DLA SMD-5962-06236 REV A-2013 MICROCIRCUIT LINEAR LOW NOISE HIGH SPEED VOLTAGE FEEDBACK OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete references to device class M requirements. Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 13-02-04 C. SAFFLE REV SHEET REV SHEET REV STATUS REV A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY

2、 RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY ROBERT M. HEBER MICROCIRCUIT, LINEAR, LO

3、W NOISE, HIGH SPEED VOLTAGE FEEDBACK OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON DRAWING APPROVAL DATE 07-04-12 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-06236 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E056-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

4、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space appl

5、ication (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 -

6、06236 01 Q P C Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RH

7、A levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 EL5132 Low noise, high speed voltage feedback operational amplifier 02

8、 EL5133 Low noise, high speed voltage feedback operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-3853

9、5 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided

10、by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage from +VSto -VS13.2 V

11、 Current at -IIN, +IIN, and CE . 5 mA Continuous output current . 20 mA Power dissipation (PD) 192 mW Storage temperature range . -65C to +150C Operating junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-883 Thermal resistance, junction-to-ambient (JA) 135C/W

12、Electrostatic discharge (ESD): Human body model (HBM) 3500 V Machine model (MM) . 300 V 1.4 Recommended operating conditions. Supply voltage from +VSto -VS10 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The

13、 following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufactu

14、ring, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Micr

15、ocircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawin

16、g and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extende

17、d operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4

18、 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not

19、affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outline. The case outline shall be in accordance with 1

20、.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are

21、 as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be m

22、arked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this optio

23、n, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For d

24、evice classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply fo

25、r this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcir

26、cuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical perfor

27、mance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Offset voltage VOS1,2,3 01,02 -2.5 2.5 mV Input bias current IIBVIN= 0 V 1,2,3 01,02 8 20 A Input offset current IOSVIN= 0 V 1,2,3 01,02 -1250 +1250 nA Power su

28、pply rejection ratio PSRR +VS= 4.75 V to 5.25 V 1,2,3 01,02 65 dB Common mode rejection ratio CMRR VIN= 3.0 V 1,2,3 01,02 80 dB Supply current enable IS-on1,2,3 01,02 6.5 16 mA Supply current - disable IS-off1,2,3 01 70 A Open loop gain AVOLVOUT= 3.0 V, RL= 1 k to GND 1,2,3 01,02 68 dB Output voltag

29、e swing VORF= 900 , RG= 100 , RL= 150 1,2,3 01,02 3.1 V Short circuit current ISCRL= 10 1,2,3 01,02 70 mA ENABLE pin input for current high IIH-ENBCE = 5 V 1,2,3 01 25 A ENABLE pin input for current low IIL-ENBCE = 0 V 1,2,3 01 -1 1 A CE input high voltage for power down VIH1,2,3 01 +VS-0.5 V CE inp

30、ut low voltage for power down VIL1,2,3 01 +VS-3 V 1/ Unless otherwise specified, +VS= +5 V, -VS= -5 V, load resistance (RL) = 500 , feedback resistance (RF) = 10 k, and gain resistance (RG) = 100 . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAN

31、DARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device types 01 02 Case outline P Terminal number Terminal symbol 1 NC NC 2 -INPUT -INPUT 3 +INPUT +INPUT 4 -VS-VS5 NC NC 6 OUTPUT OUTPUT 7 +VS+VS8 CE NC NC = No

32、 connection Terminal symbol Description NC Not connected -INPUT Inverting input +INPUT Non-inverting input -VSNegative power supply OUTPUT Amplifier output +VSPositive power supply CE Enable and disable input FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking

33、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be i

34、n accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, an

35、d shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM pla

36、n in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test

37、circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond

38、the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-P

39、RF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A i

40、nspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Addition

41、al criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level co

42、ntrol by the device manufacturers TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method

43、1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point e

44、lectrical parameters shall be as specified in table II herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point el

45、ectrical parameter limits as defined in table I at TA= +25C 5C, after exposure, to the subgroups specified in table II herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06236 DLA LAND AND MARITIME COLUM

46、BUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-PRF-38535, table III) Device class Q Device class V Interim electrical parameters (see 4.2) - - Final electrical parameters (see 4.2) 1,2,3

47、1/ 1,2,3 1/ Group A test requirements (see 4.4) 1,2,3 1,2,3 Group C end-point electrical parameters (see 4.4) 1,2,3 1,2,3 Group D end-point electrical parameters (see 4.4) 1 1 Group E end-point electrical parameters (see 4.4) - - 1/ PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements.

48、 The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specification or drawing. 6.2 Configuration control of SMDs. All proposed changes to existing SMDs will b