature (T,) - - - - - - - - - - - -
9、 - - 150OC Lead temperature (soldering, ID seconds)- - - - - - - 265OC 1.4 Recomnended operating conditions. Supply voltage (Vcc)- - - - - - - - - - - - - - - - - 4.5 V dc to 5.5 V dc Case operating temperature range (Tc) - - - - - - - - -55C to +125“C lJ VI, 2.4 V min. a VI, = 2.6 V min. - 3/ Must
10、withstand the added P, due to short circuit test; e.g., Ias. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2. APPLICABLE DOCUMENTS 2.1 Govermient smcification. standards, and bulletin. Unless otherwise specified, the following specification, standa
11、rds, and bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION STANDARD MICROCIRCUIT DRAWING I DEFENSE ELECTRONICS SUPPLY CENTER MI LITARY
12、MIL-1-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. SIZE 5962-89725 A STANDARDS MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. BULLETIN MIL I TARY MIL-BUL-103 - List of Standardized Military
13、Drawings (SMDfs). (Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. in the event of a conflict betwee
14、n the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 Item reauirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with conpliant n
15、on-JAN devices“ and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-1-38535 may be processed as QML product in accordance with t
16、he manufacturers approved program plan and qualifying activity approval in accordance with MIL-1.38535. requirements herein. shall not affect the PIN as described herein. required to identify when the QML flow option is used. This QML flow as docunented in the Quality Management (PMI pian may make m
17、odifications to the These modifications shall not affect form, fit, or function of the device. These modifications A Wi or iiQML1l certification mark in accordance with MIL-1-38535 is 3.2 Design, construction, and dwsical dimensions. The design, construction, and physical dimensions shall be as spec
18、ified in MIL-STD-883 (see 3.1 herein) and herein. 3.2.1 3.2.2 3.2.3 3.3 Electrical wrformance characteristics. Unless otherwise specified herein, the electrical performance Case outline(s1. Terminal connections. Block diagram. The case outline(s) shall be in accordance with 1.2.2 herein. The termina
19、l connections shall be as specified on figure 1. The block diagram shall be as specified on figure 2. characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test reuuirements. The electrical test requirements shall be the subgroups
20、specified in table II. The electrical tests for each subgroup are described in table I. I A 3 DAYTON, OHIO 45444 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-B9725 REV A M 9999996 0073990 2iT Conditions Group A -55C 5 T, 5 +125“C 4.5 v dc
21、 5 v, 5 5.5 v dc subgroups Test svnaoi unless otherwise specified 1, 2, 3 Input low voltage VIL Limits 7 Min Max - I/ -0.5 0.8 V Input high voltage VI, Output low voltage VOL I, 2.0 mA Output high voltage V, i, = -0.4 mA Input leakage current I, I 0.0 V dc 5 V, 5 V, I Three-state leakage I, I 0.45 V
22、 dc 5 VOUT 5 Vc, - 0.45 V I current v, = 5.5 v, VIL = 0.5 v, VI, 2 V, - 0.5 V, Power supply current t +0.5 .: .- FG 3.8 mA/ Standby supply current I, IV, = 5.5 V, VIL 5 0.5 V, I 2 vCC - v# I, = I, = 0.0 v - RTS, DTR, strapping IOHR I current 1 Input capacitance c, Frequency = 1 MHz - See 4.3.1 lJ I/
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