IEEE 82-1994 - IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors.pdf

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1、 The Institute of Electrical and Electronics Engineers, Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1994 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1994. Printed in the United States of America.ISBN 1-55937-477-2No part of this pu

2、blication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 82-1994(Revision of IEEE Std 82-1963)IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated ConductorsSponsorInsulated Conductors Commi

3、tteeof theIEEE Power Engineering SocietyApproved June 14, 1994IEEE Standards BoardAbstract:A test procedure for impulse testing of insulated conductors (cables) and cables with ac-cessories installed (cable systems) is provided. This procedure can be used as a design or qualifi-cation test for cable

4、s or for cable systems. This test procedure is not intended to replace anyexisting or future standards covering cable or cable accessories, impulse generators, impulse test-ing or voltage measurements. It is intended to supplement such standards by indicating specificprocedures for a specific type o

5、f cable system or cable system component.Keywords:cable, cable systems, impulse voltage, insulated conductorsIEEE Standardsdocuments are developed within the Technical Committees of theIEEE Societies and the Standards Coordinating Committees of the IEEE StandardsBoard. Members of the committees serv

6、e voluntarily and without compensation.They are not necessarily members of the Institute. The standards developed withinIEEE represent a consensus of the broad expertise on the subject within the Instituteas well as those activities outside of IEEE that have expressed an interest in partici-pating i

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9、ocument ismore than five years old and has not been reaffirmed, it is reasonable to conclude thatits contents, although still of some value, do not wholly reflect the present state of theart. Users are cautioned to check to determine that they have the latest edition of anyIEEE Standard.Comments for

10、 revision of IEEE Standards are welcome from any interested party,regardless of membership affiliation with IEEE. Suggestions for changes in docu-ments should be in the form of a proposed change of text, together with appropriatesupporting comments.Interpretations: Occasionally questions may arise r

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13、ceived formal consideration. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIEEE standards documents may involve the use of patented technology. Theirapproval by the Institute of Elect

14、rical and Electronics Engineers does not mean thatusing such technology for the purpose of conforming to such standards is authorizedby the patent owner. It is the obligation of the user of such technology to obtain allnecessary permissions.iiiIntroduction(This introduction is not a part of IEEE Std

15、 82-1994, IEEE Standard Test Procedure for Impulse Voltage Tests onInsulated Conductors.)This revision of IEEE Std 82-1963, Test Procedure for Impulse Voltage Tests on Insulated Conductors, nowcontains a test procedure for extruded dielectric cables rated 2500 V and above. The impulse voltage testpr

16、ocedures for both laminated and extruded cables and cable systems were also updated to correspond withother standards and specifications.This standard was prepared by Task Force 12-5 of the Tests and Measurements Subcommittee 12 of theInsulated Conductors Committee of the IEEE Power Engineering Soci

17、ety.At the time this standard was approved, the members of the Task Force were as follows:Stan Harper,ChairTerry Reed,Vice ChairTorben Aabo Stan Grzybowski Jim MoranLawrence Bobb Rick Hartlein Jim ONeilJohn Bramfitt Darrell Jeter John PlayfordOlin Compton John Jurcisin James TarpeyJohn Cooper George

18、 Lusk Frank TetiDavid MintzOther individuals contributing review and comment were as follows:David Allen I. O. Gilbertson William McNultyDick Arndt Hans Gnerlich Daniel J. NicholsTed Balaska Harold Hervig Paul PughAnthony Barlow Lauri Hiivala Ed SankeyV. J. Boliver Fred Kimsey John ShimshockS. J. Cr

19、oall D. E. Koonce John SmithS. J. Dale Stephen Kozak Robert SnowClans Doench Frank Krajick Norman SpencerJohn Du Pont Frank La Fetra William TorokGeorge Eager Jack Lasky Steve TurnerEric Forster Jack Lawson Fred Von HerrmannRonald Frank Gabor Ludasi Jim WalkerJ. B. Gardner J. P. Mackevich Mark Walto

20、nBob Gear M. A. Martin Jay WilliamsE. J. McGowanivTorben AaboT. J. Al-HussainiP. AlexR. W. Allen, Jr.W. O. Andersen, Jr.R. H. ArndtT. P. ArnoldT. A. BalaskaAnthony BarlowC. W. BladesVincent J. BoliverR. R. BorowskiKen E. BowJohn E. BramfittM. D. BuckweitzR. R. BurghardtMilton D. CalcamuggioJohn L. C

21、arlsonPaul L. CinquemaniWayne E. ColeStan J. CroallE. J. DAquannoS. J. DaleJ. M. DalyJames C. DedmanJoseph A. DiCostanzoC. DoenchJ. P. DuPontG. S. Eager, Jr.R. M. EichhornHussein El BadalyJ. S. EngelhardtS. L. FitzhughA. FitzpatrickGarth FondawE. O. ForsterR. W. FosterRonald F. FrankR. D. FulcomerJ.

22、 B. GardnerJ. J. GarlandP. Gazzana-PriaroggiaR. B. GearPaul GiaccagliaS. M. GilbertO. I. GilbertsonA. GodoshianStan V. HarperR. HartleinH. C. Hervig, Jr.S. V. HeyerR. W. HigginbottomLauri J. HiivalaR. E. HoyW. F. Jensen, Jr.Darrel R. JeterC. V. JohnsonJ. JurcisinF. E. KimseyJoel KitchensH. T. KnoxFr

23、ederick B. KochDonald E. KoonceM. Kopchik, Jr.S. KozakF. E. LaFetraF. E. LaGaseCarl LandingerJ. S. LaskyJack H. LawsonRaoul H. LeuteritzT. H. LingJohn V. LipeR. D. LoweG. LudasiR. LutherG. J. LuzziJ. P. MackevichM. A. Martin, Jr.I. J. MarwickS. G. MastorasF. M. McAvoyL. B. McClungA. R. McCullochE. J

24、. McGowanA. L. McKeanW. J. McNultyJ. D. MedekJohn E. Merando, Jr.I. G. MerodioDavid J. MintzJ. A. Moran, Jr.D. J. NicholsJ. J. PachotCutter D. PalmerKeith A. PettyW. J. PickettJan S. PirrongGary A. PolhillJ. B. Prime, Jr.Paul F. PughJohn O. PundersonPeter RalstonGreg P. RampleyRobert A. ResualiR. B.

25、 RobertsonRalph W. SammS. J. SandbergDavid SandwickE. L. SankeyWayne E. SchuesslerJohn F. ShimshockBynum E. SmithJoseph H. SnowN. R. SpencerNagu SrinivasT. F. StaboszD. R. SteinJoseph L. SteinerGeorge A. StranieroMike D. SweatKeith W. SwitzerJohn TanakaJames W. TarpeyFrank A. TetiH. D. ThomasW. A. T

26、hueAustin C. TingleyDon TomaszewskiWilliam TorokDuc B. TrinhS. E. TurnerJack R. TuzinskiDonald A. VoltzC. F. Von Hermann, Jr.Steven P. WalldorfE. M. WaltonVerlin J. WarnockRoland H. W. WatkinsA. C. WestromCharles A. WhiteW. D. WilkinsRobert O. WilkinsonJ. A. WilliamsWilliam G. WimmerClarence Woodell

27、J. T. ZimnochThe following persons were on the balloting committee:vWhen the IEEE Standards Board approved this standard on June 14, 1994, it had the following membership:Wallace S. Read,ChairDonald C. Loughry,Vice ChairAndrew G. Salem,SecretaryGilles A. Baril Donald N. Heirman Joseph L. Koepfinger*

28、Bruce B. Barrow Richard J. Holleman D. N. “Jim” LogothetisJos A. Berrios de la Paz Jim Isaak L. Bruce McClungClyde R. Camp Ben C. Johnson Marco W. MigliaroJames Costantino Sonny Kasturi Mary Lou PadgettStephen L. Diamond Lorraine C. Kevra Arthur K. ReillyDonald C. Fleckenstein E. G. “Al” Kiener Rona

29、ld H. ReimerJay Forster* Ivor N. Knight Gary S. RobinsonRamiro Garcia Leonard L. Tripp*Member EmeritusAlso included are the following nonvoting IEEE Standards Board liaisons:Satish K. AggarwalJames BeallRichard B. EngelmanDavid E. SoffrinStephen J. HuffmanIEEE Standards Project EditorviiContentsCLAU

30、SE PAGE1. Overview. 12. Scope. 13. Purpose. 14. References. 15. Testing equipment. 25.1 Impulse generator. 25.2 Wave shape . 26. Specimen. 26.1 Length . 26.2 Electrode arrangement . 36.3 Sample terminations. 37. Test procedures . 37.1 Test temperature. 37.2 Sample conditioning . 47.3 BIL impulse vol

31、tage tests. 47.4 Impulse tests above BIL. 57.5 Switching impulse test . 87.6 Test reports. 98. Bibliography . 9IEEE Standard Test Procedure for Impulse Voltage Tests on Insulated Conductors1. OverviewInsulated conductors in service are subjected to voltage surges from lightning, switching, and other

32、 sources.These surges vary widely in wave shape, magnitude, and frequency of occurrence. Laboratory tests cannotduplicate the wide variety of surges met in service. Standard test procedures, however, make it possible tocompare the impulse strength of different insulations measured by different labor

33、atories, at different times.2. ScopeThis test procedure applies to both switching impulse and lightning impulse tests on cables or cable systemsincorporating laminated or extruded insulations. The term laminated cable, as used in this procedure,includes: high-pressure pipe cable, low-pressure gas-fi

34、lled cable, self-contained liquid-filled cable, solid-paper cable, and other taped cable designs. A cable system is a cable with one or more accessories attached.This test procedure is not intended to replace any existing or future standards covering cable or cable acces-sories, impulse generators,

35、impulse testing, or voltage measurements. It is intended to supplement such stan-dards by indicating specific procedures for a specific type of cable system or cable system component.This test procedure does not apply to cables or cable systems that utilize gas or gas spacers as the soleinsulating m

36、edium. This test procedure applies to individual cable accessories only when referenced by thespecific accessory standard.3. PurposeThis test procedure is intended as a guide for impulse testing of insulated conductors (cables) and cableswith accessories installed (cable systems). It can be used as

37、a design or qualification test for cables or cablesystems.14. ReferencesIEEE Std 4-1978, IEEE Standard Techniques for High Voltage Testing (ANSI).11IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA.

38、IEEEStd 82-1994 IEEE STANDARD TEST PROCEDURE FOR 5. Testing equipment5.1 Impulse generatorThe impulse generator should have sufficient capacity to deliver the required wave shape to the test samplewithin the tolerances set.5.2 Wave shapeA nominal 1.2/50 s wave shall be used for lightning impulses. W

39、hen possible, a nominal 250/2500 s waveshall be used for switching impulses. These waves are defined fully in IEEE Std 4-1978.25.2.1 Wave shape measurementA calibrated voltage divider and transient recorder or oscilloscope shall be used to observe and record theimpulse wave shape. The wave shape and

40、 magnitude shall be determined according to IEEE Std 4-1978. Thewave shape shall be determined first at reduced voltage with the test sample connected.5.2.2 Lightning wave shape toleranceA wave within the following tolerances shall be used for lightning impulses.a) Wave front time: 1.2 0.36 sb) Wave

41、 time to half-value: 50 10 sc) Wave crest value: 3% of nominalWhen test circuit constraints make it impractical to meet the lightning impulse wave specifications above, awave front time of up to 5 s may be used with mutual agreement of the parties involved.5.2.3 Switching wave shape toleranceA wave within the following tolerances shall be used for switching impulses.a) Wave time to crest: 250 50 sb) Wave time to half-value: 2500 1500 sc) Wave crest value: 3% of nominalWhen test circuit constraints make it impractical to meet the switching impulse s