IEEE 1460-1996 en Guide for the Measurement of Quasi-Static Magnetic and Electric Fields《准静态磁场和电场的测量导则》.pdf
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1、IEEE Std 1460-1996 (R2008)IEEE Guide for the Measurement of Quasi-Static Magnetic and Electric FieldsSponsorIEEE Standards Coordinating Committee on Non-Ionizing Radiation (SCC28)Approved 10 December 1996Reaffirmed 12 June 2008IEEE Standards BoardAbstract: A listing of possible measurement goals rel
2、ated to characterizing quasi-static magnetic andelectric fields and possible methods for their accomplishment is provided.Keywords: measurement protocols, power frequency, power frequency harmonic fields, quasi-staticmagnetic and electric fieldsThe Institute of Electrical and Electronics Engineers,
3、Inc.345 East 47th Street, New York, NY 10017-2394, USACopyright 1997 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 1997. Printed in the United States of America.ISBN 1-55937-873-5No part of this publication may be reproduced in any form, in an electroni
4、c retrieval system or otherwise, without theprior written permission of the publisher.iiIEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees ofthe IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They ar
5、e notnecessarily members of the Institute. The standards developed within IEEE represent a consensus of the broadexpertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interestin participating in the development of the standard.Use of an IEEE
6、 Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no otherways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEEStandard. Furthermore, the viewpoint expressed at the time a standard is approv
7、ed and issued is subject to changebrought about through developments in the state of the art and comments received from users of the standard. EveryIEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a document is morethan five years old and has not bee
8、n reaffirmed, it is reasonable to conclude that its contents, although still of somevalue, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have thelatest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any
9、interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as t
10、hey relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it isimportant to ensure that any interpretation has a
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12、.Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by the Instituteof Electrical and
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14、y individual standard foreducational classroom use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this standard, no position is
15、taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying all patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal validity orscope of those patents that are brou
16、ght to its attention.iiiIntroduction(This introduction is not part of IEEE Std 1460-1996, IEEE Guide for the Measurement of Quasi-Static Magnetic and ElectricFields.)As an aid for groups and individuals interested in developing magnetic and/or electric field measurement protocols,this guide describe
17、s different magnetic and electric field measurement methods that can accomplish specificmeasurement goals. A single measurement approach is not given because the measurement strategies andinstrumentation requirements will differ depending on the measurement environment of interest and the goals of a
18、measurement program. For example, the measurement protocols and instrumentation for characterizing electric andmagnetic fields from power lines will differ significantly from those for characterizing fields from video displayterminals.Frequent reference is made to a companion document for this guide
19、: IEEE Std 1308-1994, IEEE RecommendedPractice for Instrumentation: Specifications for Magnetic Flux Density and Electric Field Strength Meters10 Hz to3 kHz. IEEE Std 1308-1994 describes the types of available instrumentation used for measuring quasi-static magneticand electric fields, their princip
20、les of operation, definitions of terminology, calibration procedures, and sources ofmeasurement uncertainty.At the time this guide was completed, the ELF Field Measurements Working Group had the following membership:Martin Misakian, Chair Edward AslanQuirino BalzanoHoward BassenDavid DiniJames B. Ha
21、tfieldStewart MaurerRobert G. OlsenRon C. PetersenRichard A. TellDon UmbdenstockIan WalkerOther individuals who have contributed review and comment are as follows:Fred M. Dietrich Wilham T. KauneThe following persons were on the balloting committee:Eleanor R. AdairJ. Robert AshleyQuirino BalzanoHowa
22、rd BassenJohn P. BavinJohn A. BergeronTony E. BrananWilliam BrennerEdwin BronaughCharles R. BufflerJerrold BushbergStephen V. ChiusanoC. K. ChouJules CohenWilliam T. CrokerRobert A. CurtisJames M. DalyJohn A. D AndreaJohn J. DeFrankJohn DeLorgeLouis D. DornettoEdward C. ElsonDavid ErwinStewart M. Fa
23、stmanWilliam E. FeeroOm P. GandhiDavid L. GeorgeMartino GrandolfoArthur W. GuyDennis E. HadlockDonald HaesNorbert HankinPaul HrouxDonald HeirmanKent C. JaffaDavid JanesDonald JordanGary JohnsonRalph JustusHarrison F. KerschnerB. Jon KlauenbergG.A. KobanJoseph L. KoepfingerAnthony LaMastraJohn A. Leo
24、nowichRobert P. LiburdyJames LinDonald Lottaes, Jr.Costas MaletskosGeorge M. MarmaroStewart J. MaurerMatthew MingoiaMatthew C. MinlerlifMichael R. MooreMichael R. MurphyJohn L. OrrJohn M. OsepchukRon C. PetersenJ. Patrick ReillyMichael RepacholiivBrad J. RobertsTerence RybakHerman SchwanAsher Sheppa
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