ANSI IEEE 1308-1994 Recommended Practice for Instrumentation Specifications for Magnetic Flux Density and Electric Field Strength Meters 10 Hz to 3 kHz《10Hz-3KHz磁通密度检测仪表和电场强度计的推荐实施.pdf

《ANSI IEEE 1308-1994 Recommended Practice for Instrumentation Specifications for Magnetic Flux Density and Electric Field Strength Meters 10 Hz to 3 kHz《10Hz-3KHz磁通密度检测仪表和电场强度计的推荐实施.pdf》由会员分享，可在线阅读，更多相关《ANSI IEEE 1308-1994 Recommended Practice for Instrumentation Specifications for Magnetic Flux Density and Electric Field Strength Meters 10 Hz to 3 kHz《10Hz-3KHz磁通密度检测仪表和电场强度计的推荐实施.pdf（48页珍藏版）》请在麦多课文档分享上搜索。

1、IEEE Std 1308-1994 IEEE Recommended Practice for g44g81g86g87g85g88g80g72g81g87g68g87g76g82g81g29g3g54g83g72g70g76g191g70g68g87g76g82g81g86g3g73g82g85g3Magnetic Flux Density and Electric Field Strength Meters10 Hz to 3 kHz IEEE Power Engineering Society Sponsored by theTransmission and Distribution

2、Committee IEEE3 Park Avenue New York, NY 10016-5997, USA 19951308TMIEEE Std 1308-1994(R2010) IEEE Recommended Practice for Instrumentation: Specifications for Magnetic Flux Density and Electric Field Strength Meters10 Hz to 3 kHz Sponsor Transmission and Distribution Committee of the IEEE Power Engi

3、neering Society Approved 13 December 1994 Reaffirmed 30 September 2010 IEEE-SA Standards Board Approved 10 July 1995 Reaffirmed 11 August 2011 American National Standards Institute Abstract: Specifications that should be provided to characterize instrumentation used to measure the steady state rms v

4、alue of magnetic and electric fields with sinusoidal frequency content in the range 10 Hz to 3 kHz in residential and occupational settings as well as in transportation systems are identified. The instrumentation, recommended calibration methods, and sources of measurement uncertainty are also descr

5、ibed. Keywords: calibration, electric field strength meters, magnetic flux density, measurements, measurement uncertainty, quasi-static fields, specifications The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1995 by The Institut

6、e of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1995. Printed in the United States of America. (2nd Printing, February 1, 2010. Style-related corrections made to equations (5) and (9) and to math and variables on pages 10, 15, 22, and 31. Front cover and frontmatter up

7、dated.) ISBN 1-55937-513-2 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of t

8、he IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunte

9、ers are not necessarily members of the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information con

10、tained in its standards. Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or

11、 reliance upon this, or any other IEEE Standard document. The IEEE does not warrant or represent the accuracy or content of the material contained herein, and expressly disclaims any express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or

12、that the use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “AS IS.” The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the

13、 scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every

14、five years for revision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they hav

15、e the latest edition of any IEEE Standard. In publishing and making this document available, the IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person or entity to anothe

16、r. Any person utilizing this, and any other IEEE Standards document, should rely upon the advice of a competent professional in determining the exercise of reasonable care in any given circumstances. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as

17、they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has a

18、lso received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal considerat

19、ion. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position, explanation, or interpretation of the IEEE. Comme

20、nts for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Comments on standards and requests for int

21、erpretations should be addressed to: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Authorization to photocopy portions of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc., provided that the appr

22、opriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom u

23、se can also be obtained through the Copyright Clearance Center. iii Copyright 1994 IEEE. All rights reserved. Introduction (This introduction is not part of IEEE Std 1308-1994, IEEE Recommended Practice for Instrumentation: Specifications for Magnetic Flux Density and Electric Field Strength Meters-

24、10 Hz to 3 kHz.) This recommended practice identifies instrument specifications that should be provided to characterize field meters that are used to measure the root-mean-square (rms) values of electric and magnetic fields in residences, the work place, and transportation systems. Because of recent

25、 interest in power frequency and other extremely low frequency fields in the above environments, and because of the growing number of commercially available field meters, a need has developed for establishing specifications for instrumentation used to measure fields in the various mentioned settings

26、. In addition to identifying field meter specifications that should be provided, this document includes descriptions of instrumentation, recommends methods of calibration, describes sources of measurement uncertainty, and provides guidance on determining total uncertainty. As noted in 1.2 of the Ove

27、rview, while field meter specifications are identified, specific frequencies and field levels that should be used for calibration purposes and limits on measurement uncertainty are not recommended in this document. Rather, it is left to standards that describe measurement protocols for the different

28、 environments to indicate specific calibration points and uncertainty requirements. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL f

29、or errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by

30、 patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implement

31、an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. iv Copyright 1994 IEEE. All rights reserved. Participants The working group draft was prepared by the AC Magnetic Fields Task Force of the AC Fields Working Group (R. G.

32、Olsen, Chair) of the Corona and Field Effects Subcommittee of the Transmission and Distribution Committee. The Task Force had the following membership: M. Misakian, Chair K. Bell T. D. Bracken R. E. Carberry V. L. Chattier R. Conti D. W. Deno F. M. Dietrich G. Gela K.C. Jaffa G. B. Johnson P. S. Mar

33、uvada S. J. Maurer T. M. McDermott R. C. Mukherji J. C. Niple R. G. Olsen G. B. Rauch S. Rodick S. A. Sebo C. H. Shih J. M. Silva J. R. Stewart J. M. Van Name P. S. Wong L. E. Zaffanella The following individuals reviewed and contributed comments: E. Aslan T. B. Lynn G. Miller H. Bassen I. Walker Th

34、e following persons were on the balloting list: J. E. Applequist J. F. Buch J. J. Burke V. L. Chartier F. A. Denbrock W. E. Feero G. Gela I. S. Grant J. G. Kappenman G. G. Karady N. Kolcio P. S. Maruvada T. J. McDermott F. D. Myers S. L. Nilsson R. C. Peters R. J. Piwko W. E. Reid D. Reisinger B. R.

35、 Shperling J. M. Silva J. R. Stewart J. M. Van Name F. S. Young When the IEEE Standards Board approved this recommended practice on December 13, 1994, it had the following membership: Wallace S. Read, Chair Donald C. Loughry, Vice Chair Andrew G. Salem, Secretary Gilles A. Baril Bruce B. Barrow Jos

36、A. Berrios de la Paz Clyde R. Camp James Costantino Stephen L. Diamond Donald C. Fleckenstein Jay Forster* Ramiro Garcia Donald N. Heirman Richard J. Holleman Jim Isaak Ben C. Johnson Sonny Kasturi Lorraine C. Kevra E. G. “Al” Kiener Ivor N. Knight Joseph L. Koepfinger* D. N. “Jim” Logothetis L. Bru

37、ce McClung Marco W. Migliaro Mary Lou Padgett Arthur K. Reilly Ronald H. Reimer Gary S. Robinson Leonard L. Tripp * Member Emeritus Also included are the following nonvoting IEEE Standards Board liaisons: Satish K. Aggarwal James Beall Richard B. Engelman Robert E. Hebner Rochelle L. Stern IEEE Stan

38、dards Project Editor v Copyright 1994 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 General 2 2. References 2 3. Definitions 3 4. General characteristics of magnetic and electric fields. 5 5. Magnetic flux density meters (magnetic field meters) . 8 5.1 General characteristics o

39、f magnetic field meters . 8 5.2 Theory of operation (coil probes) 10 5.3 Calibration methods for magnetic field meters 12 5.4 Sources of measurement uncertainty . 14 5.5 Calibration procedure and specifications for magnetic field meters 17 5.6 Measurement uncertainty. 19 6. Electric field strength m

40、eters (electric field meters). 20 6.1 General characteristics of electric field meters 20 6.2 Theory of operation . 21 6.3 Calibration methods for electric field meters. 25 6.4 Sources of measurement uncertainty . 28 6.5 Calibration procedure and specifications for electric field meters. 32 6.6 Meas

41、urement uncertainty. 34 7. Desirable field meter characteristics. 34 7.1 Electrical characteristics 34 7.2 Physical characteristics 34 Annex A (informative) DC magnetic field instrumentation.36 Annex B (informative) Units and conversion factors. 37 Annex C (informative) Bibliography 39 1 Copyright 1

42、994 IEEE. All rights reserved. IEEE Recommended Practice for Instrumentation: Specifications for Magnetic Flux Density and Electric Field Strength Meters10 Hz to 3 kHz IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection in all circumstances

43、. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all pu

44、blications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This recommende

45、d practice identifies specifications that should be provided to characterize instrumentation used to measure the steady state rms values of magnetic and electric fields with sinusoidal frequency content in the range 10 Hz to 3 kHz in residential and occupational settings as well as in transportation

46、 systems. The dynamic ranges of interest are 0.01 T (0.1 mG) to 10 mT (100 G) and 1 V/m to 30 kV/m for magnetic and electric fields, respectively. In addition, this recommended practice Defines terminology Describes general characteristics of fields Surveys operational principles of instrumentation

47、Indicates methods of calibration Identifies significant sources of error IEEE Std 1308-1994 IEEE Recommended Practice for Instrumentation: Specifications for Magnetic Flux Density and Electric Field Strength Meters10 Hz to 3 kHz 2 Copyright 1994 IEEE. All rights reserved. While field meter specifica

48、tions are identified, frequencies and field levels that should be used for calibration purposes, and limits on measurement uncertainty are not recommended in this standard. Rather, it is left to standards that describe measurement protocols for different environments to indicate specific calibration

49、 points and uncertainty requirements. NOTEFor example, IEEE Std 644-1994 B151limits the total uncertainty during calibrations of magnetic and electric field meters used in the vicinity of ac power lines to 3%. However, sources of uncertainty during calibration and measurements are identified and guidance is provided on how they should be combined to determine total measurement uncertainty. Throughout this recommended practice, the words “magnetic flux density” and “magnetic field” will be considered synonymous. In regard to electric field measurements, thi