ASTM D6095-2012 red 9375 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation .pdf

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1、Designation: D6095 06 D6095 12 An American National StandardStandard Test Method forLongitudinal Measurement of Volume Resistivity forExtruded Crosslinked and Thermoplastic SemiconductingConductor and Insulation Shielding Materials1This standard is issued under the fixed designation D6095; the numbe

2、r immediately following the designation indicates the year oforiginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.1. Scope*1

3、.1 This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extrudedcrosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable.1.2 In common practice the conductor shield is often referred to as the strand shield

4、.1.3 Technically, this test method is the measurement of a resistance between two electrodes on a single surface and modifyingthat value using dimensions of the specimen geometry to calculate a resistivity. However, the geometry of the specimen is suchas to support the assumption of a current path p

5、rimarily throughout the volume of the material between the electrodes, thusjustifying the use of the term “longitudinal volume resistivity.” (See 3.1.2.1)1.4 Whenever two sets of values are presented, in different units, the values in the first set are the standard, while those inparentheses are for

6、 information only.1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibilityof the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatorylimitations prior to use

7、. For a specific hazard statement, see 7.1.2. Referenced Documents2.1 ASTM Standards:2D257 Test Methods for DC Resistance or Conductance of Insulating MaterialsD1711 Terminology Relating to Electrical InsulationD4496 Test Method for D-C Resistance or Conductance of Moderately Conductive Materials3.

8、Terminology3.1 Definitions of Terms Specific to This Standard:3.1.1 semiconducting, adjmoderately conductive, see Terminology D1711 and Test Method D4496.3.1.2 longitudinal volume resistivity, nan electrical resistance multiplied by a factor calculated from the geometry of aspecimen volume between e

9、lectrodes in contact with one, and only one, surface of the specimen.3.1.2.1 DiscussionIn normal wire and cable usage, the longitudinal volume resistivity is simply referred to as “volume resistivity.” This usage is atvariance with terminology in Test Methods D257, Terminology D1711, and Test Method

10、 D4496.1 This test method is under the jurisdiction of ASTM CommitteeD09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.18 on Solid Insulations, Non-Metallic Shieldings and Coveringsfor Electrical and Telecommunication Wires and Cables.Current ed

11、ition approved April 1, 2006Nov. 1, 2012. Published April 2006No-vember 2012. Originally approved in 1997. Last previous edition approved in20052006 as D609505.06. DOI: 10.1520/D6095-06.10.1520/D6095-12.2 For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Se

12、rvice at serviceastm.org. For Annual Book of ASTMStandards volume information, refer to the standards Document Summary page onthe ASTM website.*A Summary of Changes section appears at the end of this standardCopyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 1942

13、8-2959. United States14. Significance and Use4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety,static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compoun

14、ds.Also see Test Method D4496.5. Apparatus5.1 See Test Method D4496 for a description of the apparatus, except the electrode system which is described in 7.2.6. Sampling and Test Specimens6.1 Take one 2-ft (600-mm) sample from each lot, or from each 25000 ft (7600 m) of completed cable, whichever is

15、 less.6.2 The specimen consists of a 10 in. (250 mm) length of cable core with all layers external to the semi-conducting insulationshield removed. Use this specimen to test the insulation shield. To test the conductor shield, bisect the sample longitudinally andremove the conductor. Use only one pi

16、ece of the conductor shield as the test specimen.6.3 Condition the specimens in accordance with Test Method D4496.6.3.1 If the shielding materials are crosslinked, condition the cable core (jacket removed) overnight at 50C to eliminate anyacetophenone that may beis potentially present. Then proceed

17、with the conditioning in accordance with Test Method D4496.7. Procedure7.1 WarningThoroughly instruct all operators as to the correct procedures for performing tests safely.7.2 Apply an electrode system consisting of four annular bands of silver paint approximately 0.25 in. (6.5 mm) wide to theinsul

18、ation shield. There must be a distance of at least 2 in. (50 mm) of shield between the potential electrodes (the two inner bands)and a distance of 1 in. of shield between the current electrodes (the outer bands) and the potential electrodes. See Annex A1 ofTest Method D4496.7.3 For measurement of th

19、e conductor shield, bisect the sample longitudinally and remove the conductor. Then, using only onepiece of the bisected shield, apply the silver paint electrode system as described in 7.2 only to the conductor shield.7.4 Condition the specimen for 1 h at the rated operating temperature of the cable

20、 to ensure thermal equilibrium of the specimen.7.5 Determine the resistance between the potential electrodes of the test specimen using a direct test voltage and a measuringsystem meeting the requirements of Test Method D4496. Make two measurements, one at 23 6 2C (73 6 4F) and one at therated opera

21、ting temperature of the insulation material. See the procedure and Appendix X1 of Test Method D4496 concerning theprevention of specimen self-heating. Limiting the power to 100 mW and the test time to 1 min is recommended.7.6 When a high degree of accuracy is not required, use a two-electrode method

22、 employing any technique that permits theresistance to be measured with an accuracy of 65 %. Space the electrodes at least 2 in. (50 mm) apart. Make two tests, one at 236 2C (73 6 4F) and one at the rated operating temperature of the insulation material.8. Calculation8.1 For each shielding material

23、and each temperature, calculate the volume resistivity by using the following equations:Insulation Shielding:52RDb22d b2!#/L (1)Conductor Shielding:5R Da 22da2!#/L (2)where: = volume resistivity, -cm,R = measured resistance, ,L = distance between potential electrodes, in.,Da = diameter over conducto

24、r shielding, in.,da = diameter over conductor, in.,Db = diameter over insulation shielding, in., anddb = diameter over insulation, in.NOTE 1Even though the dimensions are measured in inches, the value of the volume resistivity is reported in -cm. This is because not all constantsand conversion facto

25、rs are shown in Eq 1 and Eq 2. See Appendix X1 for a discussion on the derivation of the formulas.9. Report9.1 Report the following information:9.1.1 Sample conditioning time and temperature,D6095 1229.1.2 The volume resistivity, -cm, of the conductor shielding material at 23 6 2C,9.1.3 The volume r

26、esistivity, -cm, of the conductor shielding material at the temperature rating of the insulation,9.1.4 The volume resistivity, -cm, of the insulation shielding material at 23 6 2C,9.1.5 The volume resistivity, -cm, of the insulation shielding material at the temperature rating of the insulation, and

27、9.1.6 The electrode system used.10. Precision and Bias10.1 PrecisionThis test method has been in use for many years, but no statement for precision has been made and no activityis planned to develop such a statement.10.2 BiasA statement of bias is not possible due to a lack of a standard reference m

28、aterial.11. Keywords11.1 conductor shield; conductor shielding material; insulation shield; insulation shielding material; moderately conductive;semiconducting shielding materials; semiconducting shields; volume resistivity of shielding materialsAPPENDIX(Nonmandatory Information)X1. DERIVATION OF FO

29、RMULAS FOR VOLUME RESISTIVITYX1.1 Insulation Shielding Material X1.1 Fig. X1.15R A/L! (X1.1)A 5piD2!/4#2pid 2!/4#5piD22d2!#/4 (X1.2)5R piD 22d2!#/4L (X1.3)where: = volume resistivity, -cm,R = measured resistance, ,D = diameter over insulation shielding, in.,d = diameter over insulation, in., andL =

30、distance between potential electrodes, in.X1.1.1 In Eq X1.3, substituting the numerical value for pi and converting the values in inches to centimetres results in Eq X1.4which is the same as Eq 1 in 8.1 which gives the volume resistivity in the customary units of -cm.52R D22d2!#/L (X1.4)X1.2 Conduct

31、or Shielding Material X1.2 Fig. X1.25RA/L! (X1.5)A 5$piD2!/4#2pid 2!/4#%/25$piD22d2!# /8 (X1.6)5R piD 22d2!#/8L (X1.7)where:FIG. X1.1 Insulation ShieldD6095 123 = volume resistivity, -cm,R = measured resistance, ,D = diameter over conductor shielding, in.,d = diameter over conductor, in., andL = dis

32、tance between potential electrodes, in.X1.2.1 In Eq X1.7, substituting the numerical value for pi and converting the values in inches to centimetres results in Eq X1.8which is the same as Eq 2 in 8.1 which gives the volume resistivity in the customary units of -cm.5R D22d2!#/L (X1.8)SUMMARY OF CHANG

33、ESCommittee D09 has identified the location of selected changes to this test method since the last issue,D6095 06, that may impact the use of this test method. (Approved Nov. 1, 2012)(1) Revised section 6.3.1.SUMMARY OF CHANGESCommittee D09 has identified the location of selected changes to this tes

34、t method since the last issue,D6095 05, that may impact the use of this test method. (Approved April 1, 2006)(1) Revised paragraph 1.5.(1) Revised paragraph 1.5.(2) Revised paragraphs 3.1.2 and 3.1.2.1.(2) Revised paragraphs 3.1.2 and 3.1.2.1.ASTM International takes no position respecting the valid

35、ity of any patent rights asserted in connection with any item mentionedin this standard. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the riskof infringement of such rights, are entirely their own responsibility.This standard is subje

36、ct to revision at any time by the responsible technical committee and must be reviewed every five years andif not revised, either reapproved or withdrawn. Your comments are invited either for revision of this standard or for additional standardsand should be addressed to ASTM International Headquart

37、ers. Your comments will receive careful consideration at a meeting of theresponsible technical committee, which you may attend. If you feel that your comments have not received a fair hearing you shouldmake your views known to the ASTM Committee on Standards, at the address shown below.This standard

38、 is copyrighted by ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959,United States. Individual reprints (single or multiple copies) of this standard may be obtained by contacting ASTM at the aboveaddress or at 610-832-9585 (phone), 610-832-9555 (fax), or serviceastm.org (e-mail); or through the ASTM website(www.astm.org). Permission rights to photocopy the standard may also be secured from the ASTM website (www.astm.org/COPYRIGHT/).FIG. X1.2 Conductor ShieldD6095 124