ASTM F1512-1994(2003) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies《溅射目标垫板部件的超声波C扫描粘结评定标准规程》.pdf
《ASTM F1512-1994(2003) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies《溅射目标垫板部件的超声波C扫描粘结评定标准规程》.pdf》由会员分享,可在线阅读,更多相关《ASTM F1512-1994(2003) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies《溅射目标垫板部件的超声波C扫描粘结评定标准规程》.pdf(4页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: F 1512 94 (Reapproved 2003)Standard Practice forUltrasonic C-Scan Bond Evaluation of SputteringTarget-Backing Plate Assemblies1This standard is issued under the fixed designation F 1512; the number immediately following the designation indicates the year oforiginal adoption or, in the c
2、ase of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon (e) indicates an editorial change since the last revision or reapproval.1. Scope1.1 This practice describes a method for ultrasonic mappingof the soundness of a bond joinin
3、g a sputtering target to itssupporting backing plate. The results of the examination maybe used in predicting the target-backing plate assemblyssuitability for use. Accept/reject standards are not specified;these are subject to agreement between target supplier and user,depending upon the applicatio
4、n requirements.1.2 This standard is intended to be used with PracticeE 1001.1.3 The method reveals unbonded areas 0.125 in. (3 mm) indiameter and larger. The technique permits, for example,unambiguous quantitative measurement of the voided area insolder bonds.1.3.1 This technique may also show regio
5、ns in which bondintegrity is marginally degraded by imperfect adhesion, forexample, areas in which oxide inclusion has inhibited thedevelopment of full bond strength. Evaluation of indications ofdegraded bond areas may vary in rigor from purely subjectiveto semiquantitative. Target supplier and user
6、 must agree uponthe means used to display and grade partially bonded areas.1.4 This practice is applicable to assemblies having planarbonds in which the design provides at least one flat planeparallel to the bond that may be used as the entry/exit surfacefor ultrasonic excitation.1.5 Only the immers
7、ion pulse-echo method is covered.1.6 Evaluation by this method is intended to be nondestruc-tive. For target assemblies that would be degraded by immer-sion in demineralized water, for example, for porous targetmaterials, the test should be considered a destructive one.1.7 This practice is applicabl
8、e to bonding methods that usea filler material to join the target and backing plate. Theseinclude solder, epoxy, and braze bonds.1.8 The values stated in inch-pound units are to be regardedas the standard. The values given in parentheses are forinformation only.1.9 This standard does not purport to
9、address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced Documents2.1 ASTM Standards:2E 127 Prac
10、tice for Fabricating and Checking AluminumAlloy Ultrasonic Standard Reference BlocksE 428 Practice for Fabrication and Control of Steel Refer-ence Blocks Used in Ultrasonic InspectionE 1001 Practice for Detection and Evaluation of Disconti-nuities by the Immersed Pulse-Echo Ultrasonic MethodUsing Lo
11、ngitudinal WavesE 1316 Terminology for Nondestructive Examinations2.2 American Society for Nondestructive Testing Standard:ASNT Recommended Practice SNT-TC-1A for PersonnelQualification and Certification in Nondestructive Testing33. Terminology3.1 Definitions:3.1.1 For definitions of terms used in t
12、his practice seePractice E 1001 and Terminology E 1316.4. Summary of Practice4.1 This practice describes a preferred means of applyingPractice E 1001 to obtain a two dimensional map of the flawsin a sputtering target-backing plate bond. The target-backingplate assembly is immersed in demineralized w
13、ater, used as acouplant, and the target-backing plate joint is scanned ultra-sonically.1This practice is under the jurisdiction of ASTM Committee F01 on Electronicsand is the direct responsibility of Subcommittee F01.17 on Sputter Metallization.Current edition approved April 15, 1994. Published June
14、 1994.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.3Available from the American Society for Nondestructive
15、 Testing, 1711 Arlin-gate Plaza, P.O. Box 28518, Columbus, OH 43228-0518.1Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.5. Significance and Use5.1 This practice supplements Practice E 1001 by indicatingspecific equipment choices and
16、 test arrangements appropriatefor evaluating sputtering target bonds.5.2 The bond between sputtering target and its supportingbacking plate is a critical reliability element in a sputterdeposition system. A bond must have high thermal conductiv-ity to provide adequate target cooling during sputterin
17、g. Thetarget-backing plate joint must also have strength enough towithstand the shear stresses caused by differential thermalexpansion between target and backing plate.5.3 Flaws in a bond, for example, voids in the joiningmaterial, degrade bond performance. An inadequate bond mayfail in service, pot
18、entially causing catastrophic separation ofthe target from the backing plate. Assurance of sound bonds isan important concern among users of sputtering equipment.5.4 Ultrasonic testing is accepted as an efficient method forevaluating target bonds, but differences in technique inhibitintercomparison
19、of results from one laboratory to another. Thispractice is intended to promote uniformity in use so thatspecifications for bond integrity may be universally applied.5.5 The C-span display of ultrasonic test data is a directmethod for visually demonstrating bond character. PracticeE 1001 upon which t
20、his practice is modeled, however, does notaddress C-scan display. Instructions specific to the C-scandisplay mode are indicated in this practice. In other respectsthis practice is a section by section commentary on PracticeE 1001.6. Apparatus6.1 Electronic EquipmentProvide electronic equipment ingen
21、eral conformance with the requirements of Practice E 1001,6.1. It is recommended that 5 or 10 Mhz frequency be used fortesting sputtering target bonds. The equipment and its cathode-ray tube (CRT) display, operating in the A-scan mode, shouldbe capable of producing echo amplitudes of at least 60 % o
22、ffull scale, with the noise level no greater than 20 % of fullscale, using an 0.125-in. (3-mm) diameter flat-bottom test holein a reference block (6.7) simulating the assembly under test.Note that for C-scan mapping of target bonds the A-scan modeis used for assisting in the setup only. A-scan data
23、are notcollected or reported.6.1.1 C-scan Plotter/Data Acquisition SystemThe C-scanpresentation is a mapping of the reflected ultrasound pulseintensity (peak voltage) from the target/backing plate interfaceas a function of position. Modulations of the reflected inten-sity“ indications” are indicativ
24、e of variations in the metallur-gical bond between target and backing plate. The electronicsystem may be equipped with a plotter to make C-scan mapson-line as the search unit traces a raster pattern over the testarticles surface.6.1.1.1 Suitable plotters may use an electric discharge penand conducti
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