ANSI IEEE C57.13.2-2005 Standard Conformance Test Procedures for Instrument Transformers《仪表用变压器标准合格测试程序》.pdf

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1、IEEE Std C57.13.2-2005(Revision of IEEE Std C57.13.2-1991)C57.13.2TMIEEE Standard Conformance TestProcedure for Instrument Transformers3 Park Avenue, New York, NY 10016-5997, USAIEEE Power Engineering SocietySponsored by theTransformers Committee29 September 2005Print: SH95355PDF: SS95355The Institu

2、te of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2005 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 29 September 2005. Printed in the United States of America.IEEE is a registered trademark in the U.S.

3、 Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.NOTEAttention is called to the possibility that implementation of this standard may require use of subjectmatter covered by pa

4、tent rights. By publication of this standard, no position is taken with respect to theexistence or validity of any patent rights in connection therewith. The IEEE shall not be responsible foridentifying patents for which a license may be required by an IEEE standard or for conducting inquiries into

5、thelegal validity or scope of those patents that are brought to its attention.iiiCopyright 2005 IEEE. All rights reserved.IntroductionThis document was developed originally by the High Voltage Apparatus Coordinating Committee(HVACC) of the American National Standards Institute. When the HVACC was di

6、sbanded, theTransformers Committee of the IEEE Power Engineering Society assumed responsibility for themaintenance of this document.This revision of IEEE Std C57.13.2-1991 has been modified to conform with the latest revision of IEEE StdC57.13TM-1993 and applies to those instrument transformers used

7、 for measurements and control functionson 60 Hz primary systems with voltages from 600 V through 38 kV. The application range was broadenedby reducing the number of restrictions. The original intent of this document, which was to provide a standardfor the evaluation and conformance certification of

8、instrument transformers, remains unchanged by itstransfer in IEEE.Notice to usersErrataErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically

9、.InterpretationsCurrent interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this standard may require use of subject mattercovered by patent rights. By publication of this s

10、tandard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the l

11、egal validity or scope of those patents that are brought to its attention.This introduction is not part of IEEE Std C57.13.2-2005, IEEE Standard Conformance Test Procedure forInstrument Transformers.ivCopyright 2005 IEEE. All rights reserved.ParticipantsThe following is a list of participants in the

12、 Conformance Test Procedure for Instrument TransformersWorking Group. Vladimir Khalin, ChairThe following members of the individual balloting committee voted on this standard. Balloters may havevoted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on

13、 9 June 2005, it had the followingmembership:Don Wright, ChairSteve M. Mills, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookson, NIST Repr

14、esentativeJennie SteinhagenIEEE Standards Project EditorRoy A. Colquitt, Jr.Rolando GomezMichael HaasAnthony JonnattiRoss McTaggartPaul MillwardTom NelsonPierre RiffonJames SmithChris Ten HaagenDavid AhoW. J. BergmanThomas BlairAlain BolligerJeffrey BrittonCarl BushDonald CashRoy A. Colquitt, Jr.Tom

15、my CooperJerry CorkranAlan CoteR. DaubertMatthew DavisPaul DrumAmir El-SheikhGary EngmannJorge Fernandez-DaherMarcel FortinWilliam George FosseyRobert GanserRandall GrovesRobert GrunertBal GuptaMichael HaasKenneth HanusAjit HiranandaniEdward Horgan, Jr.James Huddleston IIIAnthony JonnattiGael R. Ken

16、nedyVladimir KhalinSaumen KunduJohn LazarBoyd LeuenbergerGregory LuriAl MaguireJohn MatthewsNigel McQuinRoss McTaggartG. MichelRandolph MullikinJerry MurphyJeffrey NelsonDhiru PatelPaulette PayneCarlos PeixotoHoward PenroseDinesh Pranathy SankarakurupJohannes RickmannMichael A. RobertsJames Ruggieri

17、Pierre RuptinRobert SeitzDevki SharmaStephen ShullChris ShultzH. Jin SimChuck SimmonsTarkeshwar SinghDaniel SlomovitzJames SmithChris Ten HaagenRao ThallamJohn VandermaarJane Ann VernerJames WilsonWaldemar ZiomekChuck AdamsStephen BergerMark D. BowmanJoseph A. BruderBob DavisRoberto de Marca Boisson

18、Julian Forster*Arnold M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenDoug ToppingJoe D. WatsonContents

19、1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 1 3. Definitions 2 4. Selection of the transformer for conformance testing. 2 5. Basis for conformance 2 6. Treatment of failures within test sequence . 3 7. Tests . 3 7.1 Impulse tests 3 7.2 Voltage withstand tests 3 7.3 Accuracy 3 7

20、.4 Temperature rise 4 7.5 Mechanical rating test 4 8. Insulation systems acceptance 5 9. Production monitoring 5 Annex A (informative) Bibliography . 6 vCopyright 2005 IEEE. All rights reserved. IEEE Standard Conformance Test Procedure for Instrument Transformers 1. 1.11.2a) b) c) d) 2. Overview Sco

21、pe This standard describes the tests and documentary requirements for conducting a conformance test on instrument transformers. Purpose The purpose of this standard is to cover conformance test requirements for current and inductively coupled voltage transformers used for measurements and control fu

22、nctions on 60 Hz primary systems with voltages from 600 V through 38 kV. This standard does not specifically cover the following: Installation in ships, watercraft, railway rolling stock, aircraft, or automotive vehicles other than mobile homes and recreational vehicles Installations underground in

23、mines Installations of railways for generation, transformation, transmission, or distribution of power used exclusively for operation of rolling stock, or installations used exclusively for signaling and communication purposes Installations of communication equipment under the exclusive control of c

24、ommunication utilities, located outdoors or in building spaces used exclusively for such installations Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the lat

25、est edition of the referenced document (including any amendments or corrigenda) applies. 1 Copyright 2005 IEEE. All rights reserved. IEEE Std C57.13.2-2005 IEEE Standard Conformance Test Procedure for Instrument Transformers IEEE Std C57.13-1993, IEEE Standard Requirements for Instrument Transformer

26、s.1,2IEEE Std C57.12.80, IEEE Standard Terminology for Power and Distribution Transformers. ANSI/UL 1446, Standard for Systems of Insulating MaterialsGeneral.33.4.5.Definitions For the purposes of this standard, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standard

27、s Terms B1,4as well as IEEE Std C57.12.805, should be referenced for terms not defined in this clause. 3.1 conformance tests: Certain performance tests used to demonstrate compliance with the applicable standards. The test specimen is normally subjected to all planned routine tests prior to initiati

28、on of the conformance test program. NOTEThe conformance tests may, or may not, be similar to certain design tests. Demonstration of margin (capabilities beyond the standard) is not required.6Selection of the transformer for conformance testing Representative samples shall be chosen jointly by the co

29、ncerned parties and shall represent the typical commercial product of the manufacturer. Five current or voltage transformers shall be tested, except for the case of unusual or infrequently used types in which a smaller number that is acceptable to the certifying agency may be taken to be representat

30、ive of the type. (The certifying agency may be the manufacturer.) The sample shall be selected as to be representative of the range of ratios to be certified as conforming. Basis for conformance A transformer type shall be in conformance with the standards listed when each current or voltage transfo

31、rmer withstands all insulation tests specified in 7.1 and 7.2, meets the requirements for both accuracy and temperature rise tests specified in 7.3 and 7.4, and meets the requirements for mechanical rating tests specified in 7.5. The failure of a transformer to meet the requirements of the accuracy,

32、 temperature-rise, or mechanical rating tests shall be cause to reject that rating and other ratings represented by the sample. Such rejection shall not preclude the conformance of the type in other ratings that have different design characteristics and that do meet all test requirements. 1IEEE publ

33、ications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 2The IEEE standards or products referred to in this annex are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 3ANSI

34、 publications are available from the Sales Department, American National Standards Institute, 25 West 43rd Street, 4th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 4The numbers in brackets correspond to those of the bibliography in Annex A. 5Information on references can be found in Clause

35、2. 6Notes in text, tables, and figures are given for information only and do not contain requirements needed to implement the standard. 2 Copyright 2005 IEEE. All rights reserved. IEEE Std C57.13.2-2005 IEEE Standard Conformance Test Procedure for Instrument Transformers 6.7. 7.17.27.37.3.17.3.27.3.

36、2.1a) b) c) d) Treatment of failures within test sequence Failures occurring during conformance testing should be evaluated, and corrections should be made before any re-testing is carried out. A design change made to a transformer to correct a failure within a test sequence shall be evaluated for i

37、ts effect on any preceding sequence. Tests Conformance tests shall consist of the following tests performed in the sequence shown on each transformer selected for tests. Impulse tests Impulse tests shall be made as specified in 8.8.5 of IEEE Std C57.13 and at the test levels indicated for the transf

38、ormer BIL in Table 2 of IEEE Std C57.13-1993. Voltage withstand tests Voltage withstand tests of primary windings to grounded secondary windings and parts, including metallic case, frame, base, nameplate, mounting facilities, and the core (if accessible), shall be made as specified in 8.8.3 of IEEE

39、Std C57.13-1993 and the values indicated in Table 2 of IEEE Std C57.13-1993. Accuracy Metering accuracy of current transformers Metering accuracy test shall be made per 8.1 of IEEE Std C57.13-1993. The transformers shall be demagnetized and then tested at 10% and 100% of rated primary current and wi

40、th a primary current equal to the rated current multiplied by the continuous thermal current rating factor. Tests shall be made with the minimum and maximum standard metering burdens for which the manufacturer assigns the same metering accuracy class. In the case of dual ratio and multi-ratio transf

41、ormers, tests shall be made to verify the accuracy at all ratios assigned accuracy ratings by the manufacturer and to verify the ratio of each tap. Relaying accuracy of current transformers Relay accuracy classes assigned by the manufacturer shall be verified in 7.3.2.1 and 7.3.2.2. Transformers ass

42、igned “C” classification Check ratio per 8.1 of IEEE Std C57.13-1993. Measure resistance of the secondary winding. Test excitation current per 8.3.2 of IEEE Std C57.13-1993. Using data from (b) and (c), calculate relay accuracy per 8.1.10 of IEEE Std C57.13-1993 to verify that the transformers meets

43、 the requirements of 6.4 of IEEE Std C57.13-1993. 3 Copyright 2005 IEEE. All rights reserved. IEEE Std C57.13.2-2005 IEEE Standard Conformance Test Procedure for Instrument Transformers 7.3.2.27.3.37.47.4.17.4.27.5Transformers assigned “T” classification These transformers shall be tested per 8.1 of

44、 IEEE Std C57.13-1993 to verify that the relay accuracy requirements of 6.4 of IEEE Std C57.13-1993 are met. Accuracy of voltage transformers The transformers shall be tested at 90% and 100% of rated voltage with zero burden and at 110% of rated voltage at the maximum burden for which an accuracy cl

45、ass is assigned by the manufacturer. Accuracy at other burdens may be determined by test or by calculation, as specified in 8.1.12 of IEEE Std C57.13-1993. The accuracy at 90% and 110% of the rated voltage at any burden may be determined by applying the ratio and phase angle differentials determined

46、 in the zero burden test to the accuracy for that burden at 100% of rated voltage. Temperature rise Temperature risecurrent transformers Each transformer shall be tested with a primary current equal to the rated current multiplied by the continuous thermal current rating factor. The temperature rise

47、 tests shall be made in accordance with 8.7 of IEEE Std C57.13-1993, and the temperature rise for continuous operation shall not exceed the limits in Table 4 of IEEE Std C57.13-1993. In case of a dual ratio or multi-ratio transformer, the temperature tests should be made at the primary rating that p

48、roduces the greatest temperature rise. Temperature risevoltage transformers Each voltage transformer shall be tested with 100% of rated primary voltage at the thermal burden rating assigned by the manufacturer. The temperature rise tests shall be made in accordance with 8.7 of IEEE Std C57.13-1993 a

49、nd the temperature rise for continuous operation shall not exceed the limits specified in Table 4 of IEEE Std C57.13-1993. In the case of a dual ratio or multi-ratio transformer, the temperature tests should be made at the primary rating that produces the greatest temperature rise. Mechanical rating test The test to demonstrate the short-time mechanical current rating of a wound current transformer (excluding window and bar type) shall be made by subjecting the current transformer, with secondary winding short-circuited, to at least one peak of a prim