BS EN 143002-1984 Specification for harmonized system of quality assessment for electronic components - Blank detail specification directly heated negative temperature coefficient .pdf

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1、BRITISH STANDARD BS EN 143002:1992 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Directly heated negative temperature coefficient thermistors (Beads in envelopes) The European Standard EN143002:1991 has th

2、e status of a British StandardBSEN143002:1992 BSI 02-2000 ISBN 0 580 35543 8 Amendments issued since publication Amd. No. Date of issue Comments 7379 December 1992 Indicated by a sideline in the marginBSEN143002:1992 BSI 02-2000 i Contents Page National foreword ii Foreword iii Text of CECC 43002 1B

3、SEN143002:1992 ii BSI 02-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee CECC43002: “Blank detail specification: Directly heated negative temperature coef

4、ficient thermistors (Beads in envelopes).” This standard is a harmonized specification within the CECC system. In 1991 the CENELEC Electronic Components Committee (CECC) accepted CECC43002:1983 as European Standard EN143002:1991. Terminology and conventions The text of the CECC specification has bee

5、n approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Attention is especially drawn to the following. The comma has been used throughout as a decimal marker. In British Standard

6、s it is current practice to use a full point on the baseline as the decimal marker. Cross-references The British Standard harmonized with CECC00100 is BS9000 “General requirements for a system for electronic components of assessed quality”. Scope This standard lists the ratings, characteristics and

7、inspection requirements which shall be included as mandatory requirements in accordance with BS CECC43000. Detail specification layout In the event of conflict between the requirements of this specification and the provisions of BS9000 the latter shall take precedence except that the front page layo

8、ut will be in accordance with BS9000 Circular Letter No15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from l

9、egal obligations. International Standard Corresponding British Standard CECC 43000:1982 BS CECC 43000:1982 Harmonized system of quality assessment for electronic components: Generic specification: Directly heated negative temperature coefficient thermistors (Identical) IEC 68-2-20A:1970 BS 2011: Bas

10、ic environmental testing procedures: Part 2.1Tb:1977 Test Tb Resistance to soldering heat (Identical) IEC 410:1973 BS 6001:1972 Sampling procedures and tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i

11、and ii, theEN title page, page 2, the CECC title page, pages ii to iv, pages 1 to 9 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENN

12、E EUROPISCHE NORM EN 143002 October 1991 UDC: Descriptors: Quality, electronic components, thermistors English version Blank Detail Specification: Directly heated negative temperature coefficient thermistors (Beads in envelopes) Spcification Particulire Cadre: Thermistances coefficient de temprature

13、 ngatif chauffage direct (perles sous enveloppe) Vordruck fr Bauartspezifikation: Direkt geheizte temperaturabhngige Widerstnde mit negativen Temperatur- Koeffizienten (Perlen in Gehusen) This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on14October1991. The t

14、ext of this standard consists of the text of CECC43002 Issue1 1983 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alterat

15、ion. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language

16、made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greec

17、e, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnic

18、al Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991 Copyright reserved to CENELEC members Ref. No. EN 143002:1991 E2 blankEN143002:1991 ii BSI 02-2000 Contents Page Foreword

19、iii 1 Ratings and characteristics 2 2 Marking 3 3 Related documents 3 4 Ordering information 3 5 Certified test records 3 6 Additional information 3 Table 1 2 Table 2 4EN143002:1991 BSI 02-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of t

20、he European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of specifications and quality assessment procedures for

21、electronic components, and by the grant of an internationally recognised Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC and has been prepared

22、 for those countries taking part in the System who wish to issue national harmonized specifications for DIRECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS. It should be read in conjunction with document CECC00100: Basic Rules (1974). Preface This blank detail specification was prepared by

23、CECC Working Group4: “RESISTORS”. It is one of a series of blank detail specifications for directly heated negative temperature coefficient thermistors, all relating to the generic specification CECC43000. Voting The text of this blank detail specification was circulated to the CECC for voting in th

24、e documents listed below and was ratified by the President of the CECC for printing as a CECC Specification: Document Date of Vote Report on the Voting CC(Secretariat)884 April 1980 CECC(Secretariat)996iv blankEN143002:1991 BSI 02-2000 1 Key for page 1 The numbers between square brackets on page2 co

25、rrespond to the following indications which shall be given: Identification of the detail specification (DS) 1 The name of the National Standards Institution under whose authority the detail specification (DS) is published and, if applicable, the organization from whom the DS is available. 2 The CECC

26、 symbol and the number allotted to the DS by the CECC General Secretariat. 3 The number and issue number of the CECC generic or sectional specification as relevant; also national reference if different. 4 If different from the CECC number, the national number of the DS, date of issue and any further

27、 information required by the national system, together with any amendment numbers. Identification of the thermistor 5 A short description of the type of thermistor. 6 Information on typical construction (where applicable). 7 Outline drawing with main dimensions which are of importance for interchang

28、eability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered, or, preferably, the level of quality assessment covered by the detail specification.

29、 9 Reference data on the most important properties, to allow comparison between the various thermistor types. For 5 and 6 the text to be given in the DS should be suitable for an entry in CECC00200 (QPL) or CECC00300.EN143002:1991 2 BSI 02-2000 NOTE 1Other shapes are permitted within the dimensions

30、given. NOTE 2The non-dimensioned details do not affect the performance of the device. NOTE 3The leads are (not) suitable for soldering. NOTE 4The leads are (not) suitable for printed wiring applications. 1 Ratings and characteristics Specification available from:- 1 CECC 43002 - XXX 2 Page of 4 ELEC

31、TRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: 3 Outline and dimensions:- (See Table 1) (First angle projection) 7 DIRECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS 5 BEADS IN ENVELOPES 6 INSULATED/NON-INSULATED HUMIDITY PROOF/NON-HUMIDITY PROOF Reference temperature: - C ASSES

32、SMENT LEVEL “S” 8 Table 1 9 Style B-value -/- aRange of rated resistance values Rated dissipation (W) Dissipation Factor Time Constant Dimensions (mm) Body Terminations R min R max L D l d a Values shall be chosen from the E-series of IEC 63. Where the use of intermediate values is essential, they s

33、hall be chosen from a series in that document. Information about manufacturers who have components qualified to this detail specification is available in the current CECC00200: Qualified Products List Standard selection tolerances - % Climatic category -/-/- Bump or Shock 4000 bumps at 390 m/s 2(133

34、3 in each of3directions). 490 m/s 2 , 11 ms, half sine wave Vibration 10 Hz to 55 Hz or 10 Hz to 500 Hz 0,75 mm or 98 m/s 2 . (whichever is the less severe) Limit of resistance change after1000 h endurancetest - % B-value tolerance - %EN143002:1991 BSI 02-2000 3 1.1 Derating Thermistors covered by t

35、his specification are derated according to: (Derating curve to be included in the detail specification) 2 Marking The marking of the component and package shall be in accordance with the requirements of2.4 ofCECC43000. (If the thermistor is so small that it cannot be marked this shall be stated in t

36、he detail specification). 3 Related documents National Authorized Institutions (ONH) will complete this section, making reference to any documents, recommendations or specifications directly referred to in their national equivalent of this document. 4 Ordering information Orders for thermistors cove

37、red by this specification shall contain the following information: Resistance value Tolerance B-value Style and national specification number of this detail specification. 5 Certified test records National Authorized Institutions (ONH) shall indicate in this clause whether certified test records sha

38、ll be prepared in accordance with3.4 of CECC43000. 6 Additional information (not for inspection purposes) The detail specification may include information (which is not required to be verified by the inspection procedure), such as circuit diagrams, curves, drawings and notes for clarification of the

39、 detail specification. Inspection requirements (See Table 2) Drying clause is not applicable to thermistors manufactured in accordance with this detail specification. Resistance ratio (The ratio shall be specified if applicable). Resistance/temperature characteristic (The applicable temperatures and

40、 resistance tolerances shall be specified.) Proof voltage (insulated thermistors only) - V a.c. peak (Voltage to be applied in Sub-Groups B1, C2 and D1 for the voltage proof test.)EN143002:1991 4 BSI 02-2000 Table 2 (See Notes 1 and 2) Clause number and test Conditions of test IL AQL Performance req

41、uirements Group A Inspection 1,0 % To be conducted on a sampling basis, lot-by lot Sub-Group A1 (Non-destructive) II 4.3.1 Visual examination As in 4.3.1 4.3.2 Marking As in 4.3.2 Sub-Group A2 (Non-destructive) S-4 1,0 % 4.3.3 Dimensions (gauging) As specified in Table 1 Sub-Group A3 (Non-destructiv

42、e) II 1,0 % As in 4.4.3 4.4 Zero power resistance Measurement temperature - C Group B Inspection To be conducted on a sampling basis, lot-by-lot Sub-Group B1 (Not-destructive) S-3 1,0 % 4.7 Voltage proof (Insulated thermistors only) As in 4.7.4 Method 1 or Method 2 to be used Applied voltage: - V.a.

43、c. peak Sub-Group B2 (Destructive) S-3 2,5 % 4.13.1 Soldering solderability (Applicable only if Note 3 on page 2 states that the terminations are suitable for soldering) As in 4.13.1.1 The terminations shall be uniformly tinned Notes on page 9EN143002:1991 BSI 02-2000 5 Table 2 (See Notes 1, 2 and 3

44、) Clause number and test Conditions of test IL AQL Performance requirements Sub-Group B3 (Non-destructive) II 1,5 % 4.8 Resistance/temperature characteristic (This test is applicable only where resistance/temperature performance is specified other than as a tolerance on B-value.) See Ratings and Cha

45、racteristics for the temperatures and resistance tolerances to be used. As in 4.8.4 Sample size & criterion ofacceptability P n c Group C Inspection To be conducted on a sampling basis at the periodicity given in column “P” Sub-Group C1 (Non-destructive) 3 20 1 This Sub-Group is not: applicable if S

46、ub-Group B3 is performed. 4.5 B-value or resistance ratio T 1- C T 2- C The values shall be within the limits specified in the detail specification (See also 2.2.10 and 2.2.11 of CECC 43000 Sub-Group C2 (Destructive) 3 20 1 Half of the sample 4.12 Robustness of terminations Tensile, bending and tors

47、ion tests Visual examination As in 4.12.4 Zero-power resistance Temperature - C) %R: k - %R Notes on page 9EN143002:1991 6 BSI 02-2000 Table 2 (See Notes 1, 2 and 3) Clause number and test Conditions of test Sample size & criterion of acceptability Performance requirements P n c 4.13.2 Soldering Res

48、istance to soldering heat (The detail specification shall indicate whether Methods 1A or Method 1B of test Tb of IEC68 2-20A shall apply). Visual examination As in 4.13.2.3 Zero-power resistance (Temperature: - C) %R: k - %R Other half of the sample 4.14 Rapid change of temperature T A : Lower categ

49、ory temperature T B : Upper category temperature Visual examination As in 4.14.3 Zero-power resistance (Temperature: - C) %R: k - %R 4.15 Vibration Procedure: B4 Frequency range: - hz to - hz Amplitude: 0,75 mm or 98 m/s 2(whichever is the less severe) Sweep endurance: Total duration:6 h (See Note 4) Measurement during test Continuity There shall be no intermittency greater than 0, 5 ms Notes on page 9EN143002:1991 BSI 02-2000 7 Table 2 (See Notes 1 and 3