IEEE 1650-2005 en Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes《测量碳纳米管的电特性的试验方法》.pdf
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1、 IEC 62624Edition 1.0g2 2009-08INTERNATIONAL STANDARD Test methods for measurement of electrical properties of carbon nanotubes IEC 62624:2009(E)IEEE Std1650-2005(E)IEEE Std 1650THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2005 IEEE All rights reserved. IEEE is a registered trademark in the U.S
2、. Patent 17.220.20 PRICE CODEISBN 2-8318-1057-7IEEE Std 1650CONTENTS 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Electrical characterization overview 1 2. Definitions, acronyms, and abbreviations 6 2.1 Definitions . 6 2.2 Acronyms and abbreviations . 7 3. Nanotube properties 7 3.1 Single-walled na
3、notube . 8 3.2 Multi-walled nanotube. 9 4. Electrodes . 9 4.1 Materials 9 4.2 Method for electrode fabrication . 9 4.3 Dimensions 10 5. Device characterization 10 5.1 Architecture design 10 5.2 Method for processing and fabrication 10 5.3 Standard characterization procedures 11 5.4 Environmental con
4、trol and standards 14 Annex A (informative) Bibliography . 15 Annex B (informative) List of Participants 16 i Foreword .iiiIEEE Introduction .viIEC 62624:2009(E)IEEE Std 1650-2005(E)Published by IEC under licence from IEEE. 2009 IEEE. All rights reserved. Published by IEC under licence from IEEE. 20
5、09 IEEE. All rights reserved. INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHODS FOR MEASUREMENT OF ELECTRICAL PROPERTIES OF CARBON NANOTUBES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical
6、 committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Tec
7、hnical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governm
8、ental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or
9、agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international
10、use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to pr
11、omote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly ind
12、icated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject
13、 of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62624/IEEE Std1650 has been processed through IEC technical committee 113: Nanotechnology standardization for electrical and electronic products and systems. The text of thi
14、s standard is based on the following documents: IEEE Std FDIS Report on voting 1650 (2005) 113/58A/FDIS 113/63/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The committee has decided that the contents of this p
15、ublication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. iii IEC 62624:2009(
16、E)IEEE Std 1650-2005(E)IEC/IEEE Dual Logo International Standards This Dual Logo International Standard is the result of an agreement between the IEC and the Institute of Electrical and Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to the IEC for consideration under th
17、e agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accordance with the ISO/IEC Directives. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Boar
18、d. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute and s
19、erve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an IEC/IEEE Dual Logo
20、International Standard is wholly voluntary. The IEC and IEEE disclaim liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or reliance upon this
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