DLA SMD-5962-87591 REV D-2013 MICROCIRCUIT LINEAR HIGH SPEED ANALOG TO DIGITAL CONVERTER MONOLITHIC SILICON.pdf
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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct title to read ANALOG TO DIGITAL. Change conditions for timing tests, table I. Change figure 3. Editorial changes throughout. 90-01-24 M. A. Frye B Changes in accordance with NOR 5962-R231-94. 94-08-12 M. A. Frye C Update drawing to curren
2、t requirements. Editorial changes throughout. - gap 01-08-30 Raymond Monnin D Redrawn. Paragraphs updated to MIL-PRF-38535 requirements. -drw 13-01-25 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D D D OF SHEETS
3、SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Charles E
4、. Besore APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, HIGH SPEED, ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-08-18 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-87591 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E217-13 Provided by IHSNot for ResaleNo reproduct
5、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87591 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN cl
6、ass level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87591 01 L A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device types. The devic
7、e types identify the circuit function as follows: Device type Generic number Circuit function 01 AD7572 12.5-microsecond, 11-bit linearity, 12-bit resolution CMOS A/D converter with 45 ppm/C reference. 02 AD7572 12.5-microsecond, 11-bit linearity, 12-bit resolution CMOS A/D converter with 25 ppm/C r
8、eference. 03 AD7572 12.5-microsecond, 12-bit linearity, 12-bit resolution CMOS A/D converter with 25 ppm/C reference. 04 AD7572 5-microsecond, 11-bit linearity, 12-bit resolution CMOS A/D converter with 45 ppm/C reference. 05 AD7572 5-microsecond, 11-bit linearity, 12-bit resolution CMOS A/D convert
9、er with 25 ppm/C reference. 06 AD7572 5-microsecond, 12-bit linearity, 12-bit resolution CMOS A/D converter with 25 ppm/C reference. 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4
10、-T24 24 Dual-in-line 3 CQCC1-N28 28 Leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87591 DLA LAND
11、 AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. (TA = +25C, unless otherwise noted). VDDto DGND . -0.3 V dc to +7 V dc VSSto DGND . +0.3 V dc to -17 V dc AGND to DGND . -0.3 V dc, VDD+0.3 V dc AINto AGND -15 V dc to +15 V dc Digita
12、l input voltage to DGND -0.3 V dc, VDD+0.3 V dc Digital output voltage to DGND . -0.3 V dc, VDD+0.3 V dc Storage temperature range . -65C to +150C Power dissipation +75C 1,000 mW 1/ Thermal resistance (JC) See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Operati
13、ng voltage range: Positive supply (VDD) +4.75 V dc to +5.25 V dc Negative supply (VSS) . -14.25 V dc to -15.75 V dc Clock frequency (fCLK) 1.0 MHz for device types 01, 02, and 03 2.5 MHz for device types 04, 05, and 06 Analog input voltage range (AIN) (specifications apply to slow memory mode) . 0 t
14、o +5.0 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues
15、of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard E
16、lectronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order De
17、sk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regula
18、tions unless a specific exemption has been obtained. _ 1/ Derate power dissipation above +75C by 10 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87591 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990
19、REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufa
20、cturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. T
21、his QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordan
22、ce with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accor
23、dance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Load circuits. The load circuits shall be as specified on figures 2 and 3. 3.2.4 Timing diagrams. The timing diagrams shall be as specified on figures 4, 5, 6, and 7. 3.3 Electrical
24、 performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specifi
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