ANSI EIA 364-09C-1999 Durability Test Procedure for Electrical Connectors《电连接器的耐久性试验程序》.pdf
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1、EIA STANDARD ANSIIEIA-364-09C-1999 (R2006) Approved: April 23,1999 Reaffirmed: March 27,2006 TP-09C Durability Test Procedure for Electrical Connectors and Contacts EIA-3 64-09C (Revision of EIA-364-09B) JUNE 1999 ELECTRONIC INDUSTRIES ALLIANCE Electronic Components, Assemblies, Equipment securing o
2、f test fixture shaii not affect seif-agnment. Mer mounting, fbliy mate and unmate for the number of cycles specied in the referencing document. 4.2 Cycle rate Unless otherwise specied in the referencing document, the cycle rate per hour sha be: - Automatic equipment: 500 f 50 -Manual rnating/unmatin
3、g: 300 maximum - Automatic, Circular Connectors: 250 to 300 Copyright Electronic Components, Assemblies 8ect subsequent results. 4.5 Measurements 4.5.1 Mating and unmathg forces, contact resistance, shell resistance, insulation resistance, dielectric withstanding voltage, contact retention, and seal
4、ing tests are examples of measurements that may be made prior to, during or after testing and that would show the effects of durability. 4.5.2 The connectors or contacts shall be examined to determine the effects of durabiiity cycling that would include the following: 4.5.2.1 Wear on coupling device
5、. 4.5.2.2 Loose or worn rivets; where applicable. 4.5.2.3 Uneven wear, galling, removal of plating on contacts and shells. 4.5.2.4 Free metal chips on face of inserts. 4.5.2.5 Displaced, bent or broken contacts. 4.5.2.6 Inability to properly mate and unmate. 4.5.2.7 Pierced resilient inserts and bro
6、ken or chipped hard dielectrics. 4.5.2.8 Mechanical operational characteristics, including effectiveness of keys and polarizing systems. Copyright Electronic Components, Assemblies visual examination 6.6 Operator name and date of test Copyright Electronic Components, Assemblies & Materials Associati
7、on Provided by IHS under license with ECA Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EIA-364-09C Page 5 si& 2 -3 4 - 3.56t 03 (0.140+ 0.010) 31.75 (1.250) minimum - 3 c f 0.003 (O.Ooo1) 1.778 (0.0700 2.616 (0.1030) 3.429 (0.1350) 1s- Entire surface O. 1 micm S
8、tyle 06 10 (4 microindi) both sidcc u 9.55 (0.375) from cnd (m note 3) 953 (0375) 1.70 (O.OU) mdilBtyppcal 02.5 t 0.13 .OiOt 0.005) 034 (0.0135) typMI - C(seetc4) -c) A i 0.25 (0.010) 27.18 (1.070) 41.88 (1.649) 12 15 18 22 28 30 36 43 51.08 (2.011) 62.87 (2.475) 74.73 (2.942) 90.55 (3.565) 114.35 (
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