DLA SMD-5962-95839 REV C-2008 MICROCIRCUIT LINEAR 5 V LOW DROPOUT VOLTAGE REGULATOR MONOLITHIC SILICON《单片硅5V稳压调节器 线性微电子电路》.pdf

《DLA SMD-5962-95839 REV C-2008 MICROCIRCUIT LINEAR 5 V LOW DROPOUT VOLTAGE REGULATOR MONOLITHIC SILICON《单片硅5V稳压调节器 线性微电子电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-95839 REV C-2008 MICROCIRCUIT LINEAR 5 V LOW DROPOUT VOLTAGE REGULATOR MONOLITHIC SILICON《单片硅5V稳压调节器 线性微电子电路》.pdf（10页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make change to the storage temperature range limit under paragraph 1.3 in accordance with N.O.R. 5962-R191-96. 96-08-21 R. MONNIN B Make change to the case outline 2 PDlimit under paragraph 1.3. Make change to the IOlimit under paragraph 1.4. Mak

2、e changes to the conditions column limits for VO, VRO, VDO, and IBtests under Table I. Changes in accordance with N.O.R. 5962-R042-97. 96-11-05 R. MONNIN C Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. Redrawn. - ro 08-07-08 R. HEBER REV SHET REV SHET REV STATUS REV C C C C C C

3、C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY MARCIA KELLEHER CHECKED BY RAJESH PITHADIA DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY MICHAEL A. FRYE STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND A

4、GENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 95-11-08 MICROCIRCUIT, LINEAR, 5 V LOW DROPOUT VOLTAGE REGULATOR, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-95839 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E424-08 Provided by IHSNot for ResaleNo reproduction or

5、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high r

6、eliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The

7、 PIN is as shown in the following example: 5962 - 95839 01 M P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA ma

8、rked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Devi

9、ce type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 TL751M05 5 V, low dropout voltage regulator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device

10、 class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are

11、as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-3853

12、5, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute max

13、imum ratings. 1/ Continuous input voltage . 26 V Transient input voltage (TA= +25C) 60 V Continuous reverse input voltage -15 V Transient reverse input voltage (t 100 ms) . - 50 V Power dissipation (PD): Case outline P . 1050 mW 2/ Case outline 2 1920 mW 2/ Storage temperature range . -65C to +150C

14、Junction temperature (TJ) . +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case outline P . 180C/W Case outline 2 65C/W 1.4 Recommended operating conditions. Input voltage range (VI) 6.0

15、V min, 26.0 V max High level ENABLE voltage (VIH) 2.0 V min, 15.0 V max Low level ENABLE voltage (VIL): TA= +25C 0 V min, 0.8 V max 3/ TA= -55C to +125C 0 V min, 0.8 V max 3/ Output current (IO) 480 mA Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government sp

16、ecification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-

17、PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcirc

18、uit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maxi

19、mum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate linearly at 8.4 mW/C above 70C for case outline P and at 11.0 mW/C above 70C for case outline 2. 3/ The algebraic convention, in which the least pos

20、itive (most negative) value is designed minimum, is used for ENABLE voltage levels and temperature only. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 432

21、18-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

22、 a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in t

23、he QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The desi

24、gn, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal

25、 connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the ful

26、l ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition,

27、 the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking

28、for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The com

29、pliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 her

30、ein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing s

31、hall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q an

32、d V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acqui

33、red to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documenta

34、tion shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 76 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networki

35、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C VI= +14 V, IO= 30

36、0 mA Group A subgroups Device type Limits Unit unless otherwise specified Min Max Output voltage VOVI= 6 V to 26 V, 1 01 4.95 5.05 V IO= 0 mA to 480 mA 2,3 4.9 5.1 Input regulation VRIVI= 9 V to 16 V, IO= 250 mA, TA= +25C 1 01 25 mV VI= 6 V to 26 V, IO= 250 mA, TA= +25C 50 Ripple rejection 2/ RR VI=

37、 8 V to 18 V, f = 120 Hz, TA= +25C 1 01 50 dB Output regulation VROIO= 5 mA to 480 mA, TA= +25C 1 01 50 mV Dropout voltage VDOIO= 480 mA, TA= +25C 1 01 0.5 V Bias current IBIO= 480 mA, TA= +25C 1 01 75 mA IO= 10 mA 1,2,3 5 ENABLE VIH 2 V, TA= +25C 1 200 A 1/ All characteristics are measured with a 0

38、.1 F capacitor across the input and a 10 F capacitor, with equivalent series resistance of less than 1 across the output. 2/ Guaranteed, if not tested, to the limits specified in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO

39、CIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines P 2 Terminal number Terminal symbol 1 GND NC 2 NC GND 3 ENABLE NC 4 INPUT NC 5 NC NC 6 OUTPUT NC 7 NC ENABLE 8 NC NC 9 - NC 10 - INPU

40、T 11 - NC 12 - NC 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - NC 18 - NC 19 - NC 20 - NC FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-95839 DEFENSE SUPPLY CENTER COLUMBUS COLUM

41、BUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modif

42、ication in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and sh

43、all be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device clas

44、s M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs,

45、biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in

46、test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Bo

47、ard (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Inte

48、rim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection.