DIN 51001-2003 Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)《氧化原材料和基础材料检验 X射线荧光法通用作业基础》.pdf
《DIN 51001-2003 Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)《氧化原材料和基础材料检验 X射线荧光法通用作业基础》.pdf》由会员分享,可在线阅读,更多相关《DIN 51001-2003 Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)《氧化原材料和基础材料检验 X射线荧光法通用作业基础》.pdf(4页珍藏版)》请在麦多课文档分享上搜索。
1、ICS 71.060.20Prfung oxidischer Roh- und Werkstoffe Allgemeine Arbeitsgrundlagen zurRntgenfluoreszenz-Analyse (RFA)In keeping with current practice in standards published by the International Organization for Standardization(ISO), a comma has been used throughout as the decimal marker.Ref. No. DIN 51
2、001 : 2003-08English price group 06 Sales No. 010606.04DEUTSCHE NORM August 2003 No part of this translation may be reproduced without the prior permission ofDIN Deutsches Institut fr Normung e.V., Berlin. Beuth Verlag GmbH, 10772 Berlin, Germany,has the exclusive right of sale for German Standards
3、(DIN-Normen).Translation by DIN-Sprachendienst.In case of doubt, the German-language original should be consulted as the authoritative text.General procedures for the X-ray fluorescenceanalysis (XRF) of oxidic raw materialsContinued on pages 2 to 4.This standard,together with DIN EN ISO 12677,supers
4、edes DIN 51001-1,July 1983 edition.51001ForewordThis standard has been prepared by Technical Committee Chemische Analyse von oxidischen Roh- undWerkstoffen of the Normenausschuss Materialprfung (Materials Testing Standards Committee), taking intoaccount the specifications of DIN EN ISO 12677.The sta
5、ndard assumes a knowledge of the basic technical principles of X-ray fluorescence analysis (XRF)contained in the relevant literature and the instructions of the spectrometer manufacturers.AmendmentsThis standard differs from the July 1983 edition as follows:a) the scope has been amended to cover onl
6、y those points which are not dealt with in DIN EN ISO 12677;b) details relating to compensation for moisture in fluxes have been included;c) the standard has been editorially revised.Previous editionDIN 51001-1: 1983-07.1 ScopeThe XRF method specified in this standard serves to determine the oxide c
7、ontent of samples of predomi-nantly oxidic raw materials, excluding those specified in DIN EN ISO 12677, prepared by an appropriatemethod (as in DIN 51061-2, DIN 51061-3, DIN 51078 or ENV 1402-2), in concentrations ranging from thelimit of detection up to a proportion by mass of the original substan
8、ce of 100%. The analysis yields the totalcontent of a particular elemental oxide, regardless of the type of bonding.All the elements having an atomic number of 9 (fluorine) or above can be determined, but the analytical errorsand the associated limits of detection for each element will depend on the
9、 efficiency of the equipment, thetype of sample, sample preparation and the method of evaluation, and are therefore dealt with elsewhere.Page 2DIN 51001 : 2003-082 Normative referencesThis standard incorporates, by dated or undated reference, provisions from other publications. These norma-tive refe
10、rences are cited at the appropriate places in the text, and the titles of the publications are listed below.For dated references, subsequent amendments to or revisions of any of these publications apply to thisstandard only when incorporated in it by amendment or revision. For undated references, th
11、e latest edition ofthe publication referred to applies.Supplement 1 to DIN 51001 General test procedures for the X-ray fluorescence analysis (XRF) of oxidic rawmaterials Summary of fusion methods for the preparation of samples based onsubstance groupsDIN 51061-2 Sampling of ceramic raw materials and
12、 refractory unmoulded productsDIN 51061-3 Sampling and incoming inspection of moulded refractory productsDIN 51078 Preparation of refractory samples for the chemical analysis and for determiningthe change in mass on dryingDIN EN ISO 12677 Chemical analysis of refractory products by XRF Fused cast be
13、ad method(ISO 12677 : 2003)ENV 1402-2 Unshaped refractory products Part 2: Sampling3 Sampling and sample preparationUnless otherwise agreed upon, sampling shall be carried out as specified in the appropriate standard(DIN 51061-2, DIN 51061-3 or ENV 1402-2) and the analytical sample shall be prepared
14、 as described inDIN 51078.4 Surface finishXRF requires samples whose flat surface is representative of the composition of the analytical sample. Depend-ing on the material and on the permissible total uncertainty, this requirement can be met by grinding originalsamples, or by fusing powdered or cast
15、 material. The sample to be analysed and the reference sample shall beprepared in the same way.4.1 Original samplesSolid samples, such as glass and glass ceramics, that are sufficiently homogeneous and do not give rise toeffects due to particle size and crystal structure may be analysed in their ori
16、ginal state. Otherwise, one of thetechniques described in subclauses 4.2 to 4.4 are to be adopted for sample preparation.4.2 PelletsHeterogeneous samples may be reduced in size and converted to pellet form. Whether this type of sample canbe used will depend on particle size distribution, particle co
17、mposition, crystal structure effects, wavelength ofanalytical line and permissible total uncertainty.4.3 Fused beadsConsidering all the advantages and disadvantages, the use of fused beads is recommended. The flux chosenshall produce a clear, homogeneous melt that does not crack on cooling, an advan
18、tage of this procedure beingthe possibility of preparing synthetic reference samples.A summary of standard fusion methods for preparing samples of some important substance groups for XRFconforming to this standard will be found in Supplement 1 to DIN 51001.4.4 Special samplesSpecial samples are samp
19、les in the form of solutions, precipitates and dust on filters.5 Sample treatment5.1 GeneralSurface quality requires particular attention when analysing for elements of atomic number less than 18.5.2 Pretreatment of original samplesThe sample shall be machined to fit the sample holder and its surfac
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