DLA SMD-5962-84185 REV E-2011 MICROCIRCUIT LINEAR TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER MONOLITHIC SILICON.pdf

《DLA SMD-5962-84185 REV E-2011 MICROCIRCUIT LINEAR TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER MONOLITHIC SILICON.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-84185 REV E-2011 MICROCIRCUIT LINEAR TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER MONOLITHIC SILICON.pdf（9页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 27014. Add case outline I (metal can). Add terminal connections for case H. Delete testing for ROUT, VN, CIN, BW1, BW2, BW3, tPD-1, tPD-3, tR-1, tR-3. Editorial changes throughout. 86-05-12 M. A. FRYE B Add vendor CAGE 18324. Add

2、device 02, generic part number 592. Delete vendor CAGE 27014 for device 01IX. Change to military drawing format. Make changes to table I. Editorial changes throughout. Delete vendor CAGE 01295 for device 01IX. Inactivate device 01HX for new design. 89-05-09 M. A. FRYE C Add device 03 for generic par

3、t number TL027. Add outline letter 2. Make changes to tPDand tR2. Inactivate device types 02HX and 02IX for new design. 93-11-30 M. A. FRYE D Drawing updated to reflect current requirements. -rrp 03-01-10 R. MONNIN E Update drawing to current requirements of MIL-PRF-38535. -rrp 11-11-01 C. SAFFLE RE

4、V SHEET REV SHEET REV STATUS REV E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY RICK C. OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF T

5、HE DEPARTMENT OF DEFENSE CHECKED BY RAY MONNIN APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 85-10-04 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 84185 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E032-12 Provided b

6、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD

7、-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 84185 01 C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 De

8、vice type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 733 Two-stage, differential input, differential output video amplifier 02 592 Two-stage, differential input, differential output video amplifier 03 TL027 Two-stage, differential

9、input, differential output video amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line H GDFP1-F10 or CDFP2-F10 10 Flat pack I MACY1-X10 10 Can 2 CQ

10、CC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Positive supply voltage (+VCC) +8 V dc Negative supply voltage (-VCC) -8 V dc Differential input voltage 5 V dc Common mode input voltage 6 V dc Outp

11、ut current . 10 mA Power dissipation (PD) 500 mW 1/ Junction temperature (TJ) +150C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-ambient (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating tempera

12、ture range (TA) . -55C to +125C 1/ With TAabove +105C, derate linearly 11 mW/C for cases C and 2. With TAabove +57C, derate linearly 5.5 mW/C for case H. With TAabove +75C, derate linearly 6.5 mW/C for case I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from

13、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this

14、drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-ST

15、D-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at h

16、ttps:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes

17、precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and

18、 as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers

19、approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications s

20、hall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-

21、PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical per

22、formance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.

23、5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in

24、 compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS

25、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit

26、 Min Max Input voltage range VIN1, 2, 3 All 1.0 V Input offset current IIO1 01, 02 3 A 2, 3 5 1 03 5 2, 3 6 Input bias current IIB1 01, 03 30 A 02 20 2, 3 All 40 Input resistance RIN22/ 3/ 1 01, 02 20 k 2, 3 8 1 03 10 2, 3 8 Output offset voltage VOO1RL= 4/ 1, 2, 3 All 2.0 V VOO2RL= 2/ 1 01, 02 1.0

27、2, 3 1.2 1 03 0.75 2, 3 1.5 VOO3RL= 5/ 1 01 1.0 2, 3 1.2 Output common mode voltage VOCMRL= , TA= +25C 1 01, 02 3.4 V 03 4.25 Change in output common mode voltage VOCMRL= , TA= +25C, VAGC= 0 V to 2 V 1 03 300 mV Open circuit voltage at REF OUT VREFIREF= 1 mA to 100 A, TA= +25C 1 03 1.3 1.5 V Output

28、sink current ISINK1 01, 02 2.5 mA 2, 3 2.2 1 03 3 2, 3 2.8 Supply current ICC1 01, 02 24 mA 2, 3 27 1 03 27 2, 3 30 Supply voltage rejection ratio SVRR5.5 V VCC 6.5 V 4, 5, 6 All 50 dB Common mode rejection ratio CMRR-1 V VCM +1 V, f 100 kHz 4 All 60 dB 5, 6 50 See footnotes at end of table. Provide

29、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol

30、Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage swing VOUTRL= 2 k 4 01, 02 2.5 VP-P 5, 6 2.2 4 03 3 5, 6 2.8 Differential voltage gain AV1VOUT= 3.0 VP-P, 4/ RL= 2 k 4 01 300 500 V/V 5, 6 200 600 4 02 300 500 5, 6 200 600 4 03 20

31、0 400 5, 6 150 450 AV2VOUT= 3.0 VP-P, 2/ RL= 2 k 4 01 90 110 5, 6 80 120 4 02 90 110 5, 6 80 120 4 03 65 105 5, 6 55 115 AV3VOUT= 3.0 VP-P, 5/ RL= 2 k 4 01 9 11 5, 6 8 12 Propagation delay tPDVOUT= 1 VP-P, 2/ 3/ TA= +25C 9 All 10 ns Rise time tr2VOUT= 1 VP-P, 2/ 3/ TA= +25C 9 01, 02 10 ns 03 12 1/ V

32、S= 6.0 V. Unless otherwise specified, for device type 03, AGC = 0 V, and REF OUT pin is open. 2/ GAIN ADJ 2A and GAIN ADJ 2B connected together. Gain = 100. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ GAIN ADJ 1A and GAIN ADJ 1B connected together. Gain = 400.

33、 5/ All gain pins open. Gain = 10. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 Device types 01 and 02 03 01

34、and 02 01 and 02 01 and 02 03 Case outlines C H I 2 Terminal number Terminal symbol 1 INPUT+ INPUT+ INPUT- INPUT- NC NC 2 NC AGC GAIN ADJ 2A INPUT+ INPUT+ INPUT+ 3 GAIN ADJ 2A GAIN ADJ 1A GAIN ADJ 1A GAIN ADJ 2A NC AGC 4 GAIN ADJ 1A GAIN ADJ 2A -VCCGAIN ADJ 1A GAIN ADJ 2A GAIN ADJ 1A 5 -VCC-VCCOUTPU

35、T+ -VCCNC NC 6 NC NC OUTPUT- OUTPUT+ GAIN ADJ 1A GAIN ADJ 2A 7 OUTPUT+ OUTPUT+ +VCCOUTPUT- NC NC 8 OUTPUT- OUTPUT- GAIN ADJ 1B +VCC-VCC-VCC9 NC NC GAIN ADJ 2B GAIN ADJ 1B NC NC 10 +VCC+VCC-INPUT GAIN ADJ 2B OUTPUT+ OUTPUT+ 11 GAIN ADJ 1B GAIN ADJ 2B - - NC NC 12 GAIN ADJ 2B GAIN ADJ 1B - - OUTPUT- O

36、UTPUT- 13 NC REF OUT - - NC NC 14 INPUT- INPUT- - - +VCC+VCC15 - - - - NC NC 16 - - - - GAIN ADJ 1B GAIN ADJ 2B 17 - - - - NC NC 18 - - - - GAIN ADJ 2B GAIN ADJ 1B 19 - - - - NC REF OUT 20 - - - - INPUT- INPUT- NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reprod

37、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in or

38、der to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and

39、 the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be require

40、d for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshor

41、e at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to qual

42、ity conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acq

43、uiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in tabl

44、e II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The follo

45、wing additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in tabl

46、e II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test ci

47、rcuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 84185 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-