BS EN 62047-19-2013 Semiconductor devices Micro-electromechanical devices Electronic compasses《半导体器件 微型机电装置 电子罗盘》.pdf
《BS EN 62047-19-2013 Semiconductor devices Micro-electromechanical devices Electronic compasses《半导体器件 微型机电装置 电子罗盘》.pdf》由会员分享,可在线阅读,更多相关《BS EN 62047-19-2013 Semiconductor devices Micro-electromechanical devices Electronic compasses《半导体器件 微型机电装置 电子罗盘》.pdf(34页珍藏版)》请在麦多课文档分享上搜索。
1、BSI Standards PublicationSemiconductor devices Micro-electromechanical devicesPart 19: Electronic compassesBS EN 62047-19:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without lice
2、nse from IHS-,-,-National forewordThis British Standard is the UK implementation of EN 62047-19:2013. It isidentical to IEC 62047-19:2013.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/47, Semiconductors.A list of organizations represented on this committee can be ob
3、tained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2013.Published by BSI Standards Limited 2013ISBN 978 0 580 75937 6ICS 31.080.99Compliance wit
4、h a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 October 2013.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 62047-19:2013Copyright Euro
5、pean Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EUROPEAN STANDARD EN 62047-19 NORME EUROPENNE EUROPISCHE NORM September 2013 CENELEC European Committee for Electrotechnica
6、l Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No
7、. EN 62047-19:2013 E ICS 31.080.99 English version Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (IEC 62047-19:2013) Dispositifs semiconducteurs Dispositifs microlectromcaniques - Partie 19: Compas lectroniques (CEI 62047-19:2013) Halbleiterbauelemente - Bau
8、elemente der Mikrosystemtechnik - Teil 19: Elektronische Kompasse (IEC 62047-19:2013) This European Standard was approved by CENELEC on 2013-08-21. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the statu
9、s of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French,
10、 German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Be
11、lgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Swed
12、en, Switzerland, Turkey and the United Kingdom. BS EN 62047-19:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EN 62047-19:2013 - 2 - Foreword The text o
13、f document 47F/156/FDIS, future edition 1 of IEC 62047-19, prepared by SC 47F “Microelectromechanical systems” of IEC/TC 47 “Semiconductor devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62047-19:2013. The following dates are fixed: latest date by which the docu
14、ment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-05-21 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2016-08-21 Attention is drawn to the possibility that some of the elem
15、ents of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62047-19:2013 was approved by CENELEC as a European Standard without any modificati
16、on. In the official version, for Bibliography, the following note has to be added for the standard indicated: EN ISO 11606 NOTE Harmonized as ISO 11606 (not modified). BS EN 62047-19:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot f
17、or ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 62047-19 IEC:2013 CONTENTS 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Essential ratings and characteristics . 7 4.1 Composition of e-compasses . 7 4.1.1 General . 7 4.1.2 Magnetic sensor sectio
18、n 8 4.1.3 Acceleration sensor section . 8 4.1.4 Signal processing section 8 4.1.5 Peripheral hardware section 8 4.1.6 Peripheral software section . 8 4.1.7 DUT . 9 4.2 Ratings (Limiting values) . 9 4.3 Recommended operating conditions 9 4.4 Electric characteristics 9 4.4.1 General . 9 4.4.2 Characte
19、ristics of sensor sections . 9 4.4.3 DC characteristics . 10 5 Measuring methods 11 5.1 Sensitivity of the magnetic sensor section . 11 5.1.1 Purpose . 11 5.1.2 Circuit diagram 11 5.1.3 Principle of measurement 11 5.1.4 Precaution to be observed . 12 5.1.5 Measurement procedure 12 5.1.6 Specified co
20、nditions 12 5.2 Linearity of the magnetic sensor section 13 5.2.1 Purpose . 13 5.2.2 Measuring circuit . 13 5.2.3 Principle of measurement 13 5.2.4 Precaution to be observed . 13 5.2.5 Measurement procedure 14 5.2.6 Specified conditions 14 5.3 Output of the magnetic sensor section in a zero magnetic
21、 field environment 14 5.3.1 Purpose . 14 5.3.2 Measuring circuit . 14 5.3.3 Principle of measurement 16 5.3.4 Precaution to be observed . 16 5.3.5 Measurement procedure 16 5.3.6 Specified conditions 16 5.4 Cross axis sensitivity of the magnetic sensor section 16 5.4.1 Purpose . 16 5.4.2 Measuring ci
22、rcuit . 16 5.4.3 Measuring method 1 17 5.4.4 Measuring method 2 18 5.4.5 Specified conditions 19 BS EN 62047-19:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from I
23、HS-,-,-62047-19 IEC:2013 3 5.5 Sensitivity and offset of the acceleration sensor section 19 5.5.1 Purpose . 19 5.5.2 Measuring circuit . 20 5.5.3 Principle of measurement 20 5.5.4 Precaution of measurement . 21 5.5.5 Measurement procedure 21 5.5.6 Specified conditions 21 5.6 Frequency bandwidth of t
24、he magnetic sensor section (analogue output) 21 5.6.1 Purpose . 21 5.6.2 Measuring circuit . 21 5.6.3 Principle of measurement 22 5.6.4 Measurement procedure 23 5.6.5 Specified conditions 23 5.7 Current consumption . 23 5.7.1 Purpose . 23 5.7.2 Measuring circuit . 23 5.7.3 Principle of measurement 2
- 1.请仔细阅读文档,确保文档完整性,对于不预览、不比对内容而直接下载带来的问题本站不予受理。
- 2.下载的文档,不会出现我们的网址水印。
- 3、该文档所得收入(下载+内容+预览)归上传者、原创作者;如果您是本文档原作者,请点此认领!既往收益都归您。
下载文档到电脑,查找使用更方便
10000 积分 0人已下载
下载 | 加入VIP,交流精品资源 |
- 配套讲稿:
如PPT文件的首页显示word图标,表示该PPT已包含配套word讲稿。双击word图标可打开word文档。
- 特殊限制:
部分文档作品中含有的国旗、国徽等图片,仅作为作品整体效果示例展示,禁止商用。设计者仅对作品中独创性部分享有著作权。
- 关 键 词:
- BSEN62047192013SEMICONDUCTORDEVICESMICROELECTROMECHANICALDEVICESELECTRONICCOMPASSES 半导体器件 微型 机电 装置 电子

链接地址:http://www.mydoc123.com/p-578089.html