DLA SMD-5962-89594 REV C-2000 MICROCIRCUIT HYBRID LINEAR HIGH SPEED WIDEBAND OPERATIONAL AMPLIFIER《高速宽带运算放大器 线性混合微型电路》.pdf

《DLA SMD-5962-89594 REV C-2000 MICROCIRCUIT HYBRID LINEAR HIGH SPEED WIDEBAND OPERATIONAL AMPLIFIER《高速宽带运算放大器 线性混合微型电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89594 REV C-2000 MICROCIRCUIT HYBRID LINEAR HIGH SPEED WIDEBAND OPERATIONAL AMPLIFIER《高速宽带运算放大器 线性混合微型电路》.pdf（13页珍藏版）》请在麦多课文档分享上搜索。

1、REVISIONSLTR DESCRIPTION DATE (YR -MO -DA) APPROVEDA Added tests to table I. Updated document to current MIL-H-38534requirements. Editorial changes throughout.92-01-22 A. BaroneB Changes made in accordance with NOR 5962-R242-97. 97-03-13 Kendall A. CottongimC Added vendor cage 1HBD3. Removed vendor

2、cage 62839. Madecorrections to table I. Editorial changes throughout. -sld00-06-07 Raymond MonninREVSHEETREVSHEETREV STATUS REV C C C C C C C C C C C COF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUIT DRAWINGCHECKED BYRobert M

3、. HeberCOLUMBUS, OHIO 43216THIS DRAWING ISAVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYW illiam K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGHSPEED, WIDEBAND, OPERATIONALAMPLIFIERAND AGENCIES OF THEDEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-07-26AMSC N/A REVISION LEVELCSIZEACAGE CODE67268 5962-89

4、594SHEET 1 OF 12DSCC FORM 2233APR 97 5962 -E332 -00DISTRIBUTION STATEMENT A . Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COL

5、UMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope . This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines andlead finishes are available and are reflected in the Part or Identifying Number (PIN).1.2 PIN . T

6、he PIN shall be as shown in the following example:5962 - 89594 01 X X Drawing number Device Case Leadtype outline finish(see 1.2.1) (see 1.2.2) (see 1.2.3)1.2.1 Device type(s) . The device type(s) identify the circuit function as follows:Device type Generic number 1 / Circuit function01 CLC231A, KH2

7、31A High speed, wideband, operational amplifier1.2.2 Case outline(s) . The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX See figure 1 12 Can package1.2.3 Lead finish . The lead finish shall be as specified in MIL-PRF-3

8、8534.1.3 Absolute maximum ratings . 2 /Supply voltage ( V CC ) 20 V dcOutput current . 100 mAStorage temperature range -65 C to +150 CLead temperature (soldering, 10 seconds) +300 CJunction temperature (T J ) +175 CPower dissipation (P D ) 3 /Thermal resistance, case-to-ambient ( CA ) 65 C/W 4 /Ther

9、mal resistance, junction-to-case:JC . 48 C/W 5 /JC . 100 C/W 6 /1 / The CLC231A is not available from an approved source of supply.2 / Stresses above the abso lute maximum ratings may cause permanent damage to the device. Extended operation at themaximum levels may degrade performance and affect rel

10、iability.3 / The power dissipation can be determined based on the application and junction temperature verifie d to T J +175 C andusing the thermal resistance values given.4 / Still air, no heat sink.5 / Thermal resistance of circuit; P CIRCUIT = 2(V CC ) I CC .6 / Thermal resistance of output trans

11、istors; P OUTPUT = V CE (I E ) x (% duty cycle).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET3DSCC FORM 2234APR 971.4 Recommende

12、d operating conditions .Supply voltage range 5 V dc to 15 V dcGain range 1 to 5Ambient operating temperature range (T A ) . -55 C to +125 C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks . The following specification, standards, and handbooks form a part ofthis drawing

13、to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issueof the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38534 - Hybrid

14、Microcircuits, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings (SMDs).MIL-HDBK-780 - Standard

15、Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbook are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence . In the event of a conflict between the text of th

16、is drawing and the references cited herein, the text ofthis drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specificexemption has been obtained.3. REQUIREMENTS3.1 Item requirements . The individual item performance requirements for dev

17、ice class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the devicemanufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests andinspections herein m

18、ay not be performed for the applicable device class (see MIL-PRF-38534). Furthermore, the manufacturermay take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, theperformance requirements as defined in MIL-PRF-38534 shall be met for the applicabl

19、e device class. 3.2 Design, construction, and physical dimensions . The design, construction, and physical dimensions shall be as specified inMIL-PRF-38534 and herein.3.2.1 Case outline(s) . The case outline(s) shall be in accordance with 1.2.2 herein and figure 1.3.2.2 Terminal connections . The te

20、rminal connections shall be as specified on figure 2.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET4DSCC FORM 2234APR 973.3 Elect

21、rical performance characteristics . Unless otherwise specified herein, the electrical performance characteristics are asspecified in table I and shall apply over the full specified operating temperature range.3.4 Electrical test requirements . The electrical test requirements shall be the subgroups

22、specified in table II. The electrical testsfor each subgroup are defined in table I.3.5 Marking of Device(s) . Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked withthe PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be ma

23、rked.3.6 Data . In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device describedherein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, foreach device type listed herein. Also,

24、 the data should include a summary of all parameters manually tested, and for those which, ifany, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be madeavailable to the preparing activity (DSCC-VA) upon request.3.7 Certificate of complianc

25、e . A certificate of compliance shall be required from a manufacturer in order to supply to this drawing.The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets theperformance requirements of MIL-PRF-38534 and herein.3.8 Certificate of con

26、formance . A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot ofmicrocircuits delivered to this drawing.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection . Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modifiedin th

27、e device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, orfunction as described herein.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SU

28、PPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics .LimitsTest S ymbol Conditions 1 /-55 C T A +125 Cunless otherwise specifiedGroup AsubgroupsDevicetypeMin MaxUnit4, 6 145Small signal bandwidth(-3 dB bandwidth)SSBW50

29、1120MHz4 0.3Gain flatness peaking low GFPL f = 100 KHz to 50 MHz5, 6010.6dB4 0.35 0.6Gain flatness peaking high GFPH f 50 MHz6011.5dB4, 6 0.6Gain flatness rolloff GFR f = 100 MHz5011.0dBLinear phase deviation 2 / LPD f 5.0 MHz 7, 8A, 8B 01 -150 dBm (1 Hz)Integrated noise 2 / INV f = 5 MHz to 200 MHz

30、 7, 8A, 8B 01 100 V RMS1 2.02 4.5Input offset voltage V IO3014.0mVInput offset voltage 2 /temperature coeffecientV IOT1, 2, 3 01 25 V/ C1 212 31+ Input bias current 4 / +I IB Input resistance is 100 k 30129A+ Input bias current 2 /temperature coeffecient+I IBT1, 2, 3 01 125 nA/ C1 152 35- Input bias

31、 current -I IB Input resistance is 49 30131A- Input bias current 2 /temperature coeffecient-I IBT1, 2, 3 01 200 nA/ CSee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUP

32、PLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET7DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics - Continued.LimitsTest Symbol Conditions 1 /-55 C T A +125 Cunless otherwise specifiedGroup AsubgroupsDevicetypeMin MaxUni tPower supply rejection ratio PSRR V CC = 0.

33、5 V 1, 2, 3 01 45 dBCommon mode rejection 2 /ratioCMRR V CM = 1 V 4, 5, 6 01 40 dBSupply current I CC No load 1, 2, 3 01 22 mA1 / Unless otherwise specified, R L = 100 ohms, R F = 250 ohms, V CC = 15 V, A V = +2 and V OUT = 0.63 V P-P .2 / Parameter shall be tested as part of device initial characte

34、rization and after design and process changes which mayaffect this parameter. Parameter shall be guarant eed to the limits specified in table I for all lots not specifically tested.3 / dBc is a standard reference for a signal referenced to a carrier signal level.4 / In a noninverting configuration,

35、care should be taken when choosing R J , the input impedance setting resistor; the biascurrent is typically 5 A but as high as 31 A can create an input signal large enough to cause overload. It isrecommended that R J (V CC /A V )/31 A.Provided by IHSNot for ResaleNo reproduction or networking permit

36、ted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET8DSCC FORM 2234APR 97FIGURE 1. Case outline .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

37、ARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET9DSCC FORM 2234APR 97Symbol Inches Millimeters NotesMin Max Min MaxA .148 .181 3.76 4.60b .016 .019 0.41 0.48D .595 .608 15.11 15.44D 1 .545 .555 13.84 14.10e .400 BSC 10.16 BSC 5e 1 .20

38、0 BSC 5.08 BSC 5e 2 .100 BSC 2.54 BSC 5F .030 0.76k .026 .036 0.66 0.91k 1 .026 .036 0.66 0.91 4L .310 .340 7.87 8.64 45 BSC 45 BSC 5NOTES:1. Dimensions are in inches.2. Metric equivalents are given for general information only.3. The product may be measured by direct methods or by gauge.4. Measured

39、 from the maximum diameter of the product.5. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) +.001 (0.03 mm),-.000 (0.00 mm) below the base plane of the product shall be within .007 (0.18 mm) of their true position relativeto a maximum width tab.FIGURE 1. Case

40、 outline - Continued.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET10DSCC FORM 2234APR 97Device type 01Case outline XTerminal num

41、ber Terminal symbol1 +V CC (supply voltage)2 +I CC adjust3 GND (case)4 No connection5 -V IN6 +V IN7 GND (case)8 -I CC adjust9 -V CC (supply voltage)10 -V CC (collector supply)11 V OUT12 +V CC (collector supply)NOTE: Pins 2 and 8 are used to adjust the supply current.These pins are normally left unco

42、nnected. In normaluse, a 250 ohm feedback resistor is connected externallybe tween pins 5 and 11.FIGURE 2. Terminal connections .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBU

43、SCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET11DSCC FORM 2234APR 97TABLE II. Electrical test requirements .MIL-PRF-38534 test requirements Subgroups(in accordance withMIL-PRF-38534, group A testtable)Interim electrical parameters 1Final electrical parameters 1*, 2, 3, 4, 7Group A test requirements

44、1, 2, 3, 4, 5, 6, 7, 8A, 8BGroup C end-point electricalparameters1* PDA applies to subgroup 1. 4.2 Screening . Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test cir

45、cuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent

46、 specified in testmethod 1015 of MIL-STD-883.(2) T A as specified in accordance with table I of method 1015 of MIL-STD-883.b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter testsprior to burn -in are optional a t the discret

47、ion of the manufacturer.4.3 Conformance and periodic inspections . Conformance inspection (CI) and periodic inspection (PI) shall be in accordancewith MIL-PRF-38534 and as specified herein.4.3.1 Group A inspection (CI) . Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:a.

48、Tests shall be as specified in table II herein.b. Subgroups 9, 10, and 11 shall be omitted.4.3.2 Group B inspection (PI) . Group B inspection shall be in accordance with MIL-PRF-38534.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89594DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET12DSCC FORM 2234APR 974.3.3 Group C inspection (PI) . Group C inspection