ECA EIA-364-28F-2011 TP-28F Vibration Test Procedure for Electrical Connectors and Sockets.pdf
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1、 EIA STANDARD TP-28F Vibration Test Procedure for Electrical Connectors and Sockets EIA-364-28F (Revision of EIA-364-28E) January 2011 Electronic Components Industry Association EIA-364-28F ANSI/EIA-364-28F-2011 (R2017) Approved: January 14, 2011 Reaffirmed: February 10, 2017 NOTICE EIA Engineering
2、Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product f
3、or his particular need. Existence of such Specifications and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Specifications and Publications, nor shall the existence of such Specifications and Publications p
4、reclude their voluntary use by those other than ECIA members, whether the Specification is to be used either domestically or internationally. Specifications and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA do
5、es not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Specification or Publication. This EIA Specification is considered to have International Standardization implications, but the International Electrotechnical Commission activity has no
6、t progressed to the point where a valid comparison between the EIA Specification and the IEC document can be made. This Specification does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Specif
7、ication to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 5382.04, formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards) Published by Electr
8、onic Components Industry Association 2017 EIA Standards 3.1.1 A connector plug and its mating connector receptacle. 3.1.2 A printed circuit connector receptacle and its mating connector board(s). 3.1.3 An integral, functional connector assembly. 3.2 Each test sample shall be prepared with wire and o
9、ther materials or processes, simulating application assembly of the sample. If normal connector mating is dependent upon forces external to the connector, then such forces and mounting arrangement shall be as closely duplicated as possible (example: printed circuit connectors). If mating is achieved
10、 with normal locking means, then only normal locking means shall be used. 3.3 Method of mounting 3.3.1 Test conditions I, II, III and IV (sinusoidal evaluation conditions) The specimen shall be attached to a fixture capable of transmitting the vibration conditions specified. The test fixture shall b
11、e designed so that resonant vibration inherent in the fixture within the frequency range specified for the test shall be minor. The magnitude of the applied vibration shall be monitored on the test fixture near the specimen mounting points. The test specimen shall be mounted rigidly to the test fixt
12、ure as specified and shall simulate as closely as possible the normal mounting of the specimen. A minimum of 200 mm (approx 8 in) of wire or cable shall be unsupported on both ends of the connector. For specimens with attached brackets, one of the vibration-test directions shall be parallel to the m
13、ounting surface of the bracket. Vibration input shall be monitored on the mounting fixture in the proximity of the support points of the specimen. 3.3.2 Test conditions V, VI and VII (random excitation conditions) The specimen shall be mounted as specified. The orientation of the specimen or directi
14、on of application of the applied vibration motion shall be specified in one or more directions. If the order of application of the different directions is critical, it also shall be specified. Any special test fixtures or jigs required to run the test shall be specified in sufficient detail to assur
15、e reproducibility of the input motion applied to the specimen. These details shall include the dimensions, the materials, temper, etc., as applicable. EIA-364-28F Page 4 4 Test procedure Tests and measurements before, during and after vibration shall be as specified in the referencing document. 4.1
16、Test conditions I, II, III and IV 4.1.1 Electrical load and discontinuity 4.1.1.1 Unless otherwise specified in the referencing document, an electrical load of 100 milliamperes maximum with a detector capable of detecting a discontinuity of 1.0 microsecond or longer. Said monitoring shall be perform
17、ed in accordance with EIA-.364-46. 4.1.1.2 Unless otherwise specified in the referencing document, low nanosecond event detection shall be performed in accordance with EIA-364-87. A 100 milliamperes test current shall be applied to the areas being monitored. A detector capable of measuring an event
18、resulting in a 10 ohm change lasting longer than 10 nanoseconds, unless otherwise specified in the referencing document. 4.1.1.2.1 Low nanosecond event detection shall not be used as a substitute for the standard 1.0 microsecond requirement. This monitoring test was developed to detect different fai
19、lure mechanisms than that described in 4.1.1.1. It is designed to detect large resistance fluctuations or voltage variations that may result in improper triggering of high speed digital circuits. 4.1.2 Vibration conditions Vibration conditions shall be in accordance with table 1, as applicable. Tabl
20、e 1 - Vibration conditions Test conditions Frequency range, Hz Peak level gn m/s2 I Low - 10 to 55 II High - 10 to 500 10 98.1 III High - 10 to 2,000 15 147.1 IV High - 10 to 2,000 20 196.1 4.1.3 Resonance A critical resonant frequency is that frequency at which any point on the specimen is observed
21、 to have a maximum amplitude more than twice that of the support points. When specified, resonant frequencies shall be determined either by monitoring parameters such as contact opening, or by use of resonance-detecting instrumentation. EIA-364-28F Page 5 4.1.4 Test condition I The specimens shall b
22、e subjected to a simple harmonic motion having an amplitude 1.52 mm (0.06 in) double amplitude (maximum total excursion), the frequency being varied uniformly between the approximate limits of 10 Hz and 55 Hz. The entire frequency range, from 10 Hz to 55 Hz and return to 10 Hz, shall be traversed in
23、 approximately 1 minute. Unless otherwise specified, this motion shall be applied for 2 hours in each of three mutually perpendicular directions (total of 6 hours). If applicable, this test shall be made under electrical load conditions. 4.1.5 Test condition II 98.1 m/s2 (10 gn) peak The specimens,
24、while deenergized or operating under the load conditions specified, shall be subjected to the vibration amplitude, frequency range, and duration specified 4.1.5.1, 4.1.5.2 and 4.1.5.3, respectively; see figures 2 and 3. 4.1.5.1 Amplitude The specimens shall be subjected to a simple harmonic motion h
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