DLA SMD-5962-91738 REV A-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL D-TYPE MONOLITHIC SILICON《硅单块 八进制D型改进型肖特基晶体管晶体管逻辑电路 双极数字微型电路》.pdf

《DLA SMD-5962-91738 REV A-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL D-TYPE MONOLITHIC SILICON《硅单块 八进制D型改进型肖特基晶体管晶体管逻辑电路 双极数字微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-91738 REV A-2005 MICROCIRCUIT DIGITAL BIPOLAR ADVANCED SCHOTTKY TTL OCTAL D-TYPE MONOLITHIC SILICON《硅单块 八进制D型改进型肖特基晶体管晶体管逻辑电路 双极数字微型电路》.pdf（14页珍藏版）》请在麦多课文档分享上搜索。

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 05-07-20 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A OF SHEET

2、S SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas M. Hess COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICRO

3、CIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, OCTAL D-TYPE, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-11-15 SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-91738 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E423-04 Provided by IHSNot for ResaleNo re

4、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consis

5、ting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN

6、. 1.2 PIN. The PIN is as shown in the following example: 5962 - 91738 01 M R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes

7、Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA devi

8、ce. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 54F573 Octal D-type transparent latches 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows:

9、Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines ar

10、e as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 dual-in-line S GDFP2-F20 or CDFP3-F20 20 flat 2 CQCC1-N20 20 square chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device cl

11、asses Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM

12、 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc Input voltage range (VIN) . -0.5 V dc to +7.0 V dc Output current (IOUT) 40 mA Storage temperature range -65C to +150C Maximum power dissipation (PD) . 302.5 mW 2/ Lead temperature (soldering, 10 seconds)

13、 +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) 4.5 V dc to 5.5 V dc Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Maximum input clamp

14、 current (IIK) -18 mA Maximum high level output current (IOH) . -3 mA Maximum low level output current (IOL) 20 mA Input rise and fall times (tr, tf) 2.5 ns Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The follo

15、wing specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing,

16、General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircu

17、it Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between th

18、e text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage t

19、o the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Maximum power dissipation is defined as VCCx ICC, and must withstand the added PDdue to short circuit output test e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted

20、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordan

21、ce with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-

22、PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein f

23、or device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections and descriptions. The terminal connections and descriptions shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Lo

24、gic diagram. The logic diagram shall be as specified on figure 3 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein

25、, the electrical performance characteristics and post-irradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electric

26、al tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has th

27、e option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certif

28、ication/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of

29、 compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (s

30、ee 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements o

31、f MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification

32、 of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and

33、 the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this dr

34、awing shall be in microcircuit group number 30 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

35、SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, IOH = -3.0 mA 1, 2, 3 All 2.4 V VIH= 2.0 V, IOH = -1.0 mA 2.5 Low

36、level output voltage VOLVIL= 0.8 V IOL = 20 mA 1, 2, 3 All 0.5 V Input clamp voltage VIKVCC= 4.5 V IIN = -18 mA 1, 2, 3 All -1.2 V Off-state output current, IOZHVCC= 5.5 V VOUT= 2.7 V 1, 2, 3 All 50 A High level voltage applied Off-state output current, IOZLVCC= 5.5 V VOUT= 0.5 V 1, 2, 3 All -50 A l

37、ow level voltage applied Input current at maximum input voltage IIVCC= 5.5 V VIN= 7.0 V 1, 2, 3 All 100 A High level input current IIHVCC= 5.5 V VI= 2.7 V 1, 2, 3 All 20 A Low level input current IIL VCC= 5.5 V VI= 0.5 V 1, 2, 3 All -0.6 mA Short-circuit output current IOSVCC= 5.5 V, 1/ VOUT= 0.0 V

38、1, 2, 3 All -60 -150 mA Supply current ICCZVCC= 5.5 V, D = E = GND 1, 2, 3 All 60 mA OE = 4.5 V Functional tests See 4.4.1b, VCC= 4.5 and 5.5 V 7, 8 All Propagation delay time, tPLH1VCC= 5.0 V, 9 All 3.0 11.5 ns latch enable to output CL= 50 pF, 10, 11 3.7 13.5 tPHL1RL= 500, 9 All 2.2 7.0 ns See fig

39、ure 4. 10, 11 1.5 9.0 Propagation delay time, tPLH29 All 2.0 8.0 ns data to output 10, 11 1.5 9.0 tPHL29 All 1.2 6.0 ns 10, 11 1.0 8.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

40、 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Enable ti

41、me to high tPZHVCC= 5.0 V, 9 All 1.2 11.0 ns level CL= 50 pF, 10, 11 1.0 13.0 Enable time to low tPZLRL= 500, 9 All 1.2 8.5 ns level See figure 4. 10, 11 1.0 10.0 Disable time from high tPHZ9 All 1.2 6.5 ns level 10, 11 1.0 8.5 Disable time from low tPLZ9 All 1.2 6.0 ns level 10, 11 1.0 7.0 Latch en

42、able pulse width 2/ tw(H) 9, 10, 11 All 6.0 ns Setup time, data to latch enable 2/ ts9, 10, 11 All 2.0 ns Hold time, data to latch enable 2/ th9, 10, 11 All 5.0 ns 1/ Not more than one output should be shorted at one time. For testing IOS, the use of high speed test apparatus and/or sample and hold

43、techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tes

44、ts, IOStests should be performed last. 2/ Guaranteed, if not tested to the limits specified in table I, herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, O

45、HIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines R, S, and 2 Terminal number Terminal symbol 1 OE 2 D03 D14 D25 D36 D47 D58 D69 D710 GND 11 E 12 Q713 Q614 Q515 Q416 Q317 Q218 Q119 Q020 VCCFIGURE 1. Terminal connections and descriptions. Inputs Output OE E D

46、Q L H H H L H L L L L X Q0H X X ZH = High voltage level. L = Low voltage level. Z = High impedance. X = Irrelevant. Q0= Level of Q before the indicated steady state input conditions were established. FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without

47、license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAN

48、DARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91738 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 NOTES: 1. Pulse generator characteristics: PRR = 1 MHz, tr= tf= 2.5