IEEE 1671 1-2009 en Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Exchanging Test Desc.pdf

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1、 IEEE Standard for Automatic TestMarkup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions Sponsored by the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems IEEE 3 Park Avenue New York, NY 10016-5997

2、 USA 1 February 2013 IEEE Standards Coordinating Committee 20IEEE Std 1671.1-2009IEEE Std 1671.1TM-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions Sponsor IEEE Standards Coordinating Commi

3、ttee 20 on Test and Diagnosis for Electronic Systems Approved 11 September 2009 IEEE-SA Standards Board Aproved as a Full-Use Standard 5 December 2012 IEEE-SA Standards Board Abstract: This document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test des

4、cription information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the development of test program sets (TPSs) that will be used in an automatic test envir

5、onment. Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), Automatic Test Markup Language (ATML) instance document, automatic test system (ATS), diagnostic requirements, IEEE 1671.1, test description, Test Program Set (TPS), test requirements, Test Requirements Document

6、 (TRD), XML schema The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1 February 2013. Printed in the United States of America. IEEE is a

7、registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2013 IEEE. All rights reserved. Introduction This introduction is not part of I

8、EEE Std 1671.1-2009, IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions. The benefits of using standards in test-related applications have long been recognized. The scope for standardization exten

9、ds from low-level standards associated with test instrument control to high-level standards associated with specifying tests in an implementation-independent manner. In the 1960s, Aeronautical Radio, Incorporated started the development of the Abbreviated Test Language for Avionics Systems. In 1976,

10、 management of the ATLAS standard was passed to the IEEE, and the ATLAS acronym was changed to Abbreviated Test Language for All Systems to reflect its broader field of applications. Within the IEEE, development of ATLAS and ATLAS-related standards was vested in an ad hoc committee, which later beca

11、me the IEEE Standards Coordinating Committee 20 (SCC20). In the mid-1980s, SCC20 broadened the scope of its activities to embrace other standards projects related to test and diagnosis, including Automatic Test Program Generation (ATPG), Test Equipment Description Language (TEDL), Artificial Intelli

12、gence Exchange and Service Tie to All Test Environments (AI-ESTATE), A Broad Based Environment for Test (ABBET), Software Interface to Maintenance Information and Collection Analysis (SIMICA), Receiver Fixture Interface (RFI), Signal and Test Definition (STD), and Automatic Test Markup Language (ATM

13、L). The parent standard, IEEE Std 1671TMab, provides the framework for a family of standards providing specifications for test-related applications and environments. This family specifies language-independent elements within a wide variety of test environments, including built-in test systems, autom

14、atic test systems (ATS), and manual test environments. Each of these interfaces is specified in the form of an eXtensible Markup Language (XML) schema. This child, or “dot,” standard, also known as an ATML component standard, specifies a new XML schema that provides for the representation of test de

15、scription information. XML schemas define the basic information required within any test application and provide a vehicle for formally defining the test environment by defining a class hierarchy corresponding to these basic information entities and providing several methods within each to enable ba

16、sic operations to be performed on these entities. ATML component standards within the ATML framework define the particular requirements within the test environment. Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance w

17、ith the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge

18、 action that is not in compliance with applicable laws, and these documents may not be construed as doing so. aIEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). b Information on references

19、 can be found in Clause 2. v Copyright 2013 IEEE. All rights reserved. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, stan

20、dardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should b

21、e aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any a

22、mendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at th

23、e address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standard

24、s.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken

25、 by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sa

26、sb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants des

27、iring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims

28、, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent right

29、s, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2013 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board, the Test an

30、d ATS Description (TAD) Subcommittee had the following membership: Ashley Hulme, Co-chair Ion Neag, Co-chair Peter Abendroth Jean-Yves Allard Anthony Alwardt Jack Amsell Michael Araiza Wesley Barnishan Malcolm Brown Gerald (Scott) Brown Steve Cmiel Bernard Dathy Timothy Davis David Droste James Dums

31、er Gail Edwards Tamara Einspanjer William Eklow Keith Ellis Anthony Estrada Anthony Faucogney Jennifer Fetherman William (Brit) Frank Thomas Gauntner Scott Gearhart George Geathers Anthony Geneva William Gerstein Jos Manuel Gonzalez Chris Gorringe Michael Granieri Christophe Grard Jay Guruswamy Mich

32、elle Harris Michael Harrison David Heck Alicia Helton Hans Hopf Orman (Bob) Horton Li Hui Ulla Jacobsson Anand Jain Carey Jimmerson Mark Kaufman Dexter Kennedy John Knowles Arthur Larsen Lars-Olov Larsson Adam Ley Jay Lindsey Teresa Lopes William Maciejewski Michael Malesich Robert McGarvey Alex Mel

33、oni Scott Misha Mukund Modi Angela Nielson Leslie Orlidge Duy-Huan Pham Dan Pleasant Hugh Pritchett David Ptacek Peter Richardson Rudy Ridwan David Rohacek Michael Rutledge Paul Salopek Howard Savage Michel Schieber Mike Seavey Jamie Shand David Sharone John Sheppard Mark Skiba Roger J. Sowada Rober

34、t Spinner John Stabler Joseph Stanco Michael Stora Walter Struppler Ronald Taylor Laurence Thayer Henry Thomas Vincent Tume Joerg Urban Timothy Wilmering Pelin Yalcin The following members of the balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abste

35、ntion. Malcom Brown Keith Chow He Chun Kevin Coggins Tommy Cooper David Droste William (Brit) Frank Scott Gearhart George Geathers William Gerstein Sergiu Goma Jos Manual Gonzalez Chris Gorringe Randall Groves Werner Hoelzl Ashley Hulme Anand Jain Mark Kaufman John Knowles Adam Ley Teresa Lopes Robe

36、rt McGarvey Scott Misha Prajit Nair Ion Neag Leslie Orlidge Stephen Osella Ulrich Pohl John Ralph Peter Richardson Robert Robinson David Rohacek Bartien Sayogo Mike Seavey James E. Smith Roger J. Sowada Robert Spinner Joseph Stanco Walter Struppler Ronald Taylor Vincent Tume Timothy Wilmering Oren Y

37、uen vii Copyright 2013 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 11 September 2009, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor Berma

38、n Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Parsons Ronald C. Petersen Narayanan Ramachandran Jon Walter Rosdahl Sam Sciacca *Member Emeritus Also included are the fol

39、lowing nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic, NIST Representative Satish K. Aggarwal, NRC Representative Lorraine Patsco IEEE Standards Program Manager, Document Development Bill Ash IEEE Standards Program Manager, Technical Program Develop

40、ment viii Copyright 2013 IEEE. All rights reserved. Contents 1. Overview 1 1.1 General 1 1.2 Scope . 1 1.3 Purpose 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviation

41、s . 5 4. SchemaTestDescription.xsd . 5 4.1 General 5 4.2 Elements 6 4.3 Simple types .12 4.4 Complex types 14 5. Conformance .147 6. Extensibility .148 Annex A (informative) TestDescription instance documents (.XML files) 149 A.1 TestDescription 149 Annex B (informative) Users information and exampl

42、es 151 B.1 Example UUT 151 B.2 Example 1 153 B.3 Example 2 170 B.4 Example 3 177 B.5 Example 4 180 B.6 Other examples 181 Annex C (informative) Referenced IEEE standards 183 Annex D (informative) Glossary .184 Annex E (informative) Bibliography .185 1 Copyright 2013 IEEE. All rights reserved. IEEE S

43、tandard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with

44、or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available

45、for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request f

46、rom IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 General The family of Automatic Test Markup Language (ATML) standards is being developed under the guidance of the IEEE Standards Coordinating Committee 20 (SCC20) to serve as standards for product test. The ATML fa

47、mily of standards specifies a comprehensive environment for integrating design data, test strategies, test requirements, test procedures, test results management, and test system implementations. The ATML framework is defined by IEEE Std 1671TM.1,2IEEE Std 1671 is therefore a critical part of the AT

48、ML component defined by this standard. This standard (and its associated schema) is intended to be used in identifying and documenting test descriptions that may be utilized during the testing of a particular unit under test (UUT).1The IEEE standards referenced in this standard are trademarks of the

49、 Institute of Electrical and Electronics Engineers, Inc. 2For information on references, see Clause 2. 1.2 Scope The scope of this standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, IEEE Std 1671.1-2009 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions 2 Copyright 2013 IEEE. All rights reserved. diagnostic requirements, and support