ISO IEC 15416-2016 Automatic identification and data capture techniques - Bar code print quality test specification - Linear symbols《自动识别和数据捕获技术 条形码打印质量测试规范 线性符.pdf

《ISO IEC 15416-2016 Automatic identification and data capture techniques - Bar code print quality test specification - Linear symbols《自动识别和数据捕获技术 条形码打印质量测试规范 线性符.pdf》由会员分享，可在线阅读，更多相关《ISO IEC 15416-2016 Automatic identification and data capture techniques - Bar code print quality test specification - Linear symbols《自动识别和数据捕获技术 条形码打印质量测试规范 线性符.pdf（44页珍藏版）》请在麦多课文档分享上搜索。

1、Automatic identification and data capture techniques Bar code print quality test specification Linear symbols Techniques automatiques didentification et de capture des donnes Spcifications pour essai de qualit dimpression des codes barres Symboles linaires INTERNATIONAL STANDARD ISO/IEC 15416 Refere

2、nce number ISO/IEC 15416:2016(E) Second edition 2016-12-15 ISO/IEC 2016 ii ISO/IEC 2016 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2016, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any

3、form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Bland

4、onnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.org ISO/IEC 15416:2016(E) ISO/IEC 15416:2016(E)Foreword iv Introduction v 1 Scope . 1 2 Normative references 1 3 Terms and definitions . 1 4 Symbols and abbreviated terms . 2 4.1 A

5、bbreviated terms . 2 4.2 Symbols . 3 5 Measurement methodology 4 5.1 General requirements . 4 5.2 Reference reflectivity measurements 4 5.2.1 General 4 5.2.2 Measurement light source . 4 5.2.3 Measuring aperture . 4 5.2.4 Optical geometry . 5 5.2.5 Inspection band 6 5.2.6 Number of scans . 7 5.3 Sca

6、n reflectance profile . 7 5.4 Scan reflectance profile assessment parameters 8 5.4.1 General 8 5.4.2 Element determination 9 5.4.3 Edge determination . 9 5.4.4 Decode .10 5.4.5 Symbol contrast (SC) .10 5.4.6 Edge contrast (EC) .10 5.4.7 Modulation (MOD) 10 5.4.8 Defects .10 5.4.9 Decodability 12 5.4

7、.10 Quiet zone check .13 6 Symbol grading 13 6.1 General 13 6.2 Scan reflectance profile grading 13 6.2.1 Decode .14 6.2.2 Reflectance parameter grading 14 6.2.3 Decodability 14 6.3 Expression of symbol grade 15 7 Substrate characteristics 15 Annex A (normative) Decodability 16 Annex B (informative)

8、 Example of symbol quality grading .17 Annex C (informative) Substrate characteristics 19 Annex D (informative) Interpretation of the scan reflectance profile and profile grades 23 Annex E (informative) Guidance on selection of light wavelength .26 Annex F (informative) Guidance on number of scans p

9、er symbol 28 Annex G (informative) Example of verification report .29 Annex H (informative) Comparison with traditional methodologies .30 Annex I (informative) Process control requirements 33 Bibliography .36 ISO/IEC 2016 All rights reserved iii Contents Page ISO/IEC 15416:2016(E) Foreword ISO (the

10、International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees est

11、ablished by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In t

12、he field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria need

13、ed for the different types of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent right

14、s. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents). Any trade name used

15、 in this document is information given for the convenience of users and does not constitute an endorsement. For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Bar

16、riers to Trade (TBT) see the following URL: Foreword - Supplementary information The committee responsible for this document is ISO/IEC JTC 1, Information technology, Subcommittee SC 31, Automatic identification and data capture techniques. This second edition cancels and replaces the first edition

17、(ISO/IEC 15416:2000), which has been technically revised with the following changes, as well as minor editorial modifications: the computation of “Defects” was modified in this revision of ISO/IEC 15416 (see Note 3 in 5.4.8); and sharp boundaries between grade levels are avoided by assigning grades

18、within grade boundaries to the first decimal place (see the Notes in 6.2.2 and 6.2.3).iv ISO/IEC 2016 All rights reserved ISO/IEC 15416:2016(E) Introduction The technology of bar coding is based on the recognition of patterns encoded in bars and spaces of defined dimensions according to rules defini

19、ng the translation of characters into such patterns, known as the symbology specification. The bar code symbol is produced in such a way as to be reliably decoded at the point of use, if it is to fulfil its basic objective as a machine readable data carrier. Manufacturers of bar code equipment and t

20、he producers and users of bar code symbols therefore require publicly available standard test specifications for the objective assessment of the quality of bar code symbols, to which they can refer to when developing equipment and application standards or determining the quality of the symbols. Such

21、 test specifications form the basis for the development of measuring equipment for process control and quality assurance purposes during symbol production, as well as afterwards. The performance of measuring equipment is the subject of a separate standard, ISO/IEC 15426-1. This document is to be rea

22、d in conjunction with the symbology specification applicable to the bar code symbol being tested, which provides symbology-specific detail necessary for its application. This methodology provides symbol producers and their trading partners a universally standardized means for communicating about the

23、 quality of bar code symbols after they have been printed. ISO/IEC 2016 All rights reserved v Automatic identification and data capture techniques Bar code print quality test specification Linear symbols 1 Scope This document: specifies the methodology for the measurement of specific attributes of b

24、ar code symbols; defines a method for evaluating these measurements and deriving an overall assessment of symbol quality; and provides information on possible causes of deviation from optimum grades to assist users in taking appropriate corrective action. This document applies to those symbologies f

25、or which a reference decode algorithm has been defined, and which are intended to be read using linear scanning methods, but its methodology can be applied partially or wholly to other symbologies. 2 Normative references There are no normative references in this document. 3 Terms and definitions For

26、 the purposes of this document, the terms and definitions given in ISO/IEC 19762 and the following apply. ISO and IEC maintain terminological databases for use in standardization at the following addresses: IEC Electropedia: available at http:/ /www.electropedia.org/ ISO Online browsing platform: av

27、ailable at http:/ /www.iso.org/obp 3.1 bar reflectance lowest reflectance value in the scan reflectance profile of a bar element 3.2 decode determination of the information encoded in a bar code symbol 3.3 edge contrast difference between bar reflectance (3.1) and space reflectance (3.14) of two adj

28、acent elements 3.4 element reflectance non-uniformity reflectance difference between the highest peak (3.9) and the lowest valley (3.16) in the scan reflectance profile of an individual element or quiet zone 3.5 global threshold reflectance level midway between the maximum and minimum reflectance va

29、lues in a scan reflectance profile used for the initial identification of elements INTERNATIONAL ST ANDARD ISO/IEC 15416:2016(E) ISO/IEC 2016 All rights reserved 1 ISO/IEC 15416:2016(E) 3.6 inspection band band (usually from 10 % to 90 % of the height of a bar code symbol) across which measurements

30、are taken Note 1 to entry: See Figure 2. 3.7 measuring aperture opening which governs the effective sample area (3.10) of the symbol, and the dimensions of which at 1:1 magnification is equal to that of the sample area 3.8 modulation ratio of minimum edge contrast (3.3) to symbol contrast (3.15) 3.9

31、 peak point of higher reflectance in a scan reflectance profile with points of lower reflectance on either side 3.10 sample area effective area of the symbol within the field of view of the measurement device 3.11 scan path line along which the centre of the sample area (3.10) traverses the symbol,

32、including quiet zones 3.12 show-through property of a substrate that allows underlying markings or materials to affect the reflectance of the substrate 3.13 space light element corresponding to a region of a scan reflectance profile above the global threshold (3.5) 3.14 space reflectance highest ref

33、lectance value in the scan reflectance profile of a space element or quiet zone 3.15 symbol contrast difference between the maximum and minimum reflectance values in a scan reflectance profile 3.16 valley point of lower reflectance in a scan reflectance profile with points of higher reflectance on e

34、ither side 4 Symbols and abbreviated terms 4.1 Abbreviated terms EC edge contrast EC min minimum value of EC ERN element reflectance non-uniformity ERN max maximum value of ERN2 ISO/IEC 2016 All rights reserved ISO/IEC 15416:2016(E) GT global threshold MOD modulation PCS print contrast signal RT ref

35、erence threshold SC symbol contrast 4.2 Symbols A average achieved width of element or element combinations of a particular type c defect adjustment constant e width of widest narrow element E width of narrowest wide element e i ith edge to similar edge measurement, counting from leading edge of sym

36、bol character F factor used to soften the effect on defect grades derived from small changes peaks and valleys within an element K smallest absolute difference between a measurement and a reference threshold k number of element pairs in a symbol character in a (n, k) symbology M width of element sho

37、wing greatest deviation from A m number of modules in a symbol character N average achieved wide to narrow ratio n number of modules in a symbol character in a (n, k) symbology R b bar reflectance R D dark reflectance R L light reflectance R max maximum reflectance R min minimum reflectance R s spac

38、e reflectance RT j reference threshold between measurements j and (j + 1) modules wide S total width of a character V decodability value V C decodability value for a symbol character Z average achieved narrow element dimension or module size, as measured ISO/IEC 2016 All rights reserved 3 ISO/IEC 15

39、416:2016(E) 5 Measurement methodology 5.1 General requirements The measurement methodology defined in this document is designed to maximize the consistency of both reflectivity and bar and space width measurements of bar code symbols on various substrates. This methodology is also intended to correl

40、ate with conditions encountered in bar code scanning hardware. Measurements shall be made with a defined light source (such as a single light wavelength) and a measuring aperture of dimensions defined by the application specification or determined in accordance with 5.2.1 and 5.2.2. A circular apert

41、ure is defined by its diameter in accordance with Table 1. Application specifications may define other aperture diameters or shapes. Whenever possible, measurements shall be made on the bar code symbol in its final configuration, i.e. the configuration in which it is intended to be scanned. If this

42、is impossible, refer to Annex C for the method to be used for measuring reflectance for non-opaque substrates. The sampling method should be based on a statistically valid sample size within the lot or batch being tested. A minimum grade for acceptability shall be established prior to quality contro

43、l inspection. In the absence of a sampling plan defined in formal quality assurance procedures or by bilateral agreement, a suitable plan may be based on the recommendations in ISO 2859-1. 5.2 Reference reflectivity measurements 5.2.1 General Equipment for assessing the quality of bar code symbols i

44、n accordance with this document shall comprise a means of measuring and analysing the variations in the diffuse reflectivity of a bar code symbol on its substrate along a number of scan paths which shall traverse the full width of the symbol including both quiet zones. The basis of this methodology

45、is the measurement of diffuse reflectance from the symbol. All measurements on a bar code symbol shall be made within the inspection band defined in accordance with 5.2.4. The measured reflectance values shall be expressed in percentage terms by means of calibration and reference to recognized natio

46、nal standards laboratories, where 100 % should correspond to the reflectance of a barium sulphate or magnesium oxide reference sample. 5.2.2 Measurement light source The light source used for measurements should be specified in the application specification to suit the intended scanning environment.

47、 When the light source is not specified in the application specification, measurements should be made using the light source that approximates most closely to the light source expected to be used in the scanning process. Light sources may include narrow band or broad band illumination. Refer to Anne

48、x E for guidance on the selection of the light source. 5.2.3 Measuring aperture The nominal diameter of the measuring aperture should be specified by the user application specification to suit the intended scanning environment. When the measuring aperture diameter is not specified in the application

49、 specification, Table 1 should be used as a guide. In an application where a range of X dimensions will be encountered, all measurements shall be made with the aperture appropriate to the smallest X dimension to be encountered. In the absence of a defined X dimension, the Z dimension shall be substituted.4 ISO/IEC 2016 All rights reserved ISO/IEC 15416:2016(E) The effective measuring aperture diameter may vary slightly from its nominal dimension due to manufacturing tolerances and