ASTM E801-2016 8408 Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices《电子设备射线检验质量控制的标准实施规程》.pdf
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1、Designation: E801 16Standard Practice forControlling Quality of Radiographic Examination ofElectronic Devices1This standard is issued under the fixed designation E801; the number immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of las
2、t revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S. Department of Defense.1. Scope1.1 This practice relates to the radiog
3、raphic examination ofelectronic devices for internal discontinuities, extraneousmaterial, missing components, crimped or broken wires, anddefective solder joints in cavities, in the encapsulatingmaterials, or the boards. Requirements expressed in thispractice are intended to control the quality and
4、repeatability ofthe radiographic images and are not intended for controllingthe acceptability or quality of the electronic devices imaged.NOTE 1Refer to the following publications for pertinent informationon methodology and safety and protection: Guides E94 and E1000, and“General Safety Standard for
5、 Installation Using Non-Medical X Ray andSealed Gamma Ray Sources, Energies Up to 10 MeV Equipment Designand Use,” Handbook No. 114.21.2 If a nondestructive testing agency as described inPractice E543 is used to perform the examination, the testingagency should meet the requirements of Practice E543
6、.1.3 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2. Referenced
7、Documents2.1 ASTM Standards:3E94 Guide for Radiographic ExaminationE543 Specification for Agencies Performing NondestructiveTestingE1000 Guide for RadioscopyE1255 Practice for RadioscopyE1316 Terminology for Nondestructive Examinations3. Terminology3.1 DefinitionsRefer to Terminology E1316, Section
8、D.4. Direction of Radiation4.1 When not otherwise specified, the direction of thecentral beam of radiation shall be as perpendicular (65%)aspossible to the surface of the film or detector.5. Image Quality Indicators (IQIs)5.1 The quality of all levels of radiographic examinationshall be determined b
9、y IQIs conforming to the followingspecifications:5.1.1 The IQIs shall be fabricated of clear acrylic plasticwith steel covers, lead spheres, gold or tungsten wires, and leadnumbers. The steel covers serve as shims.5.1.1.1 The IQIs shall conform to the requirements ofFig. 1.5.1.1.2 The IQIs shall be
10、permanently identified with theappropriate IQI number as shown in Fig. 1. The number shallbe affixed by mounting a 0.125-in. (3.18-mm) tall lead numberon the flat bottom of a 0.250-in. (6.35-mm) diameter hole. Theidentification number shall be located as shown in Fig. 1 andshall be of sufficient con
11、trast to be clearly discernible in theradiographic image.5.1.1.3 Each semiconductor IQI will have a serial numberpermanently etched or engraved on it. Each serial number willbe traceable to the calibration image supplied by the manufac-turer. The manufacturer shall radiograph the IQI with leadmarker
12、s identifying the serial number. See Fig. 2.6. Application of the Image Quality Indicator (IQI)6.1 The application of the IQIs shall be made in such amanner as to simulate as closely as possible the device beingexamined. To accomplish this objective, a set of eight IQIs isprovided. These provide a r
13、ange of cover thickness (of steelshim stock) that is radiographically equivalent to the range ofdevices from glass diodes or plastic-encapsulated circuits(number one) to large power or hybrid circuit devices (numbereight). Wire size increases with shim stock thickness because1This practice is under
14、the jurisdiction of ASTM Committee E07 on Nonde-structive Testing and is the direct responsibility of Subcommittee E07.01 onRadiology (X and Gamma) Method.Current edition approved Dec. 1, 2016. Published December 2016. Originallyapproved in 1981. Last previous edition approved in 2011 as E801 - 06(2
15、011). DOI:10.1520/E0801-16.2Available from National Institute of Standards and Technology (NIST), 100Bureau Dr., Stop 1070, Gaithersburg, MD 20899-1070, http:/www.nist.gov.3For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For An
16、nual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis international standard was developed in accordance with internationally
17、 recognized principles on standardization established in the Decision on Principles for theDevelopment of International Standards, Guides and Recommendations issued by the World Trade Organiziation Technical Barriers to Trade (TBT) Committee.1higher power devices that have thicker coverings normally
18、 uselarger interconnecting wires than small signal devices that usethin coverings. Particle size is normally independent of devicetype, so these remain constant.FIG. 1 Image Quality Indicator for Electron DevicesDimensions, in. (mm)a. 0.187 ( 4.750) f. 1.00 (25.40) k. 1.125 (28.575)b. 0.375 ( 9.525)
19、 g. 0.375 ( 9.525) l. 1.313 (33.350)c. 0.500 (12.700) h. 0.500 (12.700) m. 1.50 (38.10)d. 0.625 (15.875) i. 0.625 (15.875) n. 0.125 ( 3.175)e. 0.813 (20.650) j. 0.938 (23.825) p. 0.250 ( 6.350)Particle Diameter, in. (mm)G. 0.015(0.381) J. 0.006(0.152)H. 0.010(0.254) K. 0.004(0.102)I. 0.008(0.203) L.
20、 0.002(0.051)Shim and Wire SpecificationsIQINumberShimThickness, in. (mm)Wire Diameters, in. (mm)ABCDEF1 0 0.002 0.001 0.0005 0.0005 0.001 0.0020 (0.051) (0.025) (0.0127) (0.0127) (0.025) (0051)2 0.002 0.002 0.001 0.0005 0.0005 0.001 0.002(0.051) (0.051) (0.025) (0.0127) (0.0127) (0.025) (0.051)3 0.
21、005 0.002 0.001 0.0005 0.0005 0.001 0.002(0.127) (0.051) (0.025) (0.0127) (0.0127) (0.025) (0.051)4 0.007 0.002 0.001 0.0005 0.0005 0.001 0.0020.178 (0.051) (0.025) (0.0127) (0.0127) (0.025) (0.051)5 0.010 0.003 0.002 0.001 0.001 0.002 0.003(0.254) (0.076) (0.051) (0.025) (0.025) (0.051) (0.076)6 0.
22、015 0.003 0.002 0.001 0.001 0.002 0.003(0.381) (0.076) (0.051) (0.025) (0.025) (0.051) (0.076)7 0.025 0.005 0.003 0.002 0.002 0.003 0.005(0.635) (0.127) (0.076) (0.051) (0.051) (0.076) (0.127)8 0.035 0.005 0.003 0.002 0.002 0.003 0.005(0.889) (0.127) (0.076) (0.051) (0.051) (0.076) (0.127)NOTE 1Use
23、additional layers of shim material as required. The layers shall be 1 by 1.625 in. (25.4 by 41.275 mm). The additional shim material shallbe identified by the placement of lead numbers which denote the thickness immediately adjacent to the IQI during exposure, or as an alternative,documented on the
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