DLA SMD-5962-89508-1989 MICROCIRCUIT DIGITAL FAST CMOS 1 OF 4 DECODER MONOLITHIC SILICON《硅单片1 4译码器高速互补型金属氧化物半导体线性微电路》.pdf

《DLA SMD-5962-89508-1989 MICROCIRCUIT DIGITAL FAST CMOS 1 OF 4 DECODER MONOLITHIC SILICON《硅单片1 4译码器高速互补型金属氧化物半导体线性微电路》.pdf》由会员分享，可在线阅读，更多相关《DLA SMD-5962-89508-1989 MICROCIRCUIT DIGITAL FAST CMOS 1 OF 4 DECODER MONOLITHIC SILICON《硅单片1 4译码器高速互补型金属氧化物半导体线性微电路》.pdf（11页珍藏版）》请在麦多课文档分享上搜索。

1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREVSHEETREVSHEETREV STATUSOF SHEETSREVSHET 123456789101PMIC N/APREPARED BY Monica L. Poelking DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444STANDARDIZEDMILITARYDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMEN

2、T OF DEFENSEAMSC N/A CHECKED BYRay MonninMICROCIRCUIT, DIGITAL, FAST CMOS, 1 OF 4DECODER, MONOLITHIC SILICONAPPROVED BYMichael A. FryeDRAWING APPROVAL DATE27 APRIL 1989SIZEACAGE CODE672685962-89508REVISION LEVELSHEET 1 OF 11DESC FORM 193SEP 87 5962-E1176DISTRIBUTION STATEMENT A. Approved for public

3、release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET2DESC FORM 193AJUL 911. SCOPE1.1 Scope. This drawing

4、describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. 1.2 Part number. The complete part number shall be as shown in the following example:5962 - 89508 01 E X G0DG0DG0DG0D

5、G0D G0D G0D G0D Drawing number Device type Case outline Lead finish per(see 1.2.1) (see 1.2.2) MIL-M-385101.2.1 Device types. The device types shall identify the circuit function as follows:Device type Generic number Circuit function01 54FCT139 Dual, 1 of 4 decoders02 54FCT139A Dual, 1 of 4 decoders

6、 1.2.2 Case outlines. The case outlines shall be as designated in appendix C of MIL-M-38510, and as follows:Outline letter Case outlineE D-2 (16-lead, .840“ x .310“ x .200“), dual-in-line packageF F-5 (16-lead, .440“ x .285“ x .085“), flat package2 C-2 (20-Terminal, .358“ x .358“ x .100“), square ch

7、ip carrier package 1.3 Absolute maximum ratings. 1/Supply voltage range . -0.5 V dc to +7.0 V dcInput voltage range -0.5 V dc to V + 0.5 V dcCCOutput voltage range . -0.5 V dc to V + 0.5 V dcCCDC input diode current (I ) -20 mAIKDC output diode current (I ) -50 mAOKDC output current . 100 mAMaximum

8、power dissipation (P ) 2/ 500 mWDThermal resistance, junction-to-case (G14 ) . See MIL-M-38510, appendix CJCStorage temperature range -65G28C to +150G28CJunction temperature (T ) . +175G28CJLead temperature (soldering, 10 seconds) +300G28C1/ All voltages referenced to GND.2/ Must withstand the added

9、 P due to short circuit test, e.g., I .DOSProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET3DESC FORM 193AJUL 911.4 Recommended operating

10、 conditions. Supply voltage range (V ) . +4.5 V dc to +5.5 V dcCCMaximum low level input voltage (V ) . 0.8 V dcILMinimum high level input voltage (V ) . 2.0 V dcIHCase operating temperature range (T ) -55G28C to +125G28CC2. APPLICABLE DOCUMENTS2.1 Government specification and standard. Unless other

11、wise specified, the following specification and standard, of the issuelisted in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein.SPECIFICATIONSMILITARYMIL-M-38510 - Microcircuits, G

12、eneral Specification for.STANDARDSMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.(Copies of the specification and standard required by manufacturers in connection with specific acquisition functions should beobtained from the contracting activity or as directed by the contrac

13、ting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text ofthis drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual item requirements for device class M shall be in accordance with 1.2

14、.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified inMIL-M-38510 and herein.3.2.1 Terminal connectio

15、ns. The terminal connections shall be as specified on figure 1.3.2.2 Truth table. The truth table shall be as specified on figure 2.3.2.3 Test circuit and switching waveforms . The switching waveforms and test circuit shall be as specified on figure 3.3.2.4 Case outlines. The case outlines shall be

16、in accordance with 1.2.2 herein.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are asspecified in table I and apply over the full case operating temperature range. 3.4 Marking. Marking shall be in accordance with MIL-STD-883

17、(see 3.1 herein). The part shall be marked with the partnumber listed in 1.2 herein. In addition, the manufacturers part number may also be marked as listed in 6.4 herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDE

18、FENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET4DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics.Test Symbol Conditions-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxHigh level

19、 output voltage VOHV = 4.5 V,CCV = 0.8 VILV = 2.0 VIHI = -300 G29AO1, 2, 3 All 4.3 VI = -12 mAO1, 2, 3 All 2.4Low level output voltage VOLV = 4.5 V, CCV = 0.8 VILV = 2.0 VIHI = 300 G29AO1, 2, 3 All 0.2I = 32 mAO1, 2, 3 All 0.5Input clamp voltage VIKV = 4.5 V, I = -18 mACC IN1Al -1.2High level input

20、current IIHV = 5.5 V, V = 5.5 VCC IN1, 2, 3 All 5.0 G29ALow level input current IILV = 5.5 V, V = GNDCC IN1, 2, 3 All -5.0Short circuit output current IOSV = 5.5 V , V = 0.0 V 1/ CC OUT1, 2, 3 All -60 mAQuiescent power supply current(CMOS inputs)ICCQV G06 0.2 V or V G07 5.3 V,IN INV 5.5 V, f = 0 MHz

21、CC I 1, 2, 3 All 1.5Quiescent power supply current(TTL inputs)deltaICCV = 5.5 V, V = 3.4 V 2/CC IN1, 2, 3 All 2.0Dynamic power supplycurrentICCDV = 5.5 V, OE = GNDCCV G07 5.3 V or V G06 0.2 V ,IN INOutputs open,One bit togglin - 50% duty cycle3/Al 0.3mA/MHzSee footnotes at end of table.Provided by I

22、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET5DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics - Continued.Test Symbol Conditio

23、ns-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxTotal power supplycurrent 4/ICCV G07 5.3 V or V G06 0.2 V ,IN INV = 5.5 V, f = 10 Mhz,CC IOutputs open, One bit toggling- 50% duty cycle1, 2, 3 All 4.5 mAV = 3.4 V or V = GNDIN INV =

24、5.5 V, f = 10 Mhz,CC IOutrputs open, OE = GNDOne bit toggling, 50% duty cycle5.5Functional tests See 4.3.1d 7, 8 AllInput capacitance CINSee 4.3.1c 4 All 10 pFOutput capacitance COUTSee 4.3.1c 4 All 12Propagation delay time,A , A , to O01 nt, PLHtPHLR = 500G36LC = 50 pFLSee figure 35/ 9, 10, 11 01 1

25、.5 12 ns02 1.5 7.8Propagation delay time,E , E , to OAB nt, PLHtPHL9, 10, 11 01 1.5 9.0 ns02 1.5 7.21/ Not more than one output should be shorted at one time, and the duration of the short circuit condition shall not exceed1 second.2/ TTL driven input (V = 3.4 V); all other inputs at V or GND.IN CC3

26、/ This parameter is not directly testable, but is derived for use in total power supply calculations.4/ I = I + (delta I x D x N ) + (I x f x N )CC CCQ CC H T CCD I IWhere: D = Duty cycle for TTL inputs highHN = Number of TTL inputs at DTHf = infrequency in MHZIN = Number of inputs at fIIf = clock f

27、requency in MHzCP5/ This parameter is guaranteed, if not tested, to the parameter limits specified in table I.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-895

28、08REVISION LEVEL SHEET6DESC FORM 193AJUL 91Device type 01 and 02Case outlines E and F 2TerminalnumberTerminal symbol1234567891011121314151617181920EAA0AA1AO0AO1AO2AO3AGNDO3BO2BO1BO0BA1BA0BEBVCC-NCEAA0AA1AO0ANCO1AO2AO3AGNDNCO3BO2BO1BO0BNCA1BA0BEBVCCNC = No connectionFIGURE 1. Terminal connections.Pro

29、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET7DESC FORM 193AJUL 91Inputs OutputsEA 0A1O0O0O0O0HLLLLXLHLHXLLHHHLHHHHHLHHHHHLHHHHHLH = Hig

30、h voltage levelL = Low voltage levelX = IrrelevantFIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET8DESC FORM 193AJ

31、UL 91OUTPUT LOAD CIRCUITNOTES:1. C includes probe and jig capacitance.L2. C = 50 pF, R = 500G36, and R = Z of pulseLL TOUTgenerator.3. Pulse generator for all pulses: PRR G06 1MHz, ZOUT G06 50G36,tr = tf G06 2.5 ns.FIGURE 3. Test circuit and switching waveforms.Provided by IHSNot for ResaleNo reprod

32、uction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET9DESC FORM 193AJUL 913.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order

33、 to be listed as anapproved source of supply in 6.4. The certificate of compliance submitted to DESC-ECS prior to listing as an approved source ofsupply shall state that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the requirementsherein.3.6 Certificate of con

34、formance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided witheach lot of microcircuits delivered to this drawing.3.7 Notification of change. Notification of change to DESC-ECS shall be required in accordance with MIL-STD-883 (see 3.1herein)3.8 Verfication

35、and review. DESC, DESCs agent, and acquiring activity retain the option to review the manufactrers facility andapplicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling

36、and inspection procedures shall be in accordance with section 4 of MIL-M-38510 to theextent specified in MIL-STD-883 (see 3.1 herein).4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devicesprior to quality conformance inspection. The fol

37、lowing additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein).(2) T = +125G28C, minimum.Ab. Interim and final electrical test parameters shall be as specified in tabl

38、e II herein, except interim electrical parameter testsprior to burn-in are optional at the discretion of the manufacturer.4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883including groups A, B, C, and D inspections. The followin

39、g additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.c. Subgroups 4 (C and C measurements) shall be measured only for the initial test and after process or designIN OU

40、Tchanges which may affect input capacitance. Test all applicable pins on five devices with no failures.d. Subgroups 7 and 8 tests shall verify of the truth table as specified on figure 2.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMIL

41、ITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET10DESC FORM 193AJUL 91TABLE II. Electrical test requirements.MIL-STD-883 test requirements Subgroups(per method 5005, table I)Interim electrical parameters(method 5004)- - -Final electrical test parame

42、ters(method 5004)1*, 2, 3, 7, 8, 9, 10, 11Group A test requirements(method 5005)1, 2, 3, 4, 7, 8, 9, 10, 11Group C and D end-pointelectrical parameters(method 5005) 1, 2, 3* PDA applies to subgroup 1.4.3.2 Group C and D inspections.a. End-point electrical parameters shall be as specified in table II

43、 herein.b. Steady-state life test conditions, method 1005 of MIL-STD-883.(1) Test condition A, B, C or D using the circuit submitted with the certificate of compliance (see 3.5 herein).(2) T = +125G28C, minimum.A(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.5. PAC

44、KAGING5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-38510.6. NOTES6.1 Intended use. Microcircuits conforming to this drawing are intended for use when military specifications do not exist andqualified military devices that will perform the required func

45、tion are not available for original equipment manufacturer application. When a military specification exists and the product covered by this drawing has been qualified listing on QPL-38510, the devicespecified herein will be inactivated and will not be used for new design. The QPL-38510 product shal

46、l be the preferred item for allapplications. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89508REVISION LEVEL SHEET11DESC FORM 193AJUL 916.2 Replaceability. M

47、icrocircuits covered by this drawing will replace the same generic device covered by a contractor-preparedspecification or drawing.6.3 Comments. Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telephone(513) 296-5375.6.4 Approved sources of supply. Approved sources of

48、 supply is listed herein. Additional sources will be added as they becomeavailable. The vendors listed herein have agreed to this drawing and a certificate of compliance (see 3.5 herein) has beensubmitted to DESC-ECS.Military drawingpart numberVendor CAGEnumberVendor similarpart number 1/5962-8950801EX 61772 54FCT139DB5962-8950801FX 61772 54FCT139EB5962-89508012X 61772 54FCT139LB 5962-8950802EX 61772 54FCT137ADB5962-8950802FX 61772 54FCT139AEB5962-89508022X 61772 54FCT139ALB1/Caution. Do not use this number for item acquisition. Items