ANSI IEEE C62.39-2012 Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection.pdf

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1、 IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection Sponsored by the Surge Protective Devices Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 14 January 2013 IEEE Power and Energy Society IEEE Std C62.

2、39-2012IEEE Std C62.39-2012 IEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection Sponsor Surge Protective Devices Committee of the IEEE Power and Energy Society Approved 17 December 2012 IEEE-SA Standards Board A

3、pproved 3 October 2014American National Standards InstituteAbstract: The basic requirements to be met by series connected, solid-state, self-restoring overcurrent protectors (OCPs) for the protection of telecommunication equipment and lines are presented. This standard should be used for the harmoni

4、zation of existing or future specifications issued by solid-state, self-restoring OCP manufacturers, telecommunication equipment manufacturers, administrations, or network operators. Keywords: component, electronic current limiter, IEEE C62.39, overcurrent protection, positive temperature coefficien

5、t thermistors, self-restoring, surge protection, surge protective device The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 14 January 201

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18、tion with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own respons

19、ibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE standard was completed, the Low Voltage Solid State Protective Components Working Group had the following membership: Michael J. Maytum, Chair Albert Martin, Vice Chair Robert Ashton

20、Leonard Drewes Bob Fried Ernie Gallo Wolfgang Oertel Bill Travis The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. Robert Ashton Chris Brooks Chuanyou Dai Carlo Donati Douglas Dorr Randall C. Groves

21、Raymond Hill Gary Hoffman Ronald Hotchkiss Yuri Khersonsky Jim Kulchisky Paul Lindemulder Greg Luri Ahmad Mahinfallah Albert Martin Michael J. Maytum William McBride Joseph Mears Michael S. Newman Wolfgang Oertel Lorraine Padden Donald Parker Percy Pool Michael Roberts Thomas Rozek Bartien Sayogo Gi

22、l Shultz Jerry Smith Gary Stoedter Donald Turner John Vergis Matthew Wakeham James Wilson Copyright 2013 IEEE. All rights reserved. viWhen the IEEE-SA Standards Board approved this standard on 17 December 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert

23、M. Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted O

24、lsen Gary Robinson Jon Walter Rosdahl Mike Seavy Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Docu

25、ment Development Malia Zaman IEEE Standards Program Manager, Technical Program Development Soo H. Kim Client Service Manager, Professional Services Copyright 2013 IEEE. All rights reserved. viiIntroduction This introduction is not part of IEEE Std C62.39-2012, IEEE Standard for Test Methods and Pref

26、erred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection. Unlike fuses and heat coils, self-restoring overcurrent protectors (OCPs) automatically reset after the end of the overcurrent condition without the need for manual intervention. All the OCPs cover

27、ed in this standard are solid-state. Having no moving parts these OCPs are more reliable than thermal circuit breakers and mechanical disk switches. The current reducing action is for the normally low (untripped) OCP resistance to transition to a very high tripped resistance value, which greatly red

28、uces the circuit current flow. The positive temperature coefficient (PTC) thermistor OCPs transition is caused by the component body reaching a critical temperature. The body temperature rise is caused by the i2R heating of the overcurrent flowing through the component. Being thermally operated PTC

29、thermistor OCPs do not operate for short duration lightning currents, but for ac overcurrents caused by power faults. Electronic current limiter (ECL) OCPs operate on a preset current threshold level and will reduce both ac and lightning overcurrents to that threshold current level. Under lightning

30、surge conditions both OCP types assist in the protection coordination function. These OCPs will have untripped resistance values ranging from a few ohms to some 50 . This series resistance provides a coordination element between cascaded overvoltage protectors. In the tripped state (operated) the OC

31、P resistance increases to hundreds of kilohms (k), greatly reducing the prospective overcurrent to the equipment and the i2t developed in the feed wiring. OCP tripping forces a coordination condition; the ECL does so for both lightning and ac overcurrents and the PTC thermistor for ac overcurrent co

32、nditions. Many of the tests and test values can be applied to the three types self-restoring OCP technology: ceramic PTC (CPTC) thermistors, polymer PTC (PPTC) thermistors, and ECL components. Some tests are specific to OCPs used in a surge protective device (SPD) or to OCPs used in equipment. Diffe

33、rences between the OCP technologies mean that some tests will be specific to a given technology. Copyright 2013 IEEE. All rights reserved. viiiContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Definitions and acronyms. 2 2.1 Definitions . 2 2.2 Acronyms 4 3. Graphical symbols 4 4. Storage condit

34、ions 5 5. Overcurrent protector electrical parameters . 5 5.1 Test methods 5 5.2 Electrical requirements 6 6. Characteristic parameters . 6 6.1 Resistance, R 6 6.2 Hold current, Ih7 6.3 Trip current, It9 7. Technology-specific characteristics 10 7.1 Time-to-trip, ttrip(PTC thermistor). 10 7.2 Resist

35、ance 1 h after tripping, R1for PPTC thermistors 12 7.3 Reset voltage, Vresetfor ECL 13 7.4 Impulse resistance, Rimp, for ceramic PTC thermistors 14 8. Rated values . 16 8.1 Impulse voltage withstand . 16 8.2 AC power faultpower induction tests 17 8.3 AC power faultpower contact tests 18 8.4 Impulse

36、endurance test (life test). 19 8.5 AC endurance test (life test) 20 9. Informative characteristics . 21 9.1 Hold current variation with temperature 21 9.2 Trip-time variation with fault current value for PTC thermistor OCPs . 21 9.3 Resistance recovery after a trip event for PPTC thermistor OCPs 22

37、Annex A (informative) Bibliography . 23 Annex B (informative) Acknowledgement 24 Annex C (informative) Power fault 25 Copyright 2013 IEEE. All rights reserved. ixIEEE Standard for Test Methods and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protecti

38、on IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate saf

39、ety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and

40、may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard sets terms, test methods, test circuits,

41、measurement procedures and preferred result values for series connected, self-restoring current-limiter components used in low-voltage telecommunication circuit surge protection. It is only applicable for components in telecommunications circuits with sinusoidal ringing voltages up to 150 V rms at 1

42、5 Hz to 70 Hz and dc powering voltages up to 400 V. The self-restoring current limiters covered by this standard have the following properties: Excessive current causes a transition from a low-resistance state to a high-resistance state Reverts to a low-resistance state when the excessive current en

43、ds Directly operated by the current flow through the component Solid-state (no moving parts) Withstands specified levels of impulse Withstands specified ac voltage levels when in the high-resistance state Copyright 2013 IEEE. All rights reserved. 1IEEE Std C62.39-2012 IEEE Standard for Test Methods

44、and Preferred Values for Self-Restoring Current-Limiter Components Used in Telecommunication Surge Protection Examples of this type of current-limiter technology are positive temperature coefficient (PTC) step-function thermistors of ceramic or polymeric material and silicon semiconductor based elec

45、tronic circuits. This standard does not cover self-restoring current-limiter components used in other applications, such as heaters, inrush-current limiters, or sensing devices. Current interrupting type components, which reduce the current to zero by a mechanical circuit break, are not covered by t

46、his standard. In this standard, a telecommunications circuit is a circuit that uses metallic conductors to handle the remote transmission of information, such as data, communications, and signalling. 1.2 Purpose The test criteria and terms of this standard provide a means of component comparison and

47、 a common engineering language for users and manufacturers of self-restoring current-limiter components intended for use in low-voltage telecommunication circuit surge protection. The test and measurement of low-voltage telecommunication (data, communications, and signalling) surge protectors is giv

48、en in IEEE Std C62.36 B6.1This standard provides the corresponding component tests for the surge protector non-surge and active tests. 2. Definitions and acronyms 2.1 Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary Online should

49、 be consulted for terms not defined in this clause. 2electronic current limiter (ECL): Assembly of one or more electronic components that automatically restricts the current amplitude when it exceeds a predetermined threshold level. NOTESee Recommendation ITU-T K.82 B10.3endurance test (life test) ac: Application of a specified number of trip events under specified temperature and trip cycle (on and off time) conditions. NOTESee Recommendation ITU-T K.82 B10. endurance test (life test) impulse: Application of a specified number of impulses