IEEE C57 125-2015 en Guide for Failure Investigation Documentation Analysis and Reporting for Power Transformers and Shunt Reactors《电力变压器和分路扼流器故障研究 记录 分析 和报告指南》.pdf

《IEEE C57 125-2015 en Guide for Failure Investigation Documentation Analysis and Reporting for Power Transformers and Shunt Reactors《电力变压器和分路扼流器故障研究 记录 分析 和报告指南》.pdf》由会员分享，可在线阅读，更多相关《IEEE C57 125-2015 en Guide for Failure Investigation Documentation Analysis and Reporting for Power Transformers and Shunt Reactors《电力变压器和分路扼流器故障研究 记录 分析 和报告指南》.pdf（84页珍藏版）》请在麦多课文档分享上搜索。

1、 IEEE Guide for Failure Investigation, Documentation, Analysis, and Reporting for Power Transformers and Shunt Reactors Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C57.125-2015(Revision ofIEEE Std C57.125-1991) IEEE St

2、d C57.125-2015 (Revision of IEEE Std C57.125-1991) IEEE Guide for Failure Investigation, Documentation, Analysis, and Reporting for Power Transformers and Shunt Reactors Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 3 September 2015 IEEE-SA Standards Board Abstract: A

3、procedure to be used to perform a failure analysis is recommended. The procedure is primarily focused on power transformers used on electric utility systems, although it may be used for an investigation into any ac transformer failure. This document provides a methodology by which the most probable

4、cause of any particular transformer failure may be determined. This document is also intended to encourage the establishment of routine and uniform data collection procedures, consistency of nomenclature and compatibility with similar efforts by other organizations, and cooperative efforts by users

5、and manufacturers during the failure analysis. Keywords: Diagnostic tests, electrical tests, failure analysis, IEEE C57.125. The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2015 by The Institute of Electrical and Electronics Engineers

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34、y advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. 5 Participants At the time this IEEE guide was completed, the PC57.125 Revisi

35、on of Guide for Failure Investigation, Documentation, Analysis and Reporting for Power Transformers and Shunt Reactors Working Group had the following membership: Wallace Binder, Chair Thomas Melle, Vice Chair John Roach, Secretary Adam Sewell, Editor Don Angell Carlo Arpino Luiz Cheim Larry Dix Jam

36、es Fairris Wayne Johnson Ken Kampshoff Zan Kiparizoski Lawrence Kirchner Axel Kraemer Alexander Kraetge Matthew Lawrence Fernando Leal Thomas Lundquist David Murray Ali Naderian Jahromi Shawn Nunn Branimir Petosic Mark Rivers Diego Robalino Oleg Roizman Hakan Sahin Ewald Schweiger Pugazhenthi Selvar

37、aj Jeremy Sewell Hyeong Jin Sim Kenneth Skinger Sanjib Som Brian Sparling Craig Stiegemeier Charles Sweetser Jane Ann Verner Kipp Yule Peter ZhaoThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William

38、 Ackerman Samuel Aguirre Ali Al Awazi Javier Arteaga Roberto Asano Donald Ayers Roy Ayers Peter Balma Thomas Barnes Robert Barnett William Bartley Robert Beavers W. J. (Bill) Bergman Wallace Binder Thomas Bishop Thomas Blackburn W. Boettger Paul Boman Chris Brooks Kent Brown William Byrd Paul Cardin

39、al Stephen Conrad Jerry Corkran John Crouse Alireza Daneshpooy Willaim Darovny Dieter Dohnal Gary Donner Neal Dowling Fred Elliott Keith Ellis James Fairris Jorge Fernandez Daher Joseph Foldi Bruce Forsyth George Frimpong Frank Gerleve Jalal Gohari Edwin Goodwin James Graham William Griesacker Randa

40、ll Groves Ajit Gwal John Harley David Harris Roger Hayes Peter Heinzig Gary Heuston Gary Hoffman Philip Hopkinson Relu Ilie David Jackson John John Laszlo Kadar John Kay Gael Kennedy Sheldon Kennedy Tanuj Khandelwal Yuri Khersonsky James Kinney Axel Kraemer Neil Kranich Jim Kulchisky Saumen Kundu Jo

41、hn Lackey Chung-Yiu Lam Thomas LaRose Michael Lauxman Matthew Lawrence Aleksandr Levin Hua Liu Mario Locarno Thomas Lundquist Bruce Mackie O. Malik J. Dennis Marlow Omar Mazzoni William McBride William McDermid James McIver Charles McShane Thomas Melle Michael Miller Sujeet Mishra Daleep Mohla Jerry

42、 Murphy Ryan Musgrove Ali Naderian Jahromi K. R. M. Nair Kris K. Neild Rhonda Netzel Michael Newman Copyright 2015 IEEE. All rights reserved. 6 Ryan Niemerg Joe Nims Lorraine Padden Klaus Papp Bansi Patel Paulette Payne Powell Brian Penny Branimir Petosic Donald Platts Alvaro Portillo Iulian Profir

43、Leslie Recksiedler Jean-Christophe Riboud John Roach Diego Robalino Michael Roberts Charles Rogers Oleg Roizman Thomas Rozek Dinesh Sankarakurup Daniel Sauer Bartien Sayogo Ewald Schweiger Adam Sewell Jeremy Sewell Nikunj Shah Hamid Sharifnia Devki Sharma Hyeong Jin Sim Kenneth Skinger Jerry Smith S

44、anjib Som Brian Sparling Thomas Spitzer Craig Stiegemeier Michael Swearingen Charles Sweetser David Tepen James Thompson John Vergis Jane Ann Verner Loren Wagenaar David Wallach John Wang Joe Watson Kenneth White Jennifer Yu Kipp Yule Luis Zambrano James Ziebarth Waldemar ZiomekWhen the IEEE-SA Stan

45、dards Board approved this guide on 3 September 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman M

46、ichael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D. Reilly Stephen J. Shellhammer Adrian P. Stephens Yatin Trivedi Philip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus Copyright 2015 IEEE. All rights reserved. 7 I

47、ntroduction This introduction is not part of IEEE Std C57.125-2015, IEEE Guide for Failure Investigation, Documentation, Analysis, and Reporting for Power Transformers and Shunt Reactors. When IEEE Std C57.117 was developed, there was both a need for failure reporting and a means to collect the data

48、. While the reporting was being developed, it became clear that a consistent and uniform method of analyzing failures was also needed. Thus was born the failure analysis and reporting group of documents. The resulting documents became known as IEEE Std C57.117-1986 and IEEE Std C57.125-1991. Unfortu

49、nately, an outcome of competition in the utility industry was a perception that such data would be proprietary and so the means to share the data disappeared. Although the means to share the information disappeared, the need remains. However, the population must now be limited to those assets controlled by an individual entity. In the next iteration, perhaps a single trustworthy entity will emerge to whom the data can be reported and useful reports can thus be generated. The current version of IEEE Std C57.125 combines the methodology of failure analysis with the data col