ECA EIA-364-88A-2009 TP-88A Residual Magnetism Test Procedure for Electrical Connectors Contacts and Sockets.pdf

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1、 EIA STANDARD TP-88A Residual Magnetism Test Procedure for Electrical Connectors, Contacts and Sockets EIA-364-88A (Revision of EIA-364-88) November 2009 Electronic Components Industry Association ANSI/EIA-364-88A-2009 (R2016) Approved: November 13, 2009 Reaffirmed: April 13, 2016 EIA-364-88A NOTICE

2、 EIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the

3、 proper product for his particular need. Existence of such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications

4、 preclude their voluntary use by those other than ECIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not a

5、ssume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This EIA standard is considered to have International Standardization implications, but the International Electrotechnical Commission activity has not progressed to th

6、e point where a valid comparison between the EIA standard and the IEC document can be made. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate

7、safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5187 and reaffirmed by Standards Proposal No. 5361.04, formulated under the cognizance of the EIA CE-2.0 Committee on National Connector and Socket Standards). Publis

8、hed by ELECTRONIC COMPONENTS INDUSTRY ASSOCIATION 2016 Standards & Technology Department 2214 Rock Hill Road, Suite 265 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to repro

9、duce a limited number of copies through entering into a license agreement. For information, contact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956) iiCONTENTS Clause Page1 Introduction . 11.1 Scope . 12 Test resources . 12.1 E

10、quipment . 13 Test specimen 13.1 Description 13.2 Preparation 24 Test procedure . 24.1 Instrument setup 24.2 Exposure . 24.3 After exposure . 25 Details to be specified . 26 Test documentation . 3iii(This page left blank) EIA-364-88A Page 1 TEST PROCEDURE No. 88A RESIDUAL MAGNETISM TEST PROCEDURE FO

11、R ELECTRICAL CONNECTORS (From EIA Standards Proposal No. 5187, formulated under the cognizance EIA CE-2.0 Committee on National Connector Standards, and previously published in EIA-RS-364-88.) 1 Introduction 1.1 Scope This standard establishes a test method to determine the residual magnetism of a c

12、onnector after exposure to a specified magnetic field. NOTE Connectors with a relative magnetism of 2 MU as determined by EIA-364-54 can satisfy the nonmagnetism requirements in most applications. Residual magnetism should only be required if the magnetic field constraints as associated with space f

13、light applications warrant such stringent requirements. 2 Test resources 2.1 Equipment 2.1.1 A 0.5 Tesla magnet with an opening large enough for the passage of the specimen through the magnetic field. 2.1.2 A magnetometer and a probe having an accuracy of 5%. 3 Test specimen 3.1 Description The test

14、 specimen shall have all contacts installed and mated unless otherwise specified in the referencing document. The specimen shall be fitted with such accessories as may be required by the referencing document. EIA-364-88A Page 2 3.2 Preparation The probe shall be placed horizontally on a nonmagnetic

15、support with the probe positioned as far away from the measuring instrument as allowed by the connecting cord. The test area shall be relatively free from magnetic disturbances and magnetic fields other than the earths normal magnetic field. 4 Test procedure CAUTION Operating personnel shall remove

16、jewelry that can affect both the test and the jewelry (such as rings, watches, bracelets, etc.). 4.1 Instrument setup The measuring instrument shall be set to the appropriate scale and adjusted to read zero by orienting the probe as necessary. 4.2 Exposure The specimen shall then be exposed to a mag

17、netic field of 0.5 Tesla by passing the specimen between the magnetic poles three times. The specimen shall not touch the polar parts of the magnet during exposure. 4.3 After exposure Immediately after exposure, the specimen shall be placed at a distance not exceeding 3 millimeters from the probe, w

18、ithout touching the probe. The specimen shall be scanned in various orientations to obtain a maximum reading on the measuring instrument. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Accessories to be fitted to the specimen 5.2 Maximum value of

19、the residual magnetism in gammas 5.3 Magnetic exposure if different from 0.5 Tesla (5000 gauss) 5.4 Test specimen and magnetic field orientation 5.5 Number of specimens to be tested EIA-364-88A Page 3 6 Documentation Documentation shall contain the details specified in clause 5, with any exceptions,

20、 and the following: 6.1 Title of test 6.2 Specimen description including accessories 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.6 Name of operator and start/finish dates of test Revision History Revision letter Project number Addit

21、ions, changes and deletions A SP-5187 Revised paragraph 1.1, 3.1 6.3 and 6.6. Added paragraph 5.5. ECIA Document Improvement Proposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below

22、 and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suite 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revi

23、sion: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c.Reason/Rationale for Recomendation: Additional Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org