1、 IEC 62624Edition 1.0g2 2009-08INTERNATIONAL STANDARD Test methods for measurement of electrical properties of carbon nanotubes IEC 62624:2009(E)IEEE Std1650-2005(E)IEEE Std 1650THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2005 IEEE All rights reserved. IEEE is a registered trademark in the U.S
2、. Patent 17.220.20 PRICE CODEISBN 2-8318-1057-7IEEE Std 1650CONTENTS 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Electrical characterization overview 1 2. Definitions, acronyms, and abbreviations 6 2.1 Definitions . 6 2.2 Acronyms and abbreviations . 7 3. Nanotube properties 7 3.1 Single-walled na
3、notube . 8 3.2 Multi-walled nanotube. 9 4. Electrodes . 9 4.1 Materials 9 4.2 Method for electrode fabrication . 9 4.3 Dimensions 10 5. Device characterization 10 5.1 Architecture design 10 5.2 Method for processing and fabrication 10 5.3 Standard characterization procedures 11 5.4 Environmental con
4、trol and standards 14 Annex A (informative) Bibliography . 15 Annex B (informative) List of Participants 16 i Foreword .iiiIEEE Introduction .viIEC 62624:2009(E)IEEE Std 1650-2005(E)Published by IEC under licence from IEEE. 2009 IEEE. All rights reserved. Published by IEC under licence from IEEE. 20
5、09 IEEE. All rights reserved. INTERNATIONAL ELECTROTECHNICAL COMMISSION _ TEST METHODS FOR MEASUREMENT OF ELECTRICAL PROPERTIES OF CARBON NANOTUBES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical
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35、IEEE Std 1650-2005(E)IEEE Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes Sponsor Nanotechnology Council Standards Committee of the IEEE Nanotechnology Council Approved 8 December 2005 IEEE-SA Standards Board Abstract: Recommended methods and standardized reporting
36、 practices for electrical characterization of carbon nanotubes (CNTs) are covered. Due to the nature of CNTs, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. The most common sources of measurement error, particularly
37、 for high-impedance electrical measurements commonly required for CNTs, are described. Recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring CNTs are given. Keywords: carbon nanotube, electrical chara
38、cterization, high-impedance measurement, nanotechnologyPublished by IEC under licence from IEEE. 2009 IEEE. All rights reserved. v IEC 62624:2009(E)IEEE Std 1650-2005(E)IEEE Introduction This standard covers recommended methods and standardized reporting practices for electrical characterization of
39、carbon nanotubes (CNTs). Due to the nature of CNTs, significant measurement errors can be introduced if not properly addressed. This standard describes the most common sources of measurement error, and gives recommended practices in order to minimize and/or characterize the effect of each error. Sta
40、ndard reporting practices are included in order to minimize confusion in analyzing reported data. Disclosure of environmental conditions and sample size are included so that results can be appropriately assessed by the research community. These reporting practices also support repeatability of resul
41、ts, so that new discoveries may be confirmed more efficiently. The practices in this standard were compiled from scientists and engineers from the CNT field. These practices were based on standard operating procedures utilized in facilities worldwide. This standard was initiated in 2003 to assist in
42、 the diffusion of CNT technology from the laboratory into the marketplace. Standardized characterization methods and reporting practices creates a means of effective comparison of information and a foundation for manufacturing readiness. Notice to users Errata Errata, if any, for this and all other
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46、. 2009 IEEE. All rights reserved. IEC 62624:2009(E)IEEE Std 1650-2005(E) vi 1. 1.1standard provides (CNT )CNT1.2CNT standard 1.31.3.1g159 (Overview Scope This methods for the electrical characterization of carbon nanotubes s . The methods will be independent of processing routes used to fabricate th
47、e s. Purpose There is currently no defined standard for the electrical characterization of CNTs and the means of reporting performance and other data. Without openly defined standard test methods, the acceptance and diffusion of technology will be severely impeded. This is intended to provide and su
48、ggest procedures for characterization and reporting of data. These methods will enable the creation of a suggested reporting standard that will be used by research through manufacturing as the technology is developed. Moreover, the standards will recommend the necessary tools and procedures for vali
49、dation. Electrical characterization overview Testing apparatus Testing shall be performed using an electronic device test system with measurement sensitivity sufficient to give a measurement resolution of at least 0.1% (minimum sensitivity at or better than three orders of magnitude below expected signal level). For example, the smallest current through a CNT can be on the order of 1 pA (1012A) or smaller. Therefore, in this case the instrument shall have a resolution of 100 aA (1016A) or smaller. Additionally, due to the various imp
