EN 61580-9-1996 en Methods of Measurement for Waveguides Part 9 Reflection Coefficient at Rectangular Waveguide Interfaces《波导测量方法 第9部分 矩形波导管接口的反射系数 IEC 1580-9 1996》.pdf
《EN 61580-9-1996 en Methods of Measurement for Waveguides Part 9 Reflection Coefficient at Rectangular Waveguide Interfaces《波导测量方法 第9部分 矩形波导管接口的反射系数 IEC 1580-9 1996》.pdf》由会员分享,可在线阅读,更多相关《EN 61580-9-1996 en Methods of Measurement for Waveguides Part 9 Reflection Coefficient at Rectangular Waveguide Interfaces《波导测量方法 第9部分 矩形波导管接口的反射系数 IEC 1580-9 1996》.pdf(16页珍藏版)》请在麦多课文档分享上搜索。
1、STD-BSI BS EN b1580-9-ENGL 1777 m 1b2qbb7 0587230 703 BRITISH STANDARD . . . . . . . -. . . - . . . . -. . -. . I Methods of measurement for waveguides Part 9. Reflection coefficient at retangular waveguide interfaces * * m The European Standard EN 61580-9 : 1996 has the status of a British Standard
2、 ICs 33.120.10 m BS EN 61580-9 : 1997 IEC 1580-9 : I1996 STD-BSI BS EN bL580-9-ENGL I997 3b2VbbS 0587233 8liT M AmdNo. Date BS EN 61580-9 : 1997 Text affected Committees responsible for this British Standard The preparation of this British Standard was entrusted by Technical Committee EPU46, Cables,
3、 wires and waveguides, RF connectors and accessories for communication and signalling, to Subcommittee EPU46/2, RF connectors and waveguides, on which the following bodies were represented: AEA Technology BEAMA Electrical Cable and Conductor Accessory Manufacturers British Non-Ferrous Metals Federat
4、ion British Telecommunications plc Federation of the Eleclmnics Industry Ministry of Defence National Supervisory inspectorate Society of Cable Television Engineers This British Standard, having been prepared under the direction of the Electrotechnid Sector Board, was published under the authority o
5、f the Standards Board and comes into effect on 15 February 1997 O BSI 1997 The following BSI references relate to the work on this standard Committee reference EPU42 Draft for comment 96203429 DC ISBN O 580 26941 8 I STD-BSI BS EN bL580-7-ENGL 1777 m Lb29bb7 058FZ12 78b m - BS EN 61580-9 : 1997 _ Co
6、ntents Committees responsible Page Inside fmnt cover National foreword ii Foreword 2 Text of EN 61580-9 3 O BSI 1997 i STD-BSI BS EN bL58KGNGL 1797 Lb24bbTO5872L3 bL2 = BS EN 61680-9 : 1997 National foreword This British Stanard has been prepared by Subcommittee EPL/46/2 and is the English language
7、version of EN 61580-9 : 1996 MeuLods of measurement for waveguides - Part 9: b) lateral displacement between the waveguide axes in either the H or E plane; c) angular misalignment between the waveguide axes. 2 Normative reference The following normative document contains provisions which, through re
8、ference in this text, constitute provisions of this part of IEC 1580. At the time of publication, the edition indicated was valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC 1580 are encouraged to investigate the possibility of applying the m
9、ost recent edition of the normative document indicated below. Members of IEC and IS0 maintain registers of currently valid International Standards. IEC 154: Flanges for waveguides 3 List of symbols Let: a = basic inside width of the waveguide; b = basic inside height of the waveguide; hc = cut-off w
10、avelength; Aal Ab = deviations from the basic internal waveguide dimensions; AaO, Abe = linear displacements between the waveguide axes. = waveguide wavelength; hg The above symbols are illustrated in figure 1. In addition, let: Pa = reflection coefficient due to changes in waveguide width; Pb = ref
11、lection coefficient due to changes in waveguide height; PH = reflection coefficient due to H-plane displacement; PE = reflection coefficient due to E-plane displacement. e STD-BSI BS EN b158-p7TENL 1777 m 1b2bbT0587218 LT4 m Page 5 EN 61580-9 : 1996 4 Effect of dimensional changes and axial dlspacem
12、ent 4.1 Combination of mismatches For small dimensional changes, pa and Pb are due to the resistive mismatches between the waveguides, the shunt susceptances being negligible. lhe reflection coefficients due to displacements, pH and pE, are due to shunt susceptances and consequently in phase quadrat
13、ure with (pa + Pb). The total mismatch due to the combination of dimensional changes and axial displacement is therefore: NOTES 1 lhe highest value of reflection coefficient for axially aligned waveguides is when a and b are at extreme tolerances and a waveguide with dimensions (a + Aa), (b - Ab) ma
14、tes with a waveguide with dimensions (a - Aa), (b + Ab)- 2 susceptance. p and PE have opposite signs, p being due to an inductlve susceptance and PE to a capacitive 4.2 Theoretical considerations In the IEC 154 series of standards, the following formula is given for the maximum reflection due to the
15、 combination of dimensional changes and lateral displacement for rectangular waveguides: 1 R = lolog, 4,9348 kg X 7,8957 x Av2 - a3 where R is the reflection loss. Equation (2) can be re-written in terms of reflection coefficients as follows: 1 R= 10 log,o - P2 i Ag2 x Aa 4,9348 hg X Aae2 7,8957 x A
16、b#2 - a3 v therefore p = J 4a3 +% + (3) .e. Equation (3a) is identical to equation (1). STD-BSI BS EN bL580-7-ENGL 1977 LbZqbb9 0587237 O30 Page 6 EN 61580-9 : 1996 The separate factors in equation (3a) can be expressed as follows: Ab b Pb =- 4,9348 hg x Aa.2 “s (*J (6) =x - a3 2a kc PH - 4.3 Determ
17、ination of reflection coefficients These may be determined either by use of equations (4) to (7) or by means of the graphs shown in figure 2 where the reflection coefficients are expressed as percentages. For Pb the ordinate of figure 2 may be used directly as pb is independent of frequency. For pa,
18、 pH and pE the ordinate takes into account the frequency of operation. NOTES 1 mid-band values for pa and pH. For mid-band operation of a waveguide kcA, approximates to unity and the ordinate gives the approximate Ao Io 2 For waveguides with a 2:1 aspect ratio -I - and the ordinate gives the approxi
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