SANS 144-2008 Metallic and oxide coatings - Measurement of coating thickness - Microscopical method《金属及氧化涂层 涂层厚度测量 显微方法》.pdf

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1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626- SANS 144:2008Edition 2ISO 1463:2003Edition 3SOUTH AFRICAN NATIONAL STANDARD Metallic and oxide coatings Measurement of coating thickness

4、Microscopical method This national standard is the identical implementation of ISO 1463:2003 and is adopted with the permission of the International Organization for Standardization. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911

5、fax: +27 12 344 1568 www.sabs.co.za SABS SANS 144:2008 Edition 2 ISO 1463:2003 Edition 3 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS TC 107, Metallic and other inorganic coatings, in accordance with procedures of the SA

6、BS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This document was published in November 2008. This document supersedes SABS ISO 1463:1982 (Edition 1). Reference numberISO 1463:2003(E)ISO 2003INTERNATIONAL STANDARD ISO1463Third edition2003-03-01Metallic and oxide coatings

7、Measurement of coating thickness Microscopical method Revtements mtalliques et couches doxyde Mesurage de lpaisseur de revtement Mthode par coupe micrographique SANS 144:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 1463:2003(E) PDF

8、 disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this file, par

9、ties accept therein the responsibility of not infringing Adobes licensing policy. The ISO Central Secretariat accepts no liability in this area. Adobe is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF file can be found in the General Info relative

10、 to the file; the PDF-creation parameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. ISO 2003

11、All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the countr

12、y of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2003 All rights reservedSANS 144:2008This s tandard may only be used and printed by approved subscription an

13、d freemailing clients of the SABS .ISO 1463:2003(E) ISO 2003 All rights reserved iiiContents Page Foreword iv 1 Scope 1 2 Normative references . 1 3 Term and definition. 1 4 Principle . 1 5 Factors relating to measurement uncertainty 2 5.1 Surface roughness 2 5.2 Taper of cross-section 2 5.3 Deforma

14、tion of coating. 2 5.4 Rounding of edge of coating . 2 5.5 Overplating 2 5.6 Etching . 2 5.7 Smearing 2 5.8 Magnification . 2 5.9 Calibration of stage micrometer 3 5.10 Calibration of micrometer eyepiece 3 5.11 Alignment. 3 5.12 Uniformity of magnification . 3 5.13 Lens quality . 3 5.14 Orientation

15、of eyepiece 3 5.15 Tube length 3 6 Preparation of cross-sections . 4 7 Measurement . 4 8 Measurement uncertainty. 4 9 Test report 4 Annex A (informative) Guidance on the preparation and measurement of cross-sections . 5 Annex B (informative) Taper of cross-section and measurement of tooth-constructe

16、d coatings 7 Annex C (informative) Some typical etchants for use at room temperature 10 Bibliography . 11 SANS 144:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 1463:2003(E) iv ISO 2003 All rights reservedForeword ISO (the Internati

17、onal Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been

18、 established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standa

19、rdization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for

20、voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all

21、such patent rights. ISO 1463 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganic coatings, Subcommittee SC 2, Test methods. This third edition cancels and replaces the second edition (ISO 1463:1982), which has been technically revised. SANS 144:2008This s tandard may only be

22、 used and printed by approved subscription and freemailing clients of the SABS .INTERNATIONAL STANDARD ISO 1463:2003(E) ISO 2003 All rights reserved 1Metallic and oxide coatings Measurement of coating thickness Microscopical method 1 Scope This International Standard describes a method for the measu

23、rement of the local thickness of metallic coatings, oxide layers, and porcelain or vitreous enamel coatings, by the microscopical examination of cross-sections using an optical microscope. WARNING The use of this document may involve the use of hazardous materials, operations and equipment. This doc

24、ument does not address any health hazard and safety issues associated with its use. It is the responsibility of the user to establish appropriate health and safety practices and to take suitable action to comply with any national and/or local regulations prior to its use. 2 Normative references The

25、following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 2064, Metallic and other inorganic coatings Defin

26、itions and conventions concerning the measurement of thickness 3 Term and definition For the purposes of this document the following term and definition apply. 3.1 local thickness the mean of the thickness measurements, of which a specified number is made within a reference area 3.4 of ISO 2064:1996

27、 4 Principle A portion of the test specimen is cut out and mounted. The mounted cross-section is prepared by suitable techniques of grinding, polishing and etching. The thickness of the coating cross-section is measured by means of a calibrated scale. NOTE These techniques will be familiar to experi

28、enced metallographers, but some guidance is given in Clause 5 and in Annex A for less experienced operators. SANS 144:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 1463:2003(E) 2 ISO 2003 All rights reserved5 Factors relating to mea

29、surement uncertainty 5.1 Surface roughness If the coating or its substrate has a rough surface, one or both of the interfaces bounding the coating cross-section may be too irregular to permit accurate measurement. (See A.5.) 5.2 Taper of cross-section If the plane of the cross-section is not perpend

30、icular to the plane of the coating, the measured thickness will be greater than the true thickness; e.g., an inclination of 10 to the perpendicular will contribute a 1,5 % error. NOTE B.1 provides guidance on taper cross-section. 5.3 Deformation of coating Detrimental deformation of the coating can

31、be caused by excessive temperature or pressure during mounting and preparation of cross-sections of soft coatings or coatings that melt at a low temperature, and also by excessive abrasion of brittle materials during preparation of cross-sections. 5.4 Rounding of edge of coating If the edge of the c

32、oating cross-section is rounded, i.e. if the coating cross-section is not completely flat up to its edges, the true thickness cannot be observed microscopically. Edge rounding can be caused by improper mounting, grinding, polishing or etching. It is usually minimized by overplating the test specimen

33、 before mounting. (See A.2.) 5.5 Overplating Overplating of the test specimen protects the coating edges during preparation of cross-sections and thus prevents erroneous measurement. Removal of coating material during surface preparation for overplating can result in a low thickness measurement. 5.6

34、 Etching Optimum etching produces a clearly defined and narrow dark line at the interface of two metals. Excessive etching produces a poorly defined or wide line that can result in erroneous measurement. 5.7 Smearing Improper polishing or overplating with a softer metal may cause smearing of one met

35、al over the other metal, obscuring the boundary between the coating and the substrate. This problem may be alleviated by repeating the preparation of the cross section of the coated metal until repeatability of the thickness measurement (see A.3 and A.5) is obtained and also by over-plating with a h

36、arder metal. 5.8 Magnification For any given coating thickness, measurement uncertainty generally increase with decreasing magnification. The magnification should be chosen so that the field of view is between 1,5 and 3 the coating thickness. SANS 144:2008This s tandard may only be used and printed

37、by approved subscription and freemailing clients of the SABS .ISO 1463:2003(E) ISO 2003 All rights reserved 35.9 Calibration of stage micrometer Any error in calibration of the stage micrometer will be reflected in the measurement of the specimen. Errors of several percent are not unrealistic unless

38、 the scale has been calibrated or has been certified by a responsible supplier. A generally satisfactory means of calibration is to assume that the stated length of the full scale is correct, to measure each subdivision with a filar micrometer, and to calculate the length of each sub-division by sim

39、ple proportion. 5.10 Calibration of micrometer eyepiece A filar micrometer eyepiece generally provides the most satisfactory means of making the measurement of the specimen. The measurement will be no more accurate than the calibration of the eyepiece. As calibration is operator dependent, the eyepi

40、ece shall be calibrated by the person making the measurement. Repeated calibrations of the micrometer eyepiece can be reasonably expected to have a spread of less than 1 %. The distance between the two lines of a stage micrometer used for the calibration shall be known to within 0,2 m or 0,1 %, whic

41、hever is the greater. If a stage micrometer is not certified for accuracy, it shall be calibrated. NOTE The measurement uncertainty of some stage micrometers is certified by the manufacturer. Other stage micrometers have been found to have a measurement uncertainty of 1 m or 2 m for a measurement di

42、stance of 2 mm and by 0,4 m and more for measurement distances of 0,1 mm and 0,01 mm. Some image splitting micrometer eyepieces have a non-linearity that introduces an error of up to 1 % for short measurement distances. 5.11 Alignment Errors can be introduced by backlash in the movement of the micro

43、meter eyepiece. To eliminate this error, ensure that the final motion during alignment of the hairline is always made in the same direction. 5.12 Uniformity of magnification Because errors can occur if the magnification is not uniform over the entire field, ensure that both the calibration and the m

44、easurement are made over the same portion of the field with the measured boundaries centred about the optical axis. 5.13 Lens quality As lack of sharpness of the image contributes to the uncertainty of the measurement, ensure that good quality lenses are used. NOTE Sometimes, image sharpness can be

45、improved by using monochromatic light. 5.14 Orientation of eyepiece Ensure that the movement of the hairline of the eyepiece for alignment is perpendicular to the boundaries of the coating cross-section; e.g., 10 misalignment will contribute a 1,5 % error. 5.15 Tube length A change in tube length ca

46、uses a change in magnification and, if this change occurs between the time of calibration and the time of measurement, the measurement will be in error. Take care to avoid a change in tube length, which can occur when the eyepiece is repositioned within the tube, when the focus of the eyepiece tube

47、is changed and, for some microscopes, when the fine focus is adjusted. SANS 144:2008This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .ISO 1463:2003(E) 4 ISO 2003 All rights reserved6 Preparation of cross-sections Prepare, mount, grind, polish,

48、and etch the specimen so that: a) the cross-section is perpendicular to the coating; b) the surface is flat and the entire width of the coating image is simultaneously in focus at the magnification to be used for the measurement; c) all material deformed by cutting or cross-sectioning is removed; d)

49、 the boundaries of the coating cross-section are sharply defined by no more than contrasting appearance, or by a narrow, well defined, line. NOTE Further guidance is given in Clause 5 and in Annex A. Some typical etchants are described in Annex C. 7 Measurement 7.1 Give appropriate attention to the factors listed in Clause 5 and Annex A. 7.2 Calibrate the microscope and its measuring device with a certified or calibrated stage micrometer. 7.3 Measure the width of the image of the coating cross-section on at least fi